JPH01169937A - Appearance inspection equipment for semiconductor pellet - Google Patents
Appearance inspection equipment for semiconductor pelletInfo
- Publication number
- JPH01169937A JPH01169937A JP62329103A JP32910387A JPH01169937A JP H01169937 A JPH01169937 A JP H01169937A JP 62329103 A JP62329103 A JP 62329103A JP 32910387 A JP32910387 A JP 32910387A JP H01169937 A JPH01169937 A JP H01169937A
- Authority
- JP
- Japan
- Prior art keywords
- pellet
- suction
- adhesive sheet
- semiconductor
- rod
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000008188 pellet Substances 0.000 title claims abstract description 67
- 239000004065 semiconductor Substances 0.000 title claims abstract description 30
- 238000007689 inspection Methods 0.000 title claims abstract description 6
- 239000000853 adhesive Substances 0.000 claims abstract description 25
- 230000001070 adhesive effect Effects 0.000 claims abstract description 25
- 230000002950 deficient Effects 0.000 claims description 13
- 238000004299 exfoliation Methods 0.000 abstract 2
- 230000008030 elimination Effects 0.000 abstract 1
- 238000003379 elimination reaction Methods 0.000 abstract 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
Landscapes
- Hooks, Suction Cups, And Attachment By Adhesive Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体ペレットの外観検査装置に係り、特に1
個1個に分離された半導体ペレットの中で不良ペレット
を貼着した粘着シートから除去・収集する為の不良ペレ
ット除去装置を有する半導体ペレットの外観検査装置に
関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an appearance inspection device for semiconductor pellets, and particularly relates to a device for inspecting the appearance of semiconductor pellets.
The present invention relates to a semiconductor pellet appearance inspection apparatus having a defective pellet removing device for removing and collecting defective pellets from an adhesive sheet to which defective pellets are stuck among semiconductor pellets separated into individual semiconductor pellets.
従来、この種の不良ペレット除去装置は、第3図及び第
4図に示すように粘着シート3に貼着したペレット2を
粘着シート3の下から突上棒6にて突上げることにより
、粘着シート3からペレット2を剥し、剥れたペレット
2をペレット収集管1で真空吸引し、排出するよう罠な
っていた。Conventionally, this type of defective pellet removal device removes the adhesive by pushing up the pellet 2 stuck to the adhesive sheet 3 from below the adhesive sheet 3 with a push-up rod 6, as shown in FIGS. 3 and 4. The trap was such that the pellets 2 were peeled off from the sheet 3, and the peeled pellets 2 were vacuum-suctioned with the pellet collection tube 1 and discharged.
次に、従来例の使用方法について説明する。Next, how to use the conventional example will be explained.
第5図(a)〜(d)は動作順に突上棒8と粘着シート
3の位置関係を示す断面図である。FIGS. 5(a) to 5(d) are cross-sectional views showing the positional relationship between the uplifting rod 8 and the adhesive sheet 3 in order of operation.
第5図(a)に示すように、粘着シート3上の半導体ペ
レット2をガイド7の上に載せる。この状態で半導体ペ
レット2を顕微鏡(図示しない)で観察したのち、不良
と判断したらペレット収集管1を待機状態の位置14か
ら半導体ペレット2の直上に移動させると共にカム11
を起動する。第5図(b)は、カムIIKよって突上棒
8で粘着シート3と一緒に半導体ペレットを突き上げた
状態を示している。第5図(C)は、粘着シート3が半
導体ペレット2からまさに離れようとしている状態を示
している。その次に1第5図(d)に示すように、半導
体ペレット2はペレット収集管lに吸上げられる。次に
、突出棒は下方に移動する。粘着シートを移動させて次
の半導体ペレットをガイド上にもってくる。ペレット収
集管を待機位置に移動させて次の検査を行なう。これら
一連の動作は手動で行なってもよいし、しかるべき電気
信号によって自動的に行うようにしてもよいのである。As shown in FIG. 5(a), the semiconductor pellet 2 on the adhesive sheet 3 is placed on the guide 7. After observing the semiconductor pellet 2 in this state with a microscope (not shown), if it is judged to be defective, the pellet collection tube 1 is moved from the standby position 14 to just above the semiconductor pellet 2, and the cam 11
Start. FIG. 5(b) shows a state in which the semiconductor pellet is pushed up together with the adhesive sheet 3 by the push-up rod 8 by the cam IIK. FIG. 5(C) shows a state in which the adhesive sheet 3 is about to separate from the semiconductor pellet 2. Thereafter, as shown in FIG. 5(d), the semiconductor pellets 2 are sucked up into the pellet collecting tube l. Next, the protruding rod moves downward. Move the adhesive sheet and bring the next semiconductor pellet onto the guide. Move the pellet collection tube to the standby position for the next test. These series of operations may be performed manually or automatically using appropriate electrical signals.
前述した従来の不良ペレット除去装置は、半導体ペレッ
トの寸法が大きくなると、粘着シートから剥れるのに時
間がかかり、能率が悪いという欠点がある。あるいは、
半導体が粘着シートから剥れやすくする為に突出棒の上
昇量を大きくすると突出棒の先端により粘着シートが破
れたり、除去すべき不良ペレットに隣接する良品のペレ
ットがペレット収集管lと接触し、良品ペレットに傷を
つけ不良にしてしまうという欠点がある。The above-mentioned conventional defective pellet removal apparatus has the disadvantage that when the size of the semiconductor pellet becomes large, it takes time to peel it off from the adhesive sheet, resulting in poor efficiency. or,
If the rising amount of the protruding rod is increased to make it easier for the semiconductor to peel off from the adhesive sheet, the adhesive sheet may be torn by the tip of the protruding rod, or a good pellet adjacent to a defective pellet to be removed may come into contact with the pellet collection tube l. It has the disadvantage of damaging good pellets and making them defective.
本発明の半導体ペレットの外観検査装置は、半導体ペレ
ットを貼着した粘着シートを真空吸着させる吸着面を備
えた吸着台と、所定の駆動信号を突上棒を前記吸着台の
上下動作に同期して上下させる第2の駆動機構と、前記
吸着台上方に設けられたペレット収集管とを含む不良ペ
レット除去装置を有するというものである。The appearance inspection apparatus for semiconductor pellets of the present invention includes a suction table equipped with a suction surface that vacuum-sucks an adhesive sheet on which a semiconductor pellet is attached, and a predetermined drive signal that synchronizes an up-and-down movement of the suction rod with the vertical movement of the suction table. The present invention has a defective pellet removing device including a second drive mechanism for raising and lowering the suction table, and a pellet collecting pipe provided above the suction table.
次に、本発明の実施例について図面を参照して説明する
。Next, embodiments of the present invention will be described with reference to the drawings.
第1図は本発明の一実施例の主要部を示す断面図である
。FIG. 1 is a sectional view showing the main parts of an embodiment of the present invention.
この実施例は、半導体ペレット2を貼着した粘着シート
3を真空吸着させる吸着面15を備えた吸着台5と、所
定の駆動信号をうけて吸着台4を上下させる第1の駆動
機構(シリンダ12)と、吸着面15下部から粘着シー
ト3を突き上げる突出棒6と、突上棒6を吸着台4の上
下動作に同期して上下させる第2の駆動機構(カム11
.レバー10よりなる)と、吸着台4上方に設けられた
ペレット収集管1とを含む不良ペレット除去装置を有す
るというものである。This embodiment includes a suction table 5 equipped with a suction surface 15 for vacuum-chucking an adhesive sheet 3 on which a semiconductor pellet 2 is attached, and a first drive mechanism (cylinder cylinder) that moves the suction table 4 up and down in response to a predetermined drive signal. 12), a protruding rod 6 that pushes up the adhesive sheet 3 from the lower part of the suction surface 15, and a second drive mechanism (cam 11) that moves the protruding rod 6 up and down in synchronization with the up and down movement of the suction table 4.
.. The present invention has a defective pellet removing device including a lever 10) and a pellet collecting pipe 1 provided above the suction table 4.
従来例のガイド7の代シに、シリンダ12に結合され、
駆動信号を受けて上下動する吸着台4を取付けたもので
あり、他は同じである。In place of the guide 7 of the conventional example, it is coupled to the cylinder 12,
It is equipped with a suction table 4 that moves up and down in response to a drive signal, but the rest is the same.
次に、この実施例の動作について説明する。Next, the operation of this embodiment will be explained.
第2図(a)〜(d)は実施例の動作を説明するため動
作順に配置した断面図である。FIGS. 2(a) to 2(d) are cross-sectional views arranged in order of operation in order to explain the operation of the embodiment.
まず、第2図(a)K示すように、吸着面15上の半導
体ペレット2の外観検査を行い、ペレット収集管13を
吸着台4上に位置させる。First, as shown in FIG. 2(a)K, the appearance of the semiconductor pellets 2 on the suction surface 15 is inspected, and the pellet collection pipe 13 is placed on the suction table 4.
次に、第2図(b)に示すように、シリンダ12を駆動
して吸着台4を一定距離上昇させる。Next, as shown in FIG. 2(b), the cylinder 12 is driven to raise the suction table 4 a certain distance.
次に、第2図(C)に示すように、シリンダ12の駆動
信号と同時若しくは若干の時間遅れを伴ってアクティブ
となる信号でカム11を回転させ、突出棒6が吸着面1
5よシ突出すように上昇させる。Next, as shown in FIG. 2(C), the cam 11 is rotated by a signal that becomes active at the same time as the drive signal for the cylinder 12 or with a slight time delay, so that the protruding rod 6
5. Raise it so that it sticks out.
そうすると、第2図(d) K示すように、半導体ペレ
ット2は真空吸引さ本てペレット収集管1に吸込まれる
。Then, as shown in FIG. 2(d)K, the semiconductor pellet 2 is sucked into the pellet collection tube 1 through vacuum suction.
次に、突出棒6と吸着台4を下降させて第2図(a)に
示した位置にもどす。粘着シートを移動させて次の半導
体ペレット検査する。なお、粘着シート移動時には吸着
台の真空吸引は必ずしもいらない。Next, the protruding rod 6 and suction table 4 are lowered and returned to the position shown in FIG. 2(a). Move the adhesive sheet and inspect the next semiconductor pellet. Note that when moving the adhesive sheet, vacuum suction by the suction table is not necessarily required.
粘着シートを吸着台に真空吸着した状態でペレット収集
管に近づけ、半導体ペレットをペレット収集管で上方に
吸引しつつ突出棒で押上げるので剥れ易く、突出棒の上
昇量を少なくできる。The adhesive sheet is vacuum-sucked to a suction stand and brought close to the pellet collection tube, and the semiconductor pellets are sucked upward by the pellet collection tube and pushed up by the protruding rod, so that they are easy to peel off and the amount of rise of the protruding rod can be reduced.
以上説明したように本発明は、不良ペレット除去装置に
真空吸着台に粘着シートを吸着させたまま吸着台を上昇
させた状態で突出棒を上昇させるので半導体ペレットが
剥れ易く突出棒の上昇量を小さくできるので、突出棒の
先端で粘着シートを破ることなく、更に隣接ペレットが
ペレット収集管に接触するという事故も防ぐことができ
る。As explained above, in the present invention, the defective pellet removal device raises the protruding rod while the vacuum suction table is raised with the adhesive sheet adsorbed on the vacuum suction table. Since it can be made small, the adhesive sheet will not be broken at the tip of the protruding rod, and accidents such as adjacent pellets coming into contact with the pellet collection pipe can also be prevented.
従って、本発明によれば、短時間で安定した不良ペレッ
ト除去が可能となり、半導体ペレットの選別工程を速や
かに行うことができる効果がある。Therefore, according to the present invention, defective pellets can be stably removed in a short period of time, and the semiconductor pellet sorting process can be carried out quickly.
第1図は本発明の一実施例の主要部を示す断面図、第2
図(a)〜(d)は実施例の動作を説明するための動作
順に配置した断面図、第3図は従来例のペレット収集管
の位置を示す上面図、第4図は従来例の主要部を示す断
面図、第5図(a)〜(d)は従来例の主要部を示す断
面図である。
1・・・・・・ペレット収集管、2・・・・・・半導体
ペレット、3・・・・・・粘着シート、4・・・・・・
吸着台、5・・・・・・真空吸着孔、6・・・・・・突
上棒、7・・・・・・ガイド、8・・・・・・ばね、9
・・・・・・半導体ペレット、10・・・・・・レバー
、11・・・・・・カム、12・・・・・・シリンダ、
13・・・・・・接続パイプ、15−・・・・・吸着面
。
代理人 弁理士 内 原 晋
月 1 図
(C) (d)刀 Z 図
月 3 図
第 4 図FIG. 1 is a sectional view showing the main parts of an embodiment of the present invention, and FIG.
Figures (a) to (d) are cross-sectional views arranged in order of operation to explain the operation of the embodiment, Figure 3 is a top view showing the position of the pellet collection pipe of the conventional example, and Figure 4 is the main part of the conventional example. FIGS. 5(a) to 5(d) are sectional views showing main parts of a conventional example. 1... Pellet collection tube, 2... Semiconductor pellets, 3... Adhesive sheet, 4...
Suction table, 5...Vacuum suction hole, 6...Protrusion bar, 7...Guide, 8...Spring, 9
... Semiconductor pellet, 10 ... Lever, 11 ... Cam, 12 ... Cylinder,
13... Connection pipe, 15-... Adsorption surface. Agent Patent Attorney Shingetsu Uchihara 1 Figure (C) (d) Katana Z Zugetsu 3 Figure 4
Claims (1)
る吸着面を備えた吸着台と、所定の、駆動信号をうけて
前記吸着台を上下させる第1の駆動機構と、前記吸着面
下部から粘着シートを突き上げる突上棒と、前記突上棒
を前記吸着台の上下動作に同期して上下させる第2の駆
動機構と、前記吸着台上方に設けられたペレット収集管
とを含む不良ペレット除去装置を有することを特徴とす
る半導体ペレットの外観検査装置。a suction table having a suction surface for vacuum-chucking an adhesive sheet on which a semiconductor pellet is attached; a first drive mechanism that moves the suction table up and down in response to a predetermined drive signal; and a suction table that removes the adhesive sheet from below the suction surface. It has a defective pellet removal device including an uplifting rod, a second drive mechanism that moves the uplifting rod up and down in synchronization with the vertical movement of the suction table, and a pellet collection pipe provided above the suction table. A semiconductor pellet appearance inspection device characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62329103A JPH01169937A (en) | 1987-12-24 | 1987-12-24 | Appearance inspection equipment for semiconductor pellet |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62329103A JPH01169937A (en) | 1987-12-24 | 1987-12-24 | Appearance inspection equipment for semiconductor pellet |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01169937A true JPH01169937A (en) | 1989-07-05 |
Family
ID=18217642
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62329103A Pending JPH01169937A (en) | 1987-12-24 | 1987-12-24 | Appearance inspection equipment for semiconductor pellet |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01169937A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017122608A (en) * | 2016-01-05 | 2017-07-13 | 信越半導体株式会社 | Defect inspection device |
WO2021196313A1 (en) * | 2020-04-03 | 2021-10-07 | Tcl华星光电技术有限公司 | Micro light-emitting diode transfer device and transfer method and display device |
-
1987
- 1987-12-24 JP JP62329103A patent/JPH01169937A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017122608A (en) * | 2016-01-05 | 2017-07-13 | 信越半導体株式会社 | Defect inspection device |
WO2017119028A1 (en) * | 2016-01-05 | 2017-07-13 | 信越半導体株式会社 | Defect inspection apparatus |
WO2021196313A1 (en) * | 2020-04-03 | 2021-10-07 | Tcl华星光电技术有限公司 | Micro light-emitting diode transfer device and transfer method and display device |
US11646390B2 (en) | 2020-04-03 | 2023-05-09 | Tcl China Star Optoelectronics Technology Co., Ltd. | Device, method, and display device for transferring micro light-emitting diodes |
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