JPH01158330A - Film state test piece with ground paper and testing method thereof - Google Patents

Abstract

PURPOSE:To facilitate the handling of test pieces and to improve workability of tests, by forming parts to be held at both end parts of each film state test piece, holding the parts to be held, and bonding and fixing the test pieces to ground paper, which has rigidity so that the test pieces can be conveyed. CONSTITUTION:A plurality of film state test pieces TPs are fixed on ground paper 1. The ground paper itself has rigidity. Rectangular holes 1a are formed at the central part of the ground paper 1 at a specified interval. Marked lines 2 for bonding the TPs are continuously provided at upper and lower regions 1b and 1c, which surround each hole 1a. Each TP is arranged so as to cross each hole 1a in the up and down direction. The parts to be held TPU and TPL at the upper and lower ends of the TP are fixed on the marked lines 2 with a bonding agent B. Perforation lines 1d are provided at the upper and lower parts of the ground paper 1 along the right edge of each hole 1a. The ground paper 1 is cut along the perforation lines. Every ground paper 1 is held with the upper and lower chucks of a testing machine. Thereafter, a part 1e, at which the regions 1b and 1c are connected, is cut. Thus, the regions 1b and 1c are separated. Under this state, a load is applied on the TP through the upper and lower chucks. Then, measurement of TP can be performed without imparting any load resistance on the ground paper in testing.

Description

DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a thin test piece (film-like test piece) such as a plastic or metal film whose gripped portions at both ends are fixed with a mount, and a test method thereof.

B. Conventional technology When performing a tensile test on a thin test piece such as a film with a thickness of several tens of microns, it is extremely difficult to handle the film itself as it has no rigidity. Conventionally, as shown in FIG. 7, prior to testing, approximately 5 to 20 films TP are stacked, the upper ends of which are gripped by the upper chuck 10, and each time the test is completed, the lower ends of the new films are stacked one by one. A plurality of test pieces are tested by being gripped again by the lower chuck 20.

C9 Problems to be Solved by the Invention However, when automating the testing of this type of thin film-like test piece, the test piece lacks rigidity, so transporting and automatically mounting it on a chuck is extremely difficult.

The technical problem of the present invention is to facilitate the handling of non-rigid film-like specimens in order to improve testing efficiency.

01 Means for Solving the Problems A film-like test piece with a mount according to claim 1 is constructed as follows. For example, to explain with reference to FIG. 1, grasped parts TPU and TPL formed at both ends of a film-like test piece TP
This gripped part TPU.

A mount 1 having a wider area than the TPL and having enough rigidity to grip both gripped parts and convey the film-like test piece TP.
b, lc are fixed.

The test method of claim 2 will be explained with reference to the embodiment shown in FIG. 3. The gripped parts TPU and TPL formed at both ends of the film-like test piece TP are fixed on a pair of mounts 21b and 21c, respectively, The test method according to claim 3, in which the film-like test piece TP is conveyed by suctioning the mounts 21b and 21c and is held together with the mount by a testing machine, and then the film-like test piece is characterized is an embodiment shown in FIG. To explain, the gripped parts TPU and TPL formed at both ends of the film-like test piece TP are held at both ends 1b and l of a sheet of mount 1.
c, and mount 1b.

The film-like test piece TP is conveyed by adsorbing the film-like test piece 1c, and the test machine grips the entire mount, the mount 1e connecting the pair of gripped parts is cut, and then the film-like test piece TP is loaded. .

80A film-like test piece TP is placed through a rigid mount 1, 21.
can be handled, improving test workability. Moreover, automatic testing of this kind of film-like test piece becomes easy.

In the above-mentioned sections and section E, which describe the present invention in detail, figures of embodiments are used to make the present invention easier to understand, but the present invention is not limited to the embodiments.

F. Example 1 First Example - FIG. 1 shows a first example of a film-like test piece with a mount according to the present invention. The mount 1 to which the plurality of film-like test pieces TP are fixed is itself rigid and easy to handle. Rectangular openings 1a are punched out in the center of the mount 1 at predetermined intervals, and upper and lower regions 1b surrounding each rectangular opening 1a,
A marked line 2 for adhering the test piece is continuously marked on lc. Each test piece TP is arranged vertically across each rectangular opening 1a, and the gripped parts TPU and Tpt at the upper and lower ends are respectively fixed with adhesive on the adhesive marking line 2. 1st
In the figure, the bonding location is indicated by the symbol B. In addition.

It may be fixed by a fixing method other than adhesion, such as a hook. Further, perforations 1d are provided at the top and bottom of the mount 1 along the right edge of each rectangular opening 1a. In this way, the test piece TP
Since it is handled by adhering it to the rigid mount 1, handling is much easier than handling only the test piece TP which is not rigid.

For the test, first, cut out the mount 1 along the perforation 1d, hold the mount 1 together with the upper and lower chucks of the testing machine,
After that, the upper and lower areas 1b of the mount 1.

The upper and lower regions 1b are obtained by cutting the portion 1e that connects 1c.

Separate the ICs from each other. If a load is applied to the test piece TP through the upper and lower chucks in this state, the mount 1 will not provide any load resistance during the test and accurate measurements can be made.

Since the film test piece TP can be mounted on the testing machine via the rigid mount 1 in this way, it is extremely easy to automate all of the above steps. In this case, the mount to which a plurality of film-like test pieces TP are fixed is transported to an appropriate location using, for example, a suction-type transport device, where the perforation 1d is automatically cut, and both upper and lower ends TPU and TPL are connected to the upper and lower regions of the mount.
b.

Individual film-like specimen TP after cutting fixed at 1c
For example, it is adsorbed by a suction type conveyance device and automatically attached to the test machine. Thereafter, a test is performed by automatically cutting the portion 1e of one mount. The above suction is performed by bringing a pair of suction pads into contact with the upper and lower regions 1b and lc of the mount.

Note that, as shown in FIG. 2, the center opening 1a is not made in the mount 11, and this mark t! is placed between the upper and lower adhesive marks 2. 2 may be provided with perforations 11a parallel to each other. In this case, first cut out the perforation 11b and then cut out the test piece TP.
After gripping the mount 11 together with the testing machine, the perforation 11a
Separate and test.

Not limited to perforations, various known cutting means that can easily cut off the upper and lower mount regions 11b and llc without touching the test piece TP may be provided. Further, in the above description, a case has been described in which a plurality of test pieces TP are attached to the mount 1, but one test piece TP may be attached to a U-shaped mount or the like and handled.

1.Second embodiment- The second embodiment will be explained with reference to FIGS. 3 to 6.

In FIG. 3, a rectangular opening 21a is punched out in the center of the mount 21, which is itself rigid in the same way as described above, and four film-like test pieces TP are inserted, for example, at part B, across this opening 21a. It is fixed at . In this second embodiment, the outer length L of the mount 21 is made equal to the length of the film-like test piece TP, and the length of the opening 21 is set to a. Moreover, the thick lines 21d provided at intervals W indicate the cutting points of the mount 21, and the maximum length and maximum width of the film-like test piece TP with the mount after cutting are W2 inside between the upper and lower regions 21b and 21c of the mount. The interval will be 0.

For the test, as shown in FIG. 3, the mount 1 on which the four film-like test pieces TP are fixed is transported to a suitable location using, for example, a suction type conveyance device, and is automatically cut along the thick line 21d to form individual mount-attached films. A shaped test piece TP is prepared. Thereafter, the upper and lower regions 21b and 21c of the mounts are respectively suctioned by a pair of suction pads, and stacked one after another on the storage shelf 30 shown in FIGS. 4 and 5.

The storage shelf 30 has a storage space for individual film-like test pieces TP with mounts between a pair of opposing vertical walls 31 and 32, and the film-like test pieces TP with mounts are stored with reference to the inside of the upper and lower regions 21b and 21c of the mounts. Align the test pieces TP. That is, between the vertical walls 31 and 32, there are a pair of guide grooves 33, 3 having a width approximately equal to the maximum width W of the film-like test piece TP with a mount.
4 are formed in the test piece stacking direction, separated by a distance Q between the upper and lower regions 21b and 21c of the mount. Therefore, after cutting, the individual mount-attached film test piece TP is inserted into the pair of guide grooves 3.
3. When stacked along line 34, they are accommodated in the form shown in Figure 5.

The reason why the film-like test piece TP with a mount is accommodated on the inside basis in this way is as follows. As shown in FIG. 6, when the internal dimensions of the storage shelf 4o are determined based on the outer dimensions of the individual mount-attached film-like test pieces TP, when the mount-attached film-like test pieces TP are stacked on the storage shelf 40, Mount upper and lower regions 21b.

The film between 21c is bent, and one mount area 21b is shifted toward the center of the storage shelf 40.

The suction pad of the conveyance device is attached to the upper and lower regions 21b of the mount.

There is a possibility that it may not be able to make accurate contact with 2Lc. However, if the film-like test piece TP with a mount is housed with the inside reference as shown in FIGS. 4 and 5, the film will not bend and the upper and lower regions 21b and 21c of the mount will be reliably positioned. The pad can be reliably brought into contact with each region 21b, 21c.

In this second embodiment as well, both ends TPU and TPL of a single film-like test piece TP are connected to a pair of mounts 21b and 21.
It is also possible to create a plurality of sheets fixed to c.

G1 Effects of the Invention According to the present invention, a film-like test piece, which was difficult to handle due to lack of rigidity, is fixed to a highly rigid mount, and the test piece is attached to a testing machine via the mount to conduct a test. Therefore, the test workability of the film-like test piece is improved, and automatic mounting is also facilitated.

[Brief explanation of the drawing]

FIGS. 1 and 2 are front views showing two examples of the first embodiment of a film-like test piece with a mount according to the present invention, and FIG. 3 shows a film-like test piece with a mount according to the second embodiment. Front view,
Fig. 4 is a cross-sectional view of the cut individual film-like specimens with mounts stored in a storage shelf, Fig. 5 is a perspective view of the storage shelf, and Fig. 6 is a comparison with Fig. 5. FIG. 7, which is a perspective view of a conventional storage shelf, is a diagram illustrating a conventional testing method in which a plurality of test specimens are stacked and held on top and bottom chucks of a testing machine. 1.11, 21: Mounting paper 1a: Opening 1 b, 1 c, 2 l b, 21 c: Upper and lower areas (
Mount) ld, 21d: Perforation 1e: Cutting area 30
: Storage shelf 33, 34 guide groove TP: Test piece Patent applicant Shimadzu Corporation Patent attorney Fuyu Nagai Entrepreneurship 1 Figure 2 Figure 2 11b llb 1c Figure 4

Claims (1)

[Claims] 1) The gripped portions formed at both ends of the film-like test piece have a larger area than the gripped portions and are capable of conveying the film-like test piece by gripping both gripped parts. A film-like test piece with a mount, characterized in that a mount having a rigidity of . 2) The parts to be gripped formed at both ends of the film-like test piece are each fixed on a pair of mounts, and the film-like test piece is transported by suctioning the mounts, and the test machine grips the mount together, and then A test method for a film-like test piece with a mount, characterized by loading a film-like test piece. 3) Each gripped portion formed at both ends of the film-like test piece is fixed to both ends of a sheet of mount, and the film-like test piece is conveyed by suctioning the mount and the test machine grips the mount along with the mount. A method for testing a film-like test piece with a mount, which comprises cutting a mount connecting a pair of gripped parts, and then loading a film-like test piece.