JPH0114666B2 - - Google Patents
Info
- Publication number
- JPH0114666B2 JPH0114666B2 JP56175077A JP17507781A JPH0114666B2 JP H0114666 B2 JPH0114666 B2 JP H0114666B2 JP 56175077 A JP56175077 A JP 56175077A JP 17507781 A JP17507781 A JP 17507781A JP H0114666 B2 JPH0114666 B2 JP H0114666B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- charged particles
- pass filter
- grid
- energy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002245 particle Substances 0.000 claims description 30
- 230000005284 excitation Effects 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000001941 electron spectroscopy Methods 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000001420 photoelectron spectroscopy Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/488—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with retarding grids
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56175077A JPS5875754A (ja) | 1981-10-30 | 1981-10-30 | 荷電粒子エネルギ−分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56175077A JPS5875754A (ja) | 1981-10-30 | 1981-10-30 | 荷電粒子エネルギ−分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5875754A JPS5875754A (ja) | 1983-05-07 |
JPH0114666B2 true JPH0114666B2 (zh) | 1989-03-13 |
Family
ID=15989827
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56175077A Granted JPS5875754A (ja) | 1981-10-30 | 1981-10-30 | 荷電粒子エネルギ−分析装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5875754A (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4737637A (en) * | 1986-10-15 | 1988-04-12 | Hughes Aircraft Company | Mass separator for ionized cluster beam |
DE19701192C2 (de) | 1997-01-15 | 2000-10-05 | Staib Instr Gmbh | Vorrichtung und Verfahren zum Betrieb eines Spektrometers mit Energie- und Winkelauflösung |
DE19929185A1 (de) * | 1999-06-25 | 2001-01-04 | Staib Instr Gmbh | Vorrichtung und Verfahren zur energie- und winkelaufgelösten Elektronenspektroskopie |
JP4774140B2 (ja) * | 2000-01-25 | 2011-09-14 | 株式会社アルバック | 高周波電力印加電極に入射する高速中性粒子のエネルギーの分析方法及び分析装置 |
WO2008114684A1 (ja) * | 2007-03-16 | 2008-09-25 | National University Corporation NARA Institute of Science and Technology | エネルギー分析器、2次元表示型エネルギー分析器および光電子顕微鏡 |
-
1981
- 1981-10-30 JP JP56175077A patent/JPS5875754A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5875754A (ja) | 1983-05-07 |
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