JPH0114533B2 - - Google Patents

Info

Publication number
JPH0114533B2
JPH0114533B2 JP55065414A JP6541480A JPH0114533B2 JP H0114533 B2 JPH0114533 B2 JP H0114533B2 JP 55065414 A JP55065414 A JP 55065414A JP 6541480 A JP6541480 A JP 6541480A JP H0114533 B2 JPH0114533 B2 JP H0114533B2
Authority
JP
Japan
Prior art keywords
sample
ray
specimen
stage
guide rail
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55065414A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56162038A (en
Inventor
Atsumi Sunakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Original Assignee
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd filed Critical Rigaku Denki Co Ltd
Priority to JP6541480A priority Critical patent/JPS56162038A/ja
Publication of JPS56162038A publication Critical patent/JPS56162038A/ja
Publication of JPH0114533B2 publication Critical patent/JPH0114533B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP6541480A 1980-05-19 1980-05-19 X-ray diffraction device for minor part of polycrystalline sample Granted JPS56162038A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6541480A JPS56162038A (en) 1980-05-19 1980-05-19 X-ray diffraction device for minor part of polycrystalline sample

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6541480A JPS56162038A (en) 1980-05-19 1980-05-19 X-ray diffraction device for minor part of polycrystalline sample

Publications (2)

Publication Number Publication Date
JPS56162038A JPS56162038A (en) 1981-12-12
JPH0114533B2 true JPH0114533B2 (enrdf_load_stackoverflow) 1989-03-13

Family

ID=13286347

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6541480A Granted JPS56162038A (en) 1980-05-19 1980-05-19 X-ray diffraction device for minor part of polycrystalline sample

Country Status (1)

Country Link
JP (1) JPS56162038A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS56162038A (en) 1981-12-12

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