JPS56162038A - X-ray diffraction device for minor part of polycrystalline sample - Google Patents
X-ray diffraction device for minor part of polycrystalline sampleInfo
- Publication number
- JPS56162038A JPS56162038A JP6541480A JP6541480A JPS56162038A JP S56162038 A JPS56162038 A JP S56162038A JP 6541480 A JP6541480 A JP 6541480A JP 6541480 A JP6541480 A JP 6541480A JP S56162038 A JPS56162038 A JP S56162038A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- way
- directions
- minor part
- diffraction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000002441 X-ray diffraction Methods 0.000 title 1
- 239000013078 crystal Substances 0.000 abstract 3
- 238000005259 measurement Methods 0.000 abstract 3
- 230000004907 flux Effects 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6541480A JPS56162038A (en) | 1980-05-19 | 1980-05-19 | X-ray diffraction device for minor part of polycrystalline sample |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6541480A JPS56162038A (en) | 1980-05-19 | 1980-05-19 | X-ray diffraction device for minor part of polycrystalline sample |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56162038A true JPS56162038A (en) | 1981-12-12 |
JPH0114533B2 JPH0114533B2 (enrdf_load_stackoverflow) | 1989-03-13 |
Family
ID=13286347
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6541480A Granted JPS56162038A (en) | 1980-05-19 | 1980-05-19 | X-ray diffraction device for minor part of polycrystalline sample |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56162038A (enrdf_load_stackoverflow) |
-
1980
- 1980-05-19 JP JP6541480A patent/JPS56162038A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0114533B2 (enrdf_load_stackoverflow) | 1989-03-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5512406A (en) | Method of compensating error in measuring circle or arc and meter with compensator | |
US3828641A (en) | Apparatus for adjusting the elevation of a specimen in microtomes, particularly ultramicrotomes | |
FI64999C (fi) | Spaltkollimator foer panoramaroentgenavbildningsanordning | |
JPS56162038A (en) | X-ray diffraction device for minor part of polycrystalline sample | |
ATE31454T1 (de) | Laengen- oder winkelmebsystem. | |
SE8303457L (sv) | Lutningsinstrument | |
DE3128355A1 (de) | Instrument zur messung von schwankungen in der intensitaet eines buendels aus roentgenstrahlen | |
US3631240A (en) | Apparatus for holding and orienting a crystal in x-ray instruments measuring the microstructure thereof | |
JPS55105347A (en) | Apparatus for scribing single-crystal wafer | |
US4555852A (en) | Hand device for determining vehicle position | |
Bessiere et al. | Absolute measurement of diffuse scattering: Description of an independent double crystal monochromator and of a versatile six circle goniometer on a synchrotron source | |
US3355593A (en) | Contactless switching device | |
SU1188543A1 (ru) | Щелева диафрагма | |
US2458953A (en) | Apparatus and method for determining the scuff resistance of leather | |
JPS5713352A (en) | Probe holder for ultrasonic flaw detector | |
SU1296372A1 (ru) | Устройство дл установочных перемещений | |
SU502300A2 (ru) | Многоканальный дифрактометр | |
SU1420491A1 (ru) | Устройство дл рентгенографического определени макронапр жений | |
SU1472671A1 (ru) | Прибор дл определени сопротивлени внедрению пластины в грунт | |
SU1602498A1 (ru) | Устройство дл измерени усилий при чрескостном остеосинтезе | |
JPS5672334A (en) | Calibration device for neutron moisture meter | |
SU609055A1 (ru) | Устройство регулировки нул | |
JPS5772050A (en) | Goniometer such as x-ray microanalyzer | |
JPS57141502A (en) | Curvature measuring device for concave spherical surface | |
JPS53135374A (en) | X-ray stress measuring device |