JPS5772050A - Goniometer such as x-ray microanalyzer - Google Patents

Goniometer such as x-ray microanalyzer

Info

Publication number
JPS5772050A
JPS5772050A JP55148058A JP14805880A JPS5772050A JP S5772050 A JPS5772050 A JP S5772050A JP 55148058 A JP55148058 A JP 55148058A JP 14805880 A JP14805880 A JP 14805880A JP S5772050 A JPS5772050 A JP S5772050A
Authority
JP
Japan
Prior art keywords
crystal
detector
moves along
rotary shaft
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55148058A
Other languages
Japanese (ja)
Inventor
Yoshitaka Nagatsuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP55148058A priority Critical patent/JPS5772050A/en
Publication of JPS5772050A publication Critical patent/JPS5772050A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To enable a high-precise movement and to improve reproducibility and precision of a measurement, by a method wherein a spectral crystal and an X-ray detector are moved together with a moving piece using a rotary shaft. CONSTITUTION:If a driving pulse is fed to step motors M1 and M2 in a synchronous manner from a supply source 21, the M1 turns a rotary shaft 2 by an angle corresponding to the pulse, and a spectral crystal 12 moves along a shaft 2 together with a moving piece 5, a circular arm 6 also changing its inclination. The M2 also pivots by the same angle thereupon, and X-ray detector 17 moves along a rotary shaft 14 by the same angle thereupon, and an X-ray detector 17 moves along a rotary shaft 14 by the same moving amount as that of the crystal 12. Following said movement, a truck 18 also moves along the arm 6, an angle of the surface of the crystal 12 to the detector 17 changes as well. This constantly maintains a distance between an X-ray generating point and the crystal 12 and a distance between the crystal 12 and the detector 17 at a constant value respectively, and permits changing of an angle of the crystal 12 to the sample 1 so that the sample 1, the crystal 12, and the detector 17 are always positioned on a Rowland circle.
JP55148058A 1980-10-22 1980-10-22 Goniometer such as x-ray microanalyzer Pending JPS5772050A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55148058A JPS5772050A (en) 1980-10-22 1980-10-22 Goniometer such as x-ray microanalyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55148058A JPS5772050A (en) 1980-10-22 1980-10-22 Goniometer such as x-ray microanalyzer

Publications (1)

Publication Number Publication Date
JPS5772050A true JPS5772050A (en) 1982-05-06

Family

ID=15444226

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55148058A Pending JPS5772050A (en) 1980-10-22 1980-10-22 Goniometer such as x-ray microanalyzer

Country Status (1)

Country Link
JP (1) JPS5772050A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4637041A (en) * 1983-03-15 1987-01-13 Technische Hogeschool Eindhoven Kinematic X-ray analyses apparatus
US4691334A (en) * 1983-10-12 1987-09-01 U.S. Philips Corporation X-ray examination apparatus
JP2006337301A (en) * 2005-06-06 2006-12-14 Shimadzu Corp X-ray analyzer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4637041A (en) * 1983-03-15 1987-01-13 Technische Hogeschool Eindhoven Kinematic X-ray analyses apparatus
US4691334A (en) * 1983-10-12 1987-09-01 U.S. Philips Corporation X-ray examination apparatus
JP2006337301A (en) * 2005-06-06 2006-12-14 Shimadzu Corp X-ray analyzer
JP4639971B2 (en) * 2005-06-06 2011-02-23 株式会社島津製作所 X-ray analyzer

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