JPS5772050A - Goniometer such as x-ray microanalyzer - Google Patents
Goniometer such as x-ray microanalyzerInfo
- Publication number
- JPS5772050A JPS5772050A JP55148058A JP14805880A JPS5772050A JP S5772050 A JPS5772050 A JP S5772050A JP 55148058 A JP55148058 A JP 55148058A JP 14805880 A JP14805880 A JP 14805880A JP S5772050 A JPS5772050 A JP S5772050A
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- detector
- moves along
- rotary shaft
- angle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To enable a high-precise movement and to improve reproducibility and precision of a measurement, by a method wherein a spectral crystal and an X-ray detector are moved together with a moving piece using a rotary shaft. CONSTITUTION:If a driving pulse is fed to step motors M1 and M2 in a synchronous manner from a supply source 21, the M1 turns a rotary shaft 2 by an angle corresponding to the pulse, and a spectral crystal 12 moves along a shaft 2 together with a moving piece 5, a circular arm 6 also changing its inclination. The M2 also pivots by the same angle thereupon, and X-ray detector 17 moves along a rotary shaft 14 by the same angle thereupon, and an X-ray detector 17 moves along a rotary shaft 14 by the same moving amount as that of the crystal 12. Following said movement, a truck 18 also moves along the arm 6, an angle of the surface of the crystal 12 to the detector 17 changes as well. This constantly maintains a distance between an X-ray generating point and the crystal 12 and a distance between the crystal 12 and the detector 17 at a constant value respectively, and permits changing of an angle of the crystal 12 to the sample 1 so that the sample 1, the crystal 12, and the detector 17 are always positioned on a Rowland circle.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55148058A JPS5772050A (en) | 1980-10-22 | 1980-10-22 | Goniometer such as x-ray microanalyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55148058A JPS5772050A (en) | 1980-10-22 | 1980-10-22 | Goniometer such as x-ray microanalyzer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5772050A true JPS5772050A (en) | 1982-05-06 |
Family
ID=15444226
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55148058A Pending JPS5772050A (en) | 1980-10-22 | 1980-10-22 | Goniometer such as x-ray microanalyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5772050A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4637041A (en) * | 1983-03-15 | 1987-01-13 | Technische Hogeschool Eindhoven | Kinematic X-ray analyses apparatus |
US4691334A (en) * | 1983-10-12 | 1987-09-01 | U.S. Philips Corporation | X-ray examination apparatus |
JP2006337301A (en) * | 2005-06-06 | 2006-12-14 | Shimadzu Corp | X-ray analyzer |
-
1980
- 1980-10-22 JP JP55148058A patent/JPS5772050A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4637041A (en) * | 1983-03-15 | 1987-01-13 | Technische Hogeschool Eindhoven | Kinematic X-ray analyses apparatus |
US4691334A (en) * | 1983-10-12 | 1987-09-01 | U.S. Philips Corporation | X-ray examination apparatus |
JP2006337301A (en) * | 2005-06-06 | 2006-12-14 | Shimadzu Corp | X-ray analyzer |
JP4639971B2 (en) * | 2005-06-06 | 2011-02-23 | 株式会社島津製作所 | X-ray analyzer |
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