JP7800930B2 - 電気信号を生成及び測定するためのシステム及び方法 - Google Patents

電気信号を生成及び測定するためのシステム及び方法

Info

Publication number
JP7800930B2
JP7800930B2 JP2023506003A JP2023506003A JP7800930B2 JP 7800930 B2 JP7800930 B2 JP 7800930B2 JP 2023506003 A JP2023506003 A JP 2023506003A JP 2023506003 A JP2023506003 A JP 2023506003A JP 7800930 B2 JP7800930 B2 JP 7800930B2
Authority
JP
Japan
Prior art keywords
voltage
current
output terminal
channel
analog
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2023506003A
Other languages
English (en)
Japanese (ja)
Other versions
JP2023539422A5 (https=
JP2023539422A (ja
JPWO2022023915A5 (https=
Inventor
マヘンドラ，アンドリ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nicslab Inc
Original Assignee
Nicslab Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2020902625A external-priority patent/AU2020902625A0/en
Application filed by Nicslab Inc filed Critical Nicslab Inc
Publication of JP2023539422A publication Critical patent/JP2023539422A/ja
Publication of JP2023539422A5 publication Critical patent/JP2023539422A5/ja
Publication of JPWO2022023915A5 publication Critical patent/JPWO2022023915A5/ja
Application granted granted Critical
Publication of JP7800930B2 publication Critical patent/JP7800930B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/04—Voltage dividers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Remote Monitoring And Control Of Power-Distribution Networks (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
JP2023506003A 2020-07-27 2021-07-26 電気信号を生成及び測定するためのシステム及び方法 Active JP7800930B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AU2020902625 2020-07-27
AU2020902625A AU2020902625A0 (en) 2020-07-27 Source measurement unit
PCT/IB2021/056696 WO2022023915A1 (en) 2020-07-27 2021-07-26 Systems and methods for generating and measuring electrical signals

Publications (4)

Publication Number Publication Date
JP2023539422A JP2023539422A (ja) 2023-09-14
JP2023539422A5 JP2023539422A5 (https=) 2024-04-25
JPWO2022023915A5 JPWO2022023915A5 (https=) 2024-04-25
JP7800930B2 true JP7800930B2 (ja) 2026-01-16

Family

ID=80035277

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023506003A Active JP7800930B2 (ja) 2020-07-27 2021-07-26 電気信号を生成及び測定するためのシステム及び方法

Country Status (5)

Country Link
US (2) US12292458B2 (https=)
EP (1) EP4189409A4 (https=)
JP (1) JP7800930B2 (https=)
CN (1) CN115989419A (https=)
WO (1) WO2022023915A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230030436A (ko) * 2021-08-25 2023-03-06 삼성전자주식회사 모니터링 회로, 모니터링 회로를 포함하는 집적 회로 및 모니터링 회로의 동작 방법
CN115598445B (zh) * 2022-10-25 2023-12-01 浙江御辰东智能科技有限公司 一种基于硬件在环的电气故障检测方法及装置
US12422461B2 (en) * 2023-10-05 2025-09-23 Analog Devices International Unlimited Company Method to measure high voltages accurately
WO2025208205A1 (en) * 2024-03-30 2025-10-09 Seron Electronics Ltd. Systems and methods for implementing and controlling source-measurement systems
WO2025219848A1 (en) * 2024-04-15 2025-10-23 Nicslab, Inc. Electrical power supplies and related systems

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008524629A (ja) 2004-12-21 2008-07-10 テラダイン・インコーポレーテッド 半導体デバイスを試験する方法及びシステム
JP2008199844A (ja) 2007-02-15 2008-08-28 Denso Corp 車両用バッテリ電流検出装置
US20090121908A1 (en) 2007-11-08 2009-05-14 Regier Christopher G Source-Measure Unit Based on Digital Control Loop
JP2009128082A (ja) 2007-11-21 2009-06-11 Yokogawa Electric Corp Ｉｃテスタ及び液晶駆動ドライバの試験方法
US20140266412A1 (en) 2013-03-13 2014-09-18 General Electric Company Systems and methods for power limiting for a programmable i/o device
US20170264295A1 (en) 2016-03-11 2017-09-14 Colm Slattery Configurable hardware platform for measurement or control
JP2018185245A (ja) 2017-04-27 2018-11-22 日立オートモティブシステムズ株式会社 車載用電子制御装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6836272B2 (en) * 2002-03-12 2004-12-28 Sun Microsystems, Inc. Frame buffer addressing scheme
KR100643246B1 (ko) * 2005-05-31 2006-11-10 삼성전자주식회사 디스플레이 장치
KR20130068126A (ko) * 2011-12-15 2013-06-25 한국전자통신연구원 정류기, 이를 이용한 수신 신호 강도 표시기 및 수신기
JP6531370B2 (ja) * 2014-10-17 2019-06-19 株式会社リコー 液滴吐出装置、液滴吐出方法、及びプログラム
CN206460350U (zh) * 2017-02-17 2017-09-01 烟台海博电气设备有限公司 一种高精度多通道程控电流源电路
KR101918167B1 (ko) * 2017-06-19 2018-11-13 주식회사 지파랑 반도체 소자 측정용 소스 및 측정 장치
WO2020095140A1 (ja) * 2018-11-08 2020-05-14 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
FR3097985A1 (fr) * 2019-06-28 2021-01-01 Stmicroelectronics (Grenoble 2) Sas Compensation de chute de tension de câble
US11558062B2 (en) * 2019-07-25 2023-01-17 Bfly Operations, Inc. Methods and apparatuses for turning on and off an ADC driver in an ultrasound device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008524629A (ja) 2004-12-21 2008-07-10 テラダイン・インコーポレーテッド 半導体デバイスを試験する方法及びシステム
JP2008199844A (ja) 2007-02-15 2008-08-28 Denso Corp 車両用バッテリ電流検出装置
US20090121908A1 (en) 2007-11-08 2009-05-14 Regier Christopher G Source-Measure Unit Based on Digital Control Loop
JP2009128082A (ja) 2007-11-21 2009-06-11 Yokogawa Electric Corp Ｉｃテスタ及び液晶駆動ドライバの試験方法
US20140266412A1 (en) 2013-03-13 2014-09-18 General Electric Company Systems and methods for power limiting for a programmable i/o device
US20170264295A1 (en) 2016-03-11 2017-09-14 Colm Slattery Configurable hardware platform for measurement or control
JP2018185245A (ja) 2017-04-27 2018-11-22 日立オートモティブシステムズ株式会社 車載用電子制御装置

Also Published As

Publication number Publication date
EP4189409A1 (en) 2023-06-07
EP4189409A4 (en) 2024-08-28
US20250231223A1 (en) 2025-07-17
WO2022023915A1 (en) 2022-02-03
JP2023539422A (ja) 2023-09-14
US20230288452A1 (en) 2023-09-14
US12292458B2 (en) 2025-05-06
CN115989419A (zh) 2023-04-18

Similar Documents

Publication Publication Date Title
JP7800930B2 (ja) 電気信号を生成及び測定するためのシステム及び方法
JP7094289B2 (ja) 直列接続電池セルのための監視システム
CN204832351U (zh) 一种微小电阻和绝缘电阻的一体化测试仪
US9379907B2 (en) Multichannel intelligent electronic device with advanced communication capabilities
US20170067848A1 (en) Potentiostat/galvanostat with digital interface
US8793086B2 (en) Method and system for detecting power supply source electrical current capacity
KR102059381B1 (ko) Bms 시뮬레이터 및 bms 시뮬레이션 시스템
CN104360165A (zh) 一种多通道电阻测量装置
US11128214B2 (en) Multi-channel power controller
CN112147484B (zh) 一种基于充电芯片的测试系统及充电测试系统
CN113064097A (zh) 一种参数检测装置
TWI458991B (zh) 電力量測裝置
EP2493048B1 (en) Method and system for detecting power supply source electrical current capacity
CN111948445A (zh) 功率测量电路、方法及装置
CN216956145U (zh) 无线万用表的表笔装置和无线万用表
CN214845679U (zh) 一种参数检测装置
CN106353643B (zh) 电阻比例电缆故障测试仪
CN210835059U (zh) 一种用于测试设备的nA级电流测量系统
CN114296019A (zh) 一种直流电流传感器温度补偿结构
CN103245827A (zh) 电压电流量测装置
Sreejithlal et al. Automated sensor test system using Raspberry Pi
CN119210452B (zh) 模拟量采集系统以及相关联的电气设备
CN205080459U (zh) 直流稳压电源供电系统及设备
CN105891762A (zh) 一种电力仪表的规格参数的设置方法
CN211955800U (zh) 一种仪表测试装置及系统

Legal Events

Date Code Title Description
A529 Written submission of copy of amendment under article 34 pct

Free format text: JAPANESE INTERMEDIATE CODE: A529

Effective date: 20230317

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20240415

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20240415

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20250212

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20250304

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20250513

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20250603

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20250813

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20251028

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20251118

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20251202

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20251222

R150 Certificate of patent or registration of utility model

Ref document number: 7800930

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150