CN115989419A - 用于生成和测量电信号的系统和方法 - Google Patents

用于生成和测量电信号的系统和方法 Download PDF

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Publication number
CN115989419A
CN115989419A CN202180053385.6A CN202180053385A CN115989419A CN 115989419 A CN115989419 A CN 115989419A CN 202180053385 A CN202180053385 A CN 202180053385A CN 115989419 A CN115989419 A CN 115989419A
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CN
China
Prior art keywords
voltage
current
output terminal
channel
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202180053385.6A
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English (en)
Chinese (zh)
Inventor
A·马亨德拉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nix Labo Co ltd
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Nix Labo Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2020902625A external-priority patent/AU2020902625A0/en
Application filed by Nix Labo Co ltd filed Critical Nix Labo Co ltd
Publication of CN115989419A publication Critical patent/CN115989419A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/04—Voltage dividers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Remote Monitoring And Control Of Power-Distribution Networks (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
CN202180053385.6A 2020-07-27 2021-07-26 用于生成和测量电信号的系统和方法 Pending CN115989419A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AU2020902625 2020-07-27
AU2020902625A AU2020902625A0 (en) 2020-07-27 Source measurement unit
PCT/IB2021/056696 WO2022023915A1 (en) 2020-07-27 2021-07-26 Systems and methods for generating and measuring electrical signals

Publications (1)

Publication Number Publication Date
CN115989419A true CN115989419A (zh) 2023-04-18

Family

ID=80035277

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180053385.6A Pending CN115989419A (zh) 2020-07-27 2021-07-26 用于生成和测量电信号的系统和方法

Country Status (5)

Country Link
US (2) US12292458B2 (https=)
EP (1) EP4189409A4 (https=)
JP (1) JP7800930B2 (https=)
CN (1) CN115989419A (https=)
WO (1) WO2022023915A1 (https=)

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* Cited by examiner, † Cited by third party
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KR20230030436A (ko) * 2021-08-25 2023-03-06 삼성전자주식회사 모니터링 회로, 모니터링 회로를 포함하는 집적 회로 및 모니터링 회로의 동작 방법
CN115598445B (zh) * 2022-10-25 2023-12-01 浙江御辰东智能科技有限公司 一种基于硬件在环的电气故障检测方法及装置
US12422461B2 (en) * 2023-10-05 2025-09-23 Analog Devices International Unlimited Company Method to measure high voltages accurately
WO2025208205A1 (en) * 2024-03-30 2025-10-09 Seron Electronics Ltd. Systems and methods for implementing and controlling source-measurement systems
WO2025219848A1 (en) * 2024-04-15 2025-10-23 Nicslab, Inc. Electrical power supplies and related systems

Citations (4)

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Publication number Priority date Publication date Assignee Title
US20140266412A1 (en) * 2013-03-13 2014-09-18 General Electric Company Systems and methods for power limiting for a programmable i/o device
CN206460350U (zh) * 2017-02-17 2017-09-01 烟台海博电气设备有限公司 一种高精度多通道程控电流源电路
US20170264295A1 (en) * 2016-03-11 2017-09-14 Colm Slattery Configurable hardware platform for measurement or control
JP2018185245A (ja) * 2017-04-27 2018-11-22 日立オートモティブシステムズ株式会社 車載用電子制御装置

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US6836272B2 (en) * 2002-03-12 2004-12-28 Sun Microsystems, Inc. Frame buffer addressing scheme
US7256600B2 (en) * 2004-12-21 2007-08-14 Teradyne, Inc. Method and system for testing semiconductor devices
KR100643246B1 (ko) * 2005-05-31 2006-11-10 삼성전자주식회사 디스플레이 장치
JP4293245B2 (ja) 2007-02-15 2009-07-08 株式会社デンソー 車両用バッテリ電流検出装置
US7903008B2 (en) * 2007-11-08 2011-03-08 National Instruments Corporation Source-measure unit based on digital control loop
JP5003955B2 (ja) 2007-11-21 2012-08-22 横河電機株式会社 Ｉｃテスタ
KR20130068126A (ko) * 2011-12-15 2013-06-25 한국전자통신연구원 정류기, 이를 이용한 수신 신호 강도 표시기 및 수신기
JP6531370B2 (ja) * 2014-10-17 2019-06-19 株式会社リコー 液滴吐出装置、液滴吐出方法、及びプログラム
KR101918167B1 (ko) * 2017-06-19 2018-11-13 주식회사 지파랑 반도체 소자 측정용 소스 및 측정 장치
WO2020095140A1 (ja) * 2018-11-08 2020-05-14 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
FR3097985A1 (fr) * 2019-06-28 2021-01-01 Stmicroelectronics (Grenoble 2) Sas Compensation de chute de tension de câble
US11558062B2 (en) * 2019-07-25 2023-01-17 Bfly Operations, Inc. Methods and apparatuses for turning on and off an ADC driver in an ultrasound device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140266412A1 (en) * 2013-03-13 2014-09-18 General Electric Company Systems and methods for power limiting for a programmable i/o device
US20170264295A1 (en) * 2016-03-11 2017-09-14 Colm Slattery Configurable hardware platform for measurement or control
CN206460350U (zh) * 2017-02-17 2017-09-01 烟台海博电气设备有限公司 一种高精度多通道程控电流源电路
JP2018185245A (ja) * 2017-04-27 2018-11-22 日立オートモティブシステムズ株式会社 車載用電子制御装置

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Also Published As

Publication number Publication date
EP4189409A1 (en) 2023-06-07
EP4189409A4 (en) 2024-08-28
US20250231223A1 (en) 2025-07-17
WO2022023915A1 (en) 2022-02-03
JP2023539422A (ja) 2023-09-14
JP7800930B2 (ja) 2026-01-16
US20230288452A1 (en) 2023-09-14
US12292458B2 (en) 2025-05-06

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