JP2023539422A5 - - Google Patents

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Publication number
JP2023539422A5
JP2023539422A5 JP2023506003A JP2023506003A JP2023539422A5 JP 2023539422 A5 JP2023539422 A5 JP 2023539422A5 JP 2023506003 A JP2023506003 A JP 2023506003A JP 2023506003 A JP2023506003 A JP 2023506003A JP 2023539422 A5 JP2023539422 A5 JP 2023539422A5
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JP
Japan
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JP2023506003A
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Japanese (ja)
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JP2023539422A (ja
JP7800930B2 (ja
JPWO2022023915A5 (https=
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Priority claimed from PCT/IB2021/056696 external-priority patent/WO2022023915A1/en
Publication of JP2023539422A publication Critical patent/JP2023539422A/ja
Publication of JP2023539422A5 publication Critical patent/JP2023539422A5/ja
Publication of JPWO2022023915A5 publication Critical patent/JPWO2022023915A5/ja
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JP2023506003A 2020-07-27 2021-07-26 電気信号を生成及び測定するためのシステム及び方法 Active JP7800930B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
AU2020902625 2020-07-27
AU2020902625A AU2020902625A0 (en) 2020-07-27 Source measurement unit
PCT/IB2021/056696 WO2022023915A1 (en) 2020-07-27 2021-07-26 Systems and methods for generating and measuring electrical signals

Publications (4)

Publication Number Publication Date
JP2023539422A JP2023539422A (ja) 2023-09-14
JP2023539422A5 true JP2023539422A5 (https=) 2024-04-25
JPWO2022023915A5 JPWO2022023915A5 (https=) 2024-04-25
JP7800930B2 JP7800930B2 (ja) 2026-01-16

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JP2023506003A Active JP7800930B2 (ja) 2020-07-27 2021-07-26 電気信号を生成及び測定するためのシステム及び方法

Country Status (5)

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US (2) US12292458B2 (https=)
EP (1) EP4189409A4 (https=)
JP (1) JP7800930B2 (https=)
CN (1) CN115989419A (https=)
WO (1) WO2022023915A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230030436A (ko) * 2021-08-25 2023-03-06 삼성전자주식회사 모니터링 회로, 모니터링 회로를 포함하는 집적 회로 및 모니터링 회로의 동작 방법
CN115598445B (zh) * 2022-10-25 2023-12-01 浙江御辰东智能科技有限公司 一种基于硬件在环的电气故障检测方法及装置
US12422461B2 (en) * 2023-10-05 2025-09-23 Analog Devices International Unlimited Company Method to measure high voltages accurately
WO2025208205A1 (en) * 2024-03-30 2025-10-09 Seron Electronics Ltd. Systems and methods for implementing and controlling source-measurement systems
WO2025219848A1 (en) * 2024-04-15 2025-10-23 Nicslab, Inc. Electrical power supplies and related systems

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US6836272B2 (en) * 2002-03-12 2004-12-28 Sun Microsystems, Inc. Frame buffer addressing scheme
US7256600B2 (en) * 2004-12-21 2007-08-14 Teradyne, Inc. Method and system for testing semiconductor devices
KR100643246B1 (ko) * 2005-05-31 2006-11-10 삼성전자주식회사 디스플레이 장치
JP4293245B2 (ja) 2007-02-15 2009-07-08 株式会社デンソー 車両用バッテリ電流検出装置
US7903008B2 (en) * 2007-11-08 2011-03-08 National Instruments Corporation Source-measure unit based on digital control loop
JP5003955B2 (ja) 2007-11-21 2012-08-22 横河電機株式会社 Icテスタ
KR20130068126A (ko) * 2011-12-15 2013-06-25 한국전자통신연구원 정류기, 이를 이용한 수신 신호 강도 표시기 및 수신기
US8847674B1 (en) 2013-03-13 2014-09-30 General Electric Company Systems and methods for power limiting for a programmable I/O device
JP6531370B2 (ja) * 2014-10-17 2019-06-19 株式会社リコー 液滴吐出装置、液滴吐出方法、及びプログラム
WO2017153847A1 (en) * 2016-03-11 2017-09-14 Analog Devices Global Configurable hardware platform for measurement or control
CN206460350U (zh) * 2017-02-17 2017-09-01 烟台海博电气设备有限公司 一种高精度多通道程控电流源电路
JP6797065B2 (ja) 2017-04-27 2020-12-09 日立オートモティブシステムズ株式会社 車載用電子制御装置
KR101918167B1 (ko) * 2017-06-19 2018-11-13 주식회사 지파랑 반도체 소자 측정용 소스 및 측정 장치
WO2020095140A1 (ja) * 2018-11-08 2020-05-14 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
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