JP7784700B2 - 校正用温度計、その製造方法、放射温度計の校正方法及びレーザーハンダ付け装置 - Google Patents

校正用温度計、その製造方法、放射温度計の校正方法及びレーザーハンダ付け装置

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JP7784700B2
JP7784700B2 JP2021183560A JP2021183560A JP7784700B2 JP 7784700 B2 JP7784700 B2 JP 7784700B2 JP 2021183560 A JP2021183560 A JP 2021183560A JP 2021183560 A JP2021183560 A JP 2021183560A JP 7784700 B2 JP7784700 B2 JP 7784700B2
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temperature
solder
calibration
thermometer
measuring
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耕平 浅葉
友一 酒川
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株式会社ジャパンユニックス
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JP2021183560A 2021-11-10 2021-11-10 校正用温度計、その製造方法、放射温度計の校正方法及びレーザーハンダ付け装置 Active JP7784700B2 (ja)

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JP2023071011A5 JP2023071011A5 (enExample) 2024-10-11
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JP7784701B2 (ja) 2021-11-10 2025-12-12 株式会社ジャパンユニックス レーザーハンダ付け装置における放射温度計の校正システム及び校正方法並びに校正用温度計の製造方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011022039A (ja) 2009-07-16 2011-02-03 Olympus Corp 温度測定装置および温度測定方法
JP2023071012A (ja) 2021-11-10 2023-05-22 株式会社ジャパンユニックス レーザーハンダ付け装置における放射温度計の校正システム及び校正方法

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JPS5623432U (enExample) * 1979-07-31 1981-03-03

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011022039A (ja) 2009-07-16 2011-02-03 Olympus Corp 温度測定装置および温度測定方法
JP2023071012A (ja) 2021-11-10 2023-05-22 株式会社ジャパンユニックス レーザーハンダ付け装置における放射温度計の校正システム及び校正方法

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