JP7661636B1 - 光学特性検査装置 - Google Patents

光学特性検査装置 Download PDF

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Publication number
JP7661636B1
JP7661636B1 JP2024551608A JP2024551608A JP7661636B1 JP 7661636 B1 JP7661636 B1 JP 7661636B1 JP 2024551608 A JP2024551608 A JP 2024551608A JP 2024551608 A JP2024551608 A JP 2024551608A JP 7661636 B1 JP7661636 B1 JP 7661636B1
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Japan
Prior art keywords
optical axis
optical
detector
light
search
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JP2024551608A
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Japanese (ja)
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JPWO2025224871A5 (https=
JPWO2025224871A1 (https=
Inventor
優大 白取
哲宏 深尾
洋平 見上
崇之 大仲
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/06—Restricting the angle of incident light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/58—Photometry, e.g. photographic exposure meter using luminescence generated by light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/42—Coupling light guides with opto-electronic elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Semiconductor Lasers (AREA)
JP2024551608A 2024-04-24 2024-04-24 光学特性検査装置 Active JP7661636B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2024/016044 WO2025224871A1 (ja) 2024-04-24 2024-04-24 光学特性検査装置

Publications (3)

Publication Number Publication Date
JP7661636B1 true JP7661636B1 (ja) 2025-04-14
JPWO2025224871A1 JPWO2025224871A1 (https=) 2025-10-30
JPWO2025224871A5 JPWO2025224871A5 (https=) 2026-04-01

Family

ID=95373649

Family Applications (1)

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JP2024551608A Active JP7661636B1 (ja) 2024-04-24 2024-04-24 光学特性検査装置

Country Status (2)

Country Link
JP (1) JP7661636B1 (https=)
WO (1) WO2025224871A1 (https=)

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03167511A (ja) * 1989-11-27 1991-07-19 Nec Corp 半導体レーザモジュールの光軸合わせ方法
JP2001085549A (ja) * 1999-09-14 2001-03-30 Matsushita Electronics Industry Corp 気密封止型半導体パッケージ
JP2004085801A (ja) * 2002-08-26 2004-03-18 Matsushita Electric Ind Co Ltd 光学素子調整方法およびその装置、並びにその方法が用いられた光学素子製造方法
JP2005172665A (ja) * 2003-12-12 2005-06-30 Oputeru:Kk 光放射パターン測定装置
JP2005214726A (ja) * 2004-01-28 2005-08-11 Advanced Lcd Technologies Development Center Co Ltd 光強度分布検出方法、光強度分布検出装置、アニール装置及びアニール方法
JP2005345925A (ja) * 2004-06-04 2005-12-15 Fujitsu Ltd 光学部品間の調芯方法、調芯プログラム、および調芯装置
JP2008216414A (ja) * 2007-03-01 2008-09-18 Konica Minolta Opto Inc 位置決め装置および位置決め方法
JP2010066562A (ja) * 2008-09-11 2010-03-25 Jtekt Corp 光ファイバ位置決め方法
JP2014199229A (ja) * 2013-03-29 2014-10-23 住友ベークライト株式会社 傾斜角度測定方法および傾斜角度測定装置
JP2015108789A (ja) * 2013-12-06 2015-06-11 株式会社日立情報通信エンジニアリング 光学部品の高精度調芯方法及び高精度調芯装置
JP2016018028A (ja) * 2014-07-07 2016-02-01 三菱電機株式会社 光軸調整装置および光軸調整方法
JP2018116196A (ja) * 2017-01-19 2018-07-26 三菱電機株式会社 光軸調整方法、光デバイスの製造方法、および光軸調整システム
JP2019203926A (ja) * 2018-05-21 2019-11-28 Tdk株式会社 接続装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001083379A (ja) * 1999-07-09 2001-03-30 Furukawa Electric Co Ltd:The 光部品の光軸合わせ方法およびその装置

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03167511A (ja) * 1989-11-27 1991-07-19 Nec Corp 半導体レーザモジュールの光軸合わせ方法
JP2001085549A (ja) * 1999-09-14 2001-03-30 Matsushita Electronics Industry Corp 気密封止型半導体パッケージ
JP2004085801A (ja) * 2002-08-26 2004-03-18 Matsushita Electric Ind Co Ltd 光学素子調整方法およびその装置、並びにその方法が用いられた光学素子製造方法
JP2005172665A (ja) * 2003-12-12 2005-06-30 Oputeru:Kk 光放射パターン測定装置
JP2005214726A (ja) * 2004-01-28 2005-08-11 Advanced Lcd Technologies Development Center Co Ltd 光強度分布検出方法、光強度分布検出装置、アニール装置及びアニール方法
JP2005345925A (ja) * 2004-06-04 2005-12-15 Fujitsu Ltd 光学部品間の調芯方法、調芯プログラム、および調芯装置
JP2008216414A (ja) * 2007-03-01 2008-09-18 Konica Minolta Opto Inc 位置決め装置および位置決め方法
JP2010066562A (ja) * 2008-09-11 2010-03-25 Jtekt Corp 光ファイバ位置決め方法
JP2014199229A (ja) * 2013-03-29 2014-10-23 住友ベークライト株式会社 傾斜角度測定方法および傾斜角度測定装置
JP2015108789A (ja) * 2013-12-06 2015-06-11 株式会社日立情報通信エンジニアリング 光学部品の高精度調芯方法及び高精度調芯装置
JP2016018028A (ja) * 2014-07-07 2016-02-01 三菱電機株式会社 光軸調整装置および光軸調整方法
JP2018116196A (ja) * 2017-01-19 2018-07-26 三菱電機株式会社 光軸調整方法、光デバイスの製造方法、および光軸調整システム
JP2019203926A (ja) * 2018-05-21 2019-11-28 Tdk株式会社 接続装置

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WO2025224871A1 (ja) 2025-10-30

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