JPWO2025224871A1 - - Google Patents

Info

Publication number
JPWO2025224871A1
JPWO2025224871A1 JP2024551608A JP2024551608A JPWO2025224871A1 JP WO2025224871 A1 JPWO2025224871 A1 JP WO2025224871A1 JP 2024551608 A JP2024551608 A JP 2024551608A JP 2024551608 A JP2024551608 A JP 2024551608A JP WO2025224871 A1 JPWO2025224871 A1 JP WO2025224871A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2024551608A
Other languages
Japanese (ja)
Other versions
JPWO2025224871A5 (https=
JP7661636B1 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of JP7661636B1 publication Critical patent/JP7661636B1/ja
Publication of JPWO2025224871A1 publication Critical patent/JPWO2025224871A1/ja
Publication of JPWO2025224871A5 publication Critical patent/JPWO2025224871A5/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/06—Restricting the angle of incident light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/58—Photometry, e.g. photographic exposure meter using luminescence generated by light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/42—Coupling light guides with opto-electronic elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Semiconductor Lasers (AREA)
JP2024551608A 2024-04-24 2024-04-24 光学特性検査装置 Active JP7661636B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2024/016044 WO2025224871A1 (ja) 2024-04-24 2024-04-24 光学特性検査装置

Publications (3)

Publication Number Publication Date
JP7661636B1 JP7661636B1 (ja) 2025-04-14
JPWO2025224871A1 true JPWO2025224871A1 (https=) 2025-10-30
JPWO2025224871A5 JPWO2025224871A5 (https=) 2026-04-01

Family

ID=95373649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024551608A Active JP7661636B1 (ja) 2024-04-24 2024-04-24 光学特性検査装置

Country Status (2)

Country Link
JP (1) JP7661636B1 (https=)
WO (1) WO2025224871A1 (https=)

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03167511A (ja) * 1989-11-27 1991-07-19 Nec Corp 半導体レーザモジュールの光軸合わせ方法
JP2001083379A (ja) * 1999-07-09 2001-03-30 Furukawa Electric Co Ltd:The 光部品の光軸合わせ方法およびその装置
JP2001085549A (ja) * 1999-09-14 2001-03-30 Matsushita Electronics Industry Corp 気密封止型半導体パッケージ
JP4001796B2 (ja) * 2002-08-26 2007-10-31 松下電器産業株式会社 光学素子調整方法およびその装置、並びにその方法が用いられた光学素子製造方法
JP2005172665A (ja) * 2003-12-12 2005-06-30 Oputeru:Kk 光放射パターン測定装置
JP4361383B2 (ja) * 2004-01-28 2009-11-11 株式会社 液晶先端技術開発センター 光強度分布監視方法、アニール装置及びアニール方法、結晶化装置
JP4595393B2 (ja) * 2004-06-04 2010-12-08 富士通株式会社 光学部品間の調芯方法、調芯プログラム、および調芯装置
JP5092455B2 (ja) * 2007-03-01 2012-12-05 コニカミノルタアドバンストレイヤー株式会社 位置決め装置および位置決め方法
JP2010066562A (ja) * 2008-09-11 2010-03-25 Jtekt Corp 光ファイバ位置決め方法
JP2014199229A (ja) * 2013-03-29 2014-10-23 住友ベークライト株式会社 傾斜角度測定方法および傾斜角度測定装置
JP6320737B2 (ja) * 2013-12-06 2018-05-09 株式会社日立情報通信エンジニアリング 光学部品の高精度調芯方法及び高精度調芯装置
JP6355993B2 (ja) * 2014-07-07 2018-07-11 三菱電機株式会社 光軸調整装置および光軸調整方法
JP6758204B2 (ja) * 2017-01-19 2020-09-23 三菱電機株式会社 光軸調整方法、光デバイスの製造方法、および光軸調整システム
JP2019203926A (ja) * 2018-05-21 2019-11-28 Tdk株式会社 接続装置

Also Published As

Publication number Publication date
JP7661636B1 (ja) 2025-04-14
WO2025224871A1 (ja) 2025-10-30

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