JP7639899B2 - 光反応評価装置 - Google Patents

光反応評価装置 Download PDF

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Publication number
JP7639899B2
JP7639899B2 JP2023518625A JP2023518625A JP7639899B2 JP 7639899 B2 JP7639899 B2 JP 7639899B2 JP 2023518625 A JP2023518625 A JP 2023518625A JP 2023518625 A JP2023518625 A JP 2023518625A JP 7639899 B2 JP7639899 B2 JP 7639899B2
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Prior art keywords
light source
light
sample
intensity distribution
irradiation
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Japanese (ja)
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JPWO2022234715A5 (https=
JPWO2022234715A1 (https=
Inventor
隆宏 玉木
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Shimadzu Corp
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Shimadzu Corp
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/10Arrangements of light sources specially adapted for spectrometry or colorimetry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/42Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/443Emission spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255Details, e.g. use of specially adapted sources, lighting or optical systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/272Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration for following a reaction, e.g. for determining photometrically a reaction rate (photometric cinetic analysis)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N2021/3125Measuring the absorption by excited molecules
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/6408Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2023518625A 2021-05-06 2022-03-07 光反応評価装置 Active JP7639899B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021078640 2021-05-06
JP2021078640 2021-05-06
PCT/JP2022/009626 WO2022234715A1 (ja) 2021-05-06 2022-03-07 光反応評価装置

Publications (3)

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JPWO2022234715A1 JPWO2022234715A1 (https=) 2022-11-10
JPWO2022234715A5 JPWO2022234715A5 (https=) 2024-01-26
JP7639899B2 true JP7639899B2 (ja) 2025-03-05

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Family Applications (1)

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JP2023518625A Active JP7639899B2 (ja) 2021-05-06 2022-03-07 光反応評価装置

Country Status (4)

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US (1) US20240230524A1 (https=)
JP (1) JP7639899B2 (https=)
CN (1) CN117616268A (https=)
WO (1) WO2022234715A1 (https=)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002071449A (ja) 2000-09-01 2002-03-08 Nippon Hoso Kyokai <Nhk> フォトン数計数装置および量子効率測定装置
US20040090622A1 (en) 2001-05-03 2004-05-13 Nielsen Hans Ole Apparatus and sensing devices for measuring fluorescence lifetimes of fluorescence sensors
JP2014134527A (ja) 2013-01-12 2014-07-24 Oh'tec Electronics Corp Led測定装置の校正方法、及びその方法を用いたled測定装置
JP2019113568A (ja) 2019-04-18 2019-07-11 浜松ホトニクス株式会社 分光測定装置および分光測定方法
WO2020022038A1 (ja) 2018-07-24 2020-01-30 ソニー株式会社 情報処理装置、情報処理方法、情報処理システム、およびプログラム
US20210102893A1 (en) 2019-10-08 2021-04-08 Halliburton Energy Services, Inc. Transmissive scattering for radiometry
WO2021166310A1 (ja) 2020-02-20 2021-08-26 株式会社島津製作所 光反応評価装置およびフォトン数算出方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5516486B2 (ja) * 2011-04-14 2014-06-11 株式会社島津製作所 分光測定装置及びプログラム
US9482612B2 (en) * 2014-11-14 2016-11-01 Infinitum Solutions, Inc. Photon emitter characterization using photoluminescence quenching in nitrogen vacancy color centers
JP7056627B2 (ja) * 2019-05-17 2022-04-19 横河電機株式会社 分光分析装置及び分光分析方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002071449A (ja) 2000-09-01 2002-03-08 Nippon Hoso Kyokai <Nhk> フォトン数計数装置および量子効率測定装置
US20040090622A1 (en) 2001-05-03 2004-05-13 Nielsen Hans Ole Apparatus and sensing devices for measuring fluorescence lifetimes of fluorescence sensors
JP2014134527A (ja) 2013-01-12 2014-07-24 Oh'tec Electronics Corp Led測定装置の校正方法、及びその方法を用いたled測定装置
WO2020022038A1 (ja) 2018-07-24 2020-01-30 ソニー株式会社 情報処理装置、情報処理方法、情報処理システム、およびプログラム
JP2019113568A (ja) 2019-04-18 2019-07-11 浜松ホトニクス株式会社 分光測定装置および分光測定方法
US20210102893A1 (en) 2019-10-08 2021-04-08 Halliburton Energy Services, Inc. Transmissive scattering for radiometry
WO2021166310A1 (ja) 2020-02-20 2021-08-26 株式会社島津製作所 光反応評価装置およびフォトン数算出方法

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Publication number Publication date
CN117616268A (zh) 2024-02-27
US20240230524A1 (en) 2024-07-11
JPWO2022234715A1 (https=) 2022-11-10
WO2022234715A1 (ja) 2022-11-10

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