JPWO2022234715A5 - - Google Patents

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JPWO2022234715A5
JPWO2022234715A5 JP2023518625A JP2023518625A JPWO2022234715A5 JP WO2022234715 A5 JPWO2022234715 A5 JP WO2022234715A5 JP 2023518625 A JP2023518625 A JP 2023518625A JP 2023518625 A JP2023518625 A JP 2023518625A JP WO2022234715 A5 JPWO2022234715 A5 JP WO2022234715A5
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Japan
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light source
light
intensity distribution
irradiation
sample position
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JP2023518625A
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Japanese (ja)
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JPWO2022234715A1 (https=
JP7639899B2 (ja
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Priority claimed from PCT/JP2022/009626 external-priority patent/WO2022234715A1/ja
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JP2023518625A 2021-05-06 2022-03-07 光反応評価装置 Active JP7639899B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021078640 2021-05-06
JP2021078640 2021-05-06
PCT/JP2022/009626 WO2022234715A1 (ja) 2021-05-06 2022-03-07 光反応評価装置

Publications (3)

Publication Number Publication Date
JPWO2022234715A1 JPWO2022234715A1 (https=) 2022-11-10
JPWO2022234715A5 true JPWO2022234715A5 (https=) 2024-01-26
JP7639899B2 JP7639899B2 (ja) 2025-03-05

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JP2023518625A Active JP7639899B2 (ja) 2021-05-06 2022-03-07 光反応評価装置

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US (1) US20240230524A1 (https=)
JP (1) JP7639899B2 (https=)
CN (1) CN117616268A (https=)
WO (1) WO2022234715A1 (https=)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3974317B2 (ja) 2000-09-01 2007-09-12 日本放送協会 フォトン数計数装置および量子効率測定装置
WO2002090948A1 (en) * 2001-05-03 2002-11-14 Delta Dansk Elektronik, Lys & Akustik Apparatus and sensing devices for measuring fluorescence lifetimes of fluorescence sensors
JP5516486B2 (ja) * 2011-04-14 2014-06-11 株式会社島津製作所 分光測定装置及びプログラム
JP6094960B2 (ja) * 2013-01-12 2017-03-15 株式会社オーテックエレクトロニクス Ｌｅｄ測定装置の校正方法、及びその方法を用いたｌｅｄ測定装置
US9482612B2 (en) * 2014-11-14 2016-11-01 Infinitum Solutions, Inc. Photon emitter characterization using photoluminescence quenching in nitrogen vacancy color centers
US11579090B2 (en) * 2018-07-24 2023-02-14 Sony Corporation Information processing apparatus, information processing method, information processing system, and computer program
JP6763995B2 (ja) 2019-04-18 2020-09-30 浜松ホトニクス株式会社 分光測定装置および分光測定方法
JP7056627B2 (ja) * 2019-05-17 2022-04-19 横河電機株式会社 分光分析装置及び分光分析方法
WO2021071474A1 (en) 2019-10-08 2021-04-15 Halliburton Energy Services, Inc. Transmissive scattering for radiometry
WO2021166310A1 (ja) 2020-02-20 2021-08-26 株式会社島津製作所 光反応評価装置およびフォトン数算出方法

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