JP7616054B2 - クロマトグラフ用分光光度計および基準位置検出方法 - Google Patents

クロマトグラフ用分光光度計および基準位置検出方法 Download PDF

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Publication number
JP7616054B2
JP7616054B2 JP2021543964A JP2021543964A JP7616054B2 JP 7616054 B2 JP7616054 B2 JP 7616054B2 JP 2021543964 A JP2021543964 A JP 2021543964A JP 2021543964 A JP2021543964 A JP 2021543964A JP 7616054 B2 JP7616054 B2 JP 7616054B2
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Prior art keywords
angle
light
diffraction grating
reference position
amount
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Japanese (ja)
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JPWO2021044704A5 (enrdf_load_stackoverflow
JPWO2021044704A1 (enrdf_load_stackoverflow
Inventor
優子 重里
真二 辻
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Shimadzu Corp
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Shimadzu Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/06—Scanning arrangements arrangements for order-selection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/32—Investigating bands of a spectrum in sequence by a single detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/74—Optical detectors

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2021543964A 2019-09-02 2020-06-17 クロマトグラフ用分光光度計および基準位置検出方法 Active JP7616054B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019159791 2019-09-02
JP2019159791 2019-09-02
PCT/JP2020/023847 WO2021044704A1 (ja) 2019-09-02 2020-06-17 クロマトグラフ用分光光度計および基準位置検出方法

Publications (3)

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JPWO2021044704A1 JPWO2021044704A1 (enrdf_load_stackoverflow) 2021-03-11
JPWO2021044704A5 JPWO2021044704A5 (enrdf_load_stackoverflow) 2022-04-27
JP7616054B2 true JP7616054B2 (ja) 2025-01-17

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JP2021543964A Active JP7616054B2 (ja) 2019-09-02 2020-06-17 クロマトグラフ用分光光度計および基準位置検出方法

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JP (1) JP7616054B2 (enrdf_load_stackoverflow)
WO (1) WO2021044704A1 (enrdf_load_stackoverflow)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000065641A (ja) 1998-08-24 2000-03-03 Shimadzu Corp 分光光度計
JP2002168692A (ja) 2000-12-05 2002-06-14 Anritsu Corp 光スペクトラムアナライザおよびその波長校正方法
JP2008292249A (ja) 2007-05-23 2008-12-04 Hitachi High-Tech Manufacturing & Service Corp 分光光度計

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56108923A (en) * 1980-01-31 1981-08-28 Norito Suzuki Sweep control method of luminous analyzing spectroscope using microcomputer
JPS57142524A (en) * 1981-02-27 1982-09-03 Hitachi Ltd Measuring method and device for spectral luminous intensity
US4916645A (en) * 1988-06-02 1990-04-10 The Perkin-Elmer Corporation Continuous monochrometer drift compensation of a spectral monochromator
JPH0660844B2 (ja) * 1989-01-28 1994-08-10 株式会社島津製作所 分光光度計
JPH04290933A (ja) * 1991-03-19 1992-10-15 Hitachi Ltd 回折格子駆動装置
JPH08114538A (ja) * 1994-10-15 1996-05-07 Horiba Ltd 吸光度計
JP3591156B2 (ja) * 1996-09-30 2004-11-17 株式会社島津製作所 分光分析装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000065641A (ja) 1998-08-24 2000-03-03 Shimadzu Corp 分光光度計
JP2002168692A (ja) 2000-12-05 2002-06-14 Anritsu Corp 光スペクトラムアナライザおよびその波長校正方法
JP2008292249A (ja) 2007-05-23 2008-12-04 Hitachi High-Tech Manufacturing & Service Corp 分光光度計

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WO2021044704A1 (ja) 2021-03-11

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