JP7589509B2 - 絶縁抵抗監視装置 - Google Patents

絶縁抵抗監視装置 Download PDF

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Publication number
JP7589509B2
JP7589509B2 JP2020188196A JP2020188196A JP7589509B2 JP 7589509 B2 JP7589509 B2 JP 7589509B2 JP 2020188196 A JP2020188196 A JP 2020188196A JP 2020188196 A JP2020188196 A JP 2020188196A JP 7589509 B2 JP7589509 B2 JP 7589509B2
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Japan
Prior art keywords
insulation resistance
insulation
value
life
resistance value
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JP2020188196A
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English (en)
Japanese (ja)
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JP2022077370A5 (enExample
JP2022077370A (ja
Inventor
将宏 尾崎
昌平 山口
玲平 高谷
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Omron Corp
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Omron Corp
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Priority to JP2020188196A priority Critical patent/JP7589509B2/ja
Priority to PCT/JP2021/009902 priority patent/WO2022102144A1/ja
Publication of JP2022077370A publication Critical patent/JP2022077370A/ja
Publication of JP2022077370A5 publication Critical patent/JP2022077370A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/56—Testing of electric apparatus

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP2020188196A 2020-11-11 2020-11-11 絶縁抵抗監視装置 Active JP7589509B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2020188196A JP7589509B2 (ja) 2020-11-11 2020-11-11 絶縁抵抗監視装置
PCT/JP2021/009902 WO2022102144A1 (ja) 2020-11-11 2021-03-11 絶縁抵抗監視装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020188196A JP7589509B2 (ja) 2020-11-11 2020-11-11 絶縁抵抗監視装置

Publications (3)

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JP2022077370A JP2022077370A (ja) 2022-05-23
JP2022077370A5 JP2022077370A5 (enExample) 2023-09-21
JP7589509B2 true JP7589509B2 (ja) 2024-11-26

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JP2020188196A Active JP7589509B2 (ja) 2020-11-11 2020-11-11 絶縁抵抗監視装置

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JP (1) JP7589509B2 (enExample)
WO (1) WO2022102144A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118444021B (zh) * 2024-03-29 2025-12-02 北京和立智能科技有限公司 一种面向电动机的在线绝缘监测的实现方法及装置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000131363A (ja) 1998-10-20 2000-05-12 Toshiba Corp 電子装置の寿命診断方法及び装置
JP2001037167A (ja) 1999-07-26 2001-02-09 Mitsubishi Electric Building Techno Service Co Ltd 回転機の絶縁寿命推定方法および回転機の絶縁寿命推定システム
JP2006098349A (ja) 2004-09-30 2006-04-13 Mitsubishi Electric Building Techno Service Co Ltd 高圧回転機の残存絶縁寿命推定システムおよび推定方法
KR101330091B1 (ko) 2012-09-12 2013-11-18 이관우 운전중인 고전압 케이블의 수명 판정 방법
US20190146022A1 (en) 2014-08-29 2019-05-16 James J. Kinsella Manual and automated non-destructive pre-startup testing for short-circuit and ground fault conditions in motor branch circuits
JP2019163995A (ja) 2018-03-19 2019-09-26 株式会社東芝 劣化診断システム、抵抗値推定方法、およびコンピュータープログラム
JP2020003277A (ja) 2018-06-27 2020-01-09 三菱電機株式会社 受配電機器の短絡余寿命診断方法および短絡余寿命診断システム
JP2021043030A (ja) 2019-09-10 2021-03-18 ファナック株式会社 機械学習装置、学習モデルの生成方法、絶縁抵抗推定装置及び制御装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10132877A (ja) * 1996-10-31 1998-05-22 N T T Facilities:Kk 絶縁抵抗測定装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000131363A (ja) 1998-10-20 2000-05-12 Toshiba Corp 電子装置の寿命診断方法及び装置
JP2001037167A (ja) 1999-07-26 2001-02-09 Mitsubishi Electric Building Techno Service Co Ltd 回転機の絶縁寿命推定方法および回転機の絶縁寿命推定システム
JP2006098349A (ja) 2004-09-30 2006-04-13 Mitsubishi Electric Building Techno Service Co Ltd 高圧回転機の残存絶縁寿命推定システムおよび推定方法
KR101330091B1 (ko) 2012-09-12 2013-11-18 이관우 운전중인 고전압 케이블의 수명 판정 방법
US20190146022A1 (en) 2014-08-29 2019-05-16 James J. Kinsella Manual and automated non-destructive pre-startup testing for short-circuit and ground fault conditions in motor branch circuits
JP2019163995A (ja) 2018-03-19 2019-09-26 株式会社東芝 劣化診断システム、抵抗値推定方法、およびコンピュータープログラム
JP2020003277A (ja) 2018-06-27 2020-01-09 三菱電機株式会社 受配電機器の短絡余寿命診断方法および短絡余寿命診断システム
JP2021043030A (ja) 2019-09-10 2021-03-18 ファナック株式会社 機械学習装置、学習モデルの生成方法、絶縁抵抗推定装置及び制御装置

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WO2022102144A1 (ja) 2022-05-19
JP2022077370A (ja) 2022-05-23

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