JP7561196B2 - 逆導通パワー半導体デバイスおよびその製造方法 - Google Patents

逆導通パワー半導体デバイスおよびその製造方法 Download PDF

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Publication number
JP7561196B2
JP7561196B2 JP2022547145A JP2022547145A JP7561196B2 JP 7561196 B2 JP7561196 B2 JP 7561196B2 JP 2022547145 A JP2022547145 A JP 2022547145A JP 2022547145 A JP2022547145 A JP 2022547145A JP 7561196 B2 JP7561196 B2 JP 7561196B2
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layer
diode
anode layer
thyristor
diode anode
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Japanese (ja)
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JP2023514535A5 (enExample
JP2023514535A (ja
Inventor
ビクストレーム,トビアス
ベムラパティ,ウママヘスワラ
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Hitachi Energy Ltd
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Hitachi Energy Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/101Integrated devices comprising main components and built-in components, e.g. IGBT having built-in freewheel diode
    • H10D84/131Thyristors having built-in components
    • H10D84/135Thyristors having built-in components the built-in components being diodes
    • H10D84/136Thyristors having built-in components the built-in components being diodes in anti-parallel configurations, e.g. reverse current thyristor [RCT]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/113Isolations within a component, i.e. internal isolations
    • H10D62/114PN junction isolations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/117Shapes of semiconductor bodies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/124Shapes, relative sizes or dispositions of the regions of semiconductor bodies or of junctions between the regions
    • H10D62/126Top-view geometrical layouts of the regions or the junctions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/129Cathode regions of diodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/17Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
    • H10D62/192Base regions of thyristors
    • H10D62/206Cathode base regions of thyristors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/50Physical imperfections
    • H10D62/53Physical imperfections the imperfections being within the semiconductor body 
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/20Electrodes characterised by their shapes, relative sizes or dispositions 
    • H10D64/27Electrodes not carrying the current to be rectified, amplified, oscillated or switched, e.g. gates
    • H10D64/291Gate electrodes for thyristors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00Diodes
    • H10D8/411PN diodes having planar bodies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0102Manufacture or treatment of thyristors having built-in components, e.g. thyristor having built-in diode

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  • Thyristors (AREA)
JP2022547145A 2020-02-03 2021-02-03 逆導通パワー半導体デバイスおよびその製造方法 Active JP7561196B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP20155140 2020-02-03
EP20155140.5 2020-02-03
PCT/EP2021/052514 WO2021156293A1 (en) 2020-02-03 2021-02-03 Reverse conducting power semiconductor device and method for manufacturing the same

Publications (3)

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JP2023514535A JP2023514535A (ja) 2023-04-06
JP2023514535A5 JP2023514535A5 (enExample) 2024-04-04
JP7561196B2 true JP7561196B2 (ja) 2024-10-03

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JP2022547145A Active JP7561196B2 (ja) 2020-02-03 2021-02-03 逆導通パワー半導体デバイスおよびその製造方法

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Country Link
US (1) US12426349B2 (enExample)
EP (1) EP4101008B1 (enExample)
JP (1) JP7561196B2 (enExample)
CN (1) CN115039233B (enExample)
WO (1) WO2021156293A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026084372A1 (ko) * 2024-10-17 2026-04-23 삼성디스플레이 주식회사 표시 장치

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114068728B (zh) * 2021-12-17 2025-05-06 全球能源互联网研究院有限公司 一种快速恢复二极管及其制备方法
TWI862120B (zh) * 2023-08-30 2024-11-11 台亞半導體股份有限公司 寬能帶二極體及其製造方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013543260A (ja) 2010-09-29 2013-11-28 アーベーベー・テヒノロギー・アーゲー 逆導通パワー半導体デバイス
JP2016009871A (ja) 2014-06-26 2016-01-18 アーベーベー・テクノロジー・アーゲー 逆導通パワー半導体デバイス
JP2016181691A (ja) 2015-03-23 2016-10-13 アーベーベー・テクノロジー・アーゲー 逆導通パワー半導体デバイス

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2925970B2 (ja) 1994-12-27 1999-07-28 日本碍子株式会社 逆導通静電誘導サイリスタ
JP3435246B2 (ja) 1995-01-31 2003-08-11 日本碍子株式会社 プレーナゲート構造を有する逆導通サイリスタ
US5682044A (en) 1995-01-31 1997-10-28 Takashige Tamamushi Reverse conducting thyristor with a planar-gate, buried-gate, or recessed-gate structure
US6274892B1 (en) * 1998-03-09 2001-08-14 Intersil Americas Inc. Devices formable by low temperature direct bonding
JP3494023B2 (ja) 1998-07-28 2004-02-03 株式会社日立製作所 半導体装置および半導体装置の駆動方法並びに電力変換装置
DE69841124D1 (de) * 1998-11-11 2009-10-15 Mitsubishi Electric Corp Rückwärtsleitender thyristor, halbleiteranordnung mit mechanischem kontakt und halbleitersubstrat
EP2477226B1 (en) * 2009-09-07 2016-06-22 Toyota Jidosha Kabushiki Kaisha Semiconductor device including semiconductor substrate having diode region and igbt region
EP2339613B1 (en) * 2009-12-22 2015-08-19 ABB Technology AG Power semiconductor device and method for producing same
WO2015154908A1 (en) * 2014-04-10 2015-10-15 Abb Technology Ag Turn-off power semiconductor device with improved centering and fixing of a gate ring, and method for manufacturing the same
WO2017042363A1 (en) 2015-09-11 2017-03-16 Abb Schweiz Ag Flat gate commutated thyristor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013543260A (ja) 2010-09-29 2013-11-28 アーベーベー・テヒノロギー・アーゲー 逆導通パワー半導体デバイス
JP2016009871A (ja) 2014-06-26 2016-01-18 アーベーベー・テクノロジー・アーゲー 逆導通パワー半導体デバイス
JP2016181691A (ja) 2015-03-23 2016-10-13 アーベーベー・テクノロジー・アーゲー 逆導通パワー半導体デバイス

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026084372A1 (ko) * 2024-10-17 2026-04-23 삼성디스플레이 주식회사 표시 장치

Also Published As

Publication number Publication date
US12426349B2 (en) 2025-09-23
CN115039233A (zh) 2022-09-09
EP4101008B1 (en) 2024-04-03
JP2023514535A (ja) 2023-04-06
CN115039233B (zh) 2026-02-27
US20230046742A1 (en) 2023-02-16
WO2021156293A1 (en) 2021-08-12
EP4101008A1 (en) 2022-12-14

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