JP7544295B2 - ガス分析計 - Google Patents
ガス分析計 Download PDFInfo
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- JP7544295B2 JP7544295B2 JP2023565993A JP2023565993A JP7544295B2 JP 7544295 B2 JP7544295 B2 JP 7544295B2 JP 2023565993 A JP2023565993 A JP 2023565993A JP 2023565993 A JP2023565993 A JP 2023565993A JP 7544295 B2 JP7544295 B2 JP 7544295B2
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- 230000003287 optical effect Effects 0.000 claims description 35
- 238000005259 measurement Methods 0.000 claims description 27
- 238000001228 spectrum Methods 0.000 claims description 20
- 230000005855 radiation Effects 0.000 claims description 17
- 230000008859 change Effects 0.000 claims description 16
- 238000012545 processing Methods 0.000 claims description 15
- 238000000295 emission spectrum Methods 0.000 claims description 10
- 238000010521 absorption reaction Methods 0.000 claims description 5
- 238000000034 method Methods 0.000 claims description 4
- 230000008569 process Effects 0.000 claims description 3
- 239000007789 gas Substances 0.000 description 115
- 238000010586 diagram Methods 0.000 description 35
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 4
- 238000001658 differential optical absorption spectrophotometry Methods 0.000 description 4
- 238000012937 correction Methods 0.000 description 3
- MWUXSHHQAYIFBG-UHFFFAOYSA-N nitrogen oxide Inorganic materials O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- 238000000862 absorption spectrum Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 239000003546 flue gas Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000003595 mist Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229910000069 nitrogen hydride Inorganic materials 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- XTQHKBHJIVJGKJ-UHFFFAOYSA-N sulfur monoxide Chemical class S=O XTQHKBHJIVJGKJ-UHFFFAOYSA-N 0.000 description 1
- 229910052815 sulfur oxide Inorganic materials 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/031—Multipass arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
- G01N2021/8557—Special shaping of flow, e.g. using a by-pass line, jet flow, curtain flow
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
特許文献1 特開2001-188043号公報
非特許文献1 Quantitative Spectroscopy Radiative Transfer Vol. 56, No. 2, pp. 187-208, 1996、Johan Mellqvist and Arne Rosen「DOAS FOR FLUE GAS MONITORING - I. TEMPERATURE EFFECTS IN THE U.V./VISIBLE ABSORPTION SPECTRA OF NO, N0 2 , SO 2 AND NH 3 」
Claims (6)
- サンプルガスに含まれる測定対象成分の濃度を測定するガス分析計であって、
前記測定対象成分の吸収波長を含む光を出射する光源部と、
前記光を反射させる1つ以上の反射ミラーを前記サンプルガスを封止した空間に収容したセルと、
前記セルを通過した前記光の放射スペクトルを取得する受光素子と、
前記光源部から前記受光素子までの光経路のいずれかに配置され、前記光源部が出射する前記光の放射スペクトルのいずれかのピークにおける強度を減少させる制限帯域を有するノッチフィルタと、
前記受光素子の受光信号を処理し、前記測定対象成分の濃度を測定する処理部と、
前記ノッチフィルタの制限帯域の波長を調整する調整部と
を備え、
前記ノッチフィルタは、前記セルの内部に配置されており、
前記調整部は、前記ノッチフィルタに対する前記光の入射角度を調整することで前記制限帯域の波長を調整し、
前記調整部は、前記入射角度を調整した場合に、少なくとも一つの前記反射ミラーの反射面の角度を調整する
ガス分析計。 - 前記セルは、前記光源部からの前記光を前記セルの内部に入射させる入射窓を有し、
前記1つ以上の反射ミラーは、前記入射窓から入射した前記光が最初に到達する第1の反射ミラーを含み、
前記ノッチフィルタは、前記入射窓と、前記第1の反射ミラーとの間の前記光経路に配置されている
請求項1に記載のガス分析計。 - 前記処理部は、前記調整部が前記入射角度を調整した場合に、前記受光信号の強度を補正する
請求項1に記載のガス分析計。 - 前記調整部には、前記入射角度を変更できる変更範囲が設定されており、
前記ノッチフィルタは、前記入射角度に応じた出射角度で前記光を出射し、
前記出射角度が変化した場合に、少なくとも一つの前記反射ミラーにおいて前記光が照射されるスポット位置が第1の方向に変化し、
前記少なくとも一つの前記反射ミラーは、前記ノッチフィルタに対する前記入射角度を前記変更範囲内の最小値から最大値まで変更させた場合の前記光の前記スポット位置が含まれる大きさの反射面を有する
請求項1から3のいずれか一項に記載のガス分析計。 - 前記ノッチフィルタを異なる複数の位置に備える
請求項1から3のいずれか一項に記載のガス分析計。 - 前記反射面は、前記第1の方向における長さが、前記第1の方向と直交する第2の方向における長さよりも大きい
請求項4に記載のガス分析計。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2022/017083 WO2023195066A1 (ja) | 2022-04-05 | 2022-04-05 | ガス分析計 |
Publications (3)
Publication Number | Publication Date |
---|---|
JPWO2023195066A1 JPWO2023195066A1 (ja) | 2023-10-12 |
JPWO2023195066A5 JPWO2023195066A5 (ja) | 2024-03-15 |
JP7544295B2 true JP7544295B2 (ja) | 2024-09-03 |
Family
ID=88242632
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023565993A Active JP7544295B2 (ja) | 2022-04-05 | 2022-04-05 | ガス分析計 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP4317944A4 (ja) |
JP (1) | JP7544295B2 (ja) |
CN (1) | CN117203515A (ja) |
WO (1) | WO2023195066A1 (ja) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002258422A (ja) | 2000-12-27 | 2002-09-11 | Nikon Corp | 色分解光学装置および投射型表示装置 |
WO2003019160A3 (en) | 2001-08-21 | 2003-08-14 | Spx Corp | Open path emission sensing system |
JP2008304875A (ja) | 2007-05-09 | 2008-12-18 | Ntt Docomo Inc | 表示デバイス、スイッチングデバイス |
JP5257068B2 (ja) | 2006-05-16 | 2013-08-07 | 小野薬品工業株式会社 | 保護されていてもよい酸性基を含有する化合物およびその用途 |
JP2022043847A (ja) | 2020-09-04 | 2022-03-16 | 富士電機株式会社 | ガス分析計 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2521934C3 (de) * | 1975-05-16 | 1978-11-02 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Vorrichtung zur Bestimmung der Konzentrationen von Komponenten eines Abgasgemisches |
JPH05257068A (ja) * | 1992-03-13 | 1993-10-08 | Fujitsu Ltd | 可変波長光学フィルタ |
JP4211172B2 (ja) | 1999-12-28 | 2009-01-21 | 株式会社Ihi | 煙道中のso3ガスの濃度算出方法 |
US6583873B1 (en) * | 2000-09-25 | 2003-06-24 | The Carnegie Institution Of Washington | Optical devices having a wavelength-tunable dispersion assembly that has a volume dispersive diffraction grating |
US6826424B1 (en) * | 2000-12-19 | 2004-11-30 | Haishan Zeng | Methods and apparatus for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices |
WO2014037399A1 (en) * | 2012-09-04 | 2014-03-13 | Abb Technology Ag | Device and method for monitoring rooms equipped with high-voltage apparatuses |
-
2022
- 2022-04-05 EP EP22936466.6A patent/EP4317944A4/en active Pending
- 2022-04-05 JP JP2023565993A patent/JP7544295B2/ja active Active
- 2022-04-05 CN CN202280030572.7A patent/CN117203515A/zh active Pending
- 2022-04-05 WO PCT/JP2022/017083 patent/WO2023195066A1/ja active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002258422A (ja) | 2000-12-27 | 2002-09-11 | Nikon Corp | 色分解光学装置および投射型表示装置 |
WO2003019160A3 (en) | 2001-08-21 | 2003-08-14 | Spx Corp | Open path emission sensing system |
JP5257068B2 (ja) | 2006-05-16 | 2013-08-07 | 小野薬品工業株式会社 | 保護されていてもよい酸性基を含有する化合物およびその用途 |
JP2008304875A (ja) | 2007-05-09 | 2008-12-18 | Ntt Docomo Inc | 表示デバイス、スイッチングデバイス |
JP2022043847A (ja) | 2020-09-04 | 2022-03-16 | 富士電機株式会社 | ガス分析計 |
Also Published As
Publication number | Publication date |
---|---|
EP4317944A4 (en) | 2024-07-31 |
JPWO2023195066A1 (ja) | 2023-10-12 |
CN117203515A (zh) | 2023-12-08 |
EP4317944A1 (en) | 2024-02-07 |
WO2023195066A1 (ja) | 2023-10-12 |
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