JP7473546B2 - 分析装置 - Google Patents
分析装置 Download PDFInfo
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- JP7473546B2 JP7473546B2 JP2021527788A JP2021527788A JP7473546B2 JP 7473546 B2 JP7473546 B2 JP 7473546B2 JP 2021527788 A JP2021527788 A JP 2021527788A JP 2021527788 A JP2021527788 A JP 2021527788A JP 7473546 B2 JP7473546 B2 JP 7473546B2
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- light
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- 239000004065 semiconductor Substances 0.000 description 45
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- YBNMDCCMCLUHBL-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 4-pyren-1-ylbutanoate Chemical compound C=1C=C(C2=C34)C=CC3=CC=CC4=CC=C2C=1CCCC(=O)ON1C(=O)CCC1=O YBNMDCCMCLUHBL-UHFFFAOYSA-N 0.000 description 1
- NAWXUBYGYWOOIX-SFHVURJKSA-N (2s)-2-[[4-[2-(2,4-diaminoquinazolin-6-yl)ethyl]benzoyl]amino]-4-methylidenepentanedioic acid Chemical compound C1=CC2=NC(N)=NC(N)=C2C=C1CCC1=CC=C(C(=O)N[C@@H](CC(=C)C(O)=O)C(O)=O)C=C1 NAWXUBYGYWOOIX-SFHVURJKSA-N 0.000 description 1
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- 229910000661 Mercury cadmium telluride Inorganic materials 0.000 description 1
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- OYLGJCQECKOTOL-UHFFFAOYSA-L barium fluoride Chemical compound [F-].[F-].[Ba+2] OYLGJCQECKOTOL-UHFFFAOYSA-L 0.000 description 1
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- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 229910001634 calcium fluoride Inorganic materials 0.000 description 1
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J2003/423—Spectral arrangements using lasers, e.g. tunable
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/3148—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using three or more wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0691—Modulated (not pulsed supply)
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Optics & Photonics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019120161 | 2019-06-27 | ||
| JP2019120161 | 2019-06-27 | ||
| PCT/JP2020/025322 WO2020262640A1 (ja) | 2019-06-27 | 2020-06-26 | 分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2020262640A1 JPWO2020262640A1 (https=) | 2020-12-30 |
| JP7473546B2 true JP7473546B2 (ja) | 2024-04-23 |
Family
ID=74060591
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021527788A Active JP7473546B2 (ja) | 2019-06-27 | 2020-06-26 | 分析装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US12111255B2 (https=) |
| EP (1) | EP3992614B1 (https=) |
| JP (1) | JP7473546B2 (https=) |
| CN (1) | CN113841041A (https=) |
| WO (1) | WO2020262640A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2024134721A (ja) * | 2023-03-22 | 2024-10-04 | セイコーエプソン株式会社 | 分光装置および形状測定装置 |
| JPWO2024241920A1 (https=) * | 2023-05-19 | 2024-11-28 |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4451147A (en) | 1981-08-31 | 1984-05-29 | Karel Dobes | Refractometer |
| JP2001147341A (ja) | 2000-09-25 | 2001-05-29 | Fdk Corp | 光回路モジュール |
| JP2005502870A (ja) | 2001-09-11 | 2005-01-27 | エンバイロンメンタル システムズ プロダクツ ホールディングス インコーポレイテッド | 排気不透明度測定装置 |
| WO2006134675A1 (ja) | 2005-06-14 | 2006-12-21 | Nippon Telegraph And Telephone Corporation | 光合分波器およびその組み立て装置 |
| JP2009115654A (ja) | 2007-11-07 | 2009-05-28 | Toyota Motor Corp | 炭化水素濃度測定装置および炭化水素濃度測定方法 |
| US20110028824A1 (en) | 2007-08-28 | 2011-02-03 | Bryan Edward Cole | Scanning terahertz probe |
| US20150099303A1 (en) | 2013-10-03 | 2015-04-09 | Rosemount Analytical Inc. | Multiple wavelength light source for colorimetric measurement |
| JP2016515196A (ja) | 2013-02-22 | 2016-05-26 | ケーエルエー−テンカー コーポレイション | 光計測において照明を提供するためのシステム |
| JP2018531395A (ja) | 2015-07-21 | 2018-10-25 | フルイドセンス インターナショナル インコーポレイテッド | 液体中または空気中の粒子検出システムおよび方法 |
| JP6416448B1 (ja) | 2018-02-09 | 2018-10-31 | 三菱電機株式会社 | 光合分波器の製造方法 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5794158A (en) | 1980-11-29 | 1982-06-11 | Ricoh Co Ltd | Carriage driving device |
| US6369893B1 (en) | 1998-05-19 | 2002-04-09 | Cepheid | Multi-channel optical detection system |
| JP2001066250A (ja) * | 1999-08-30 | 2001-03-16 | Toyota Central Res & Dev Lab Inc | ガス検出装置 |
| US6433929B1 (en) * | 2000-06-12 | 2002-08-13 | Olympus Optical Co., Ltd. | Scanning optical microscope and method of acquiring image |
| GB0215557D0 (en) * | 2002-07-05 | 2002-08-14 | Renishaw Plc | Laser calibration apparatus |
| JP2005017683A (ja) | 2003-06-26 | 2005-01-20 | Nippon Telegr & Teleph Corp <Ntt> | 光合分波器 |
| DE102005054184B4 (de) * | 2005-11-14 | 2020-10-29 | Carl Zeiss Microscopy Gmbh | Multispektrale Beleuchtungsvorrichtung und Messverfahren |
| JP4899648B2 (ja) * | 2006-06-05 | 2012-03-21 | 株式会社ニコン | スペクトル観察方法及びスペクトル観察システム |
| WO2008014553A1 (en) * | 2006-08-01 | 2008-02-07 | Photonic Detection Systems Pty Ltd | Optical sensing system and optical devices therefor |
| JP5861895B2 (ja) * | 2012-02-06 | 2016-02-16 | 株式会社ニコン | 分光器及び顕微分光システム |
| DE102012216164B4 (de) | 2012-09-12 | 2016-04-28 | Forschungsverbund Berlin E.V. | Vorrichtung mit einer Anordnung optischer Elemente |
| WO2015084676A1 (en) | 2013-12-04 | 2015-06-11 | Iris International, Inc. | Flow cytometer |
| CN108604775B (zh) | 2016-02-03 | 2020-10-30 | 古河电气工业株式会社 | 激光装置 |
| US10187175B2 (en) * | 2016-11-18 | 2019-01-22 | Kohoku Kogyo Co., Ltd. | Optical multiplexer/demultiplexer and optical transceiver |
| JP6718619B2 (ja) | 2016-11-18 | 2020-07-08 | 湖北工業株式会社 | 光合分波器、光トランシーバ |
| JP6513762B2 (ja) * | 2016-12-15 | 2019-05-15 | 株式会社堀場製作所 | 分析装置、分析装置用プログラム及び分析方法 |
| CN109596538B (zh) * | 2017-10-03 | 2023-08-25 | 株式会社堀场制作所 | 分析装置和分析方法 |
| CN109856078B (zh) * | 2019-01-16 | 2022-12-23 | 深圳供电局有限公司 | 光学气体检测系统 |
-
2020
- 2020-06-26 JP JP2021527788A patent/JP7473546B2/ja active Active
- 2020-06-26 CN CN202080036382.7A patent/CN113841041A/zh active Pending
- 2020-06-26 WO PCT/JP2020/025322 patent/WO2020262640A1/ja not_active Ceased
- 2020-06-26 EP EP20832792.4A patent/EP3992614B1/en active Active
- 2020-06-26 US US17/615,548 patent/US12111255B2/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4451147A (en) | 1981-08-31 | 1984-05-29 | Karel Dobes | Refractometer |
| JP2001147341A (ja) | 2000-09-25 | 2001-05-29 | Fdk Corp | 光回路モジュール |
| JP2005502870A (ja) | 2001-09-11 | 2005-01-27 | エンバイロンメンタル システムズ プロダクツ ホールディングス インコーポレイテッド | 排気不透明度測定装置 |
| WO2006134675A1 (ja) | 2005-06-14 | 2006-12-21 | Nippon Telegraph And Telephone Corporation | 光合分波器およびその組み立て装置 |
| US20110028824A1 (en) | 2007-08-28 | 2011-02-03 | Bryan Edward Cole | Scanning terahertz probe |
| JP2009115654A (ja) | 2007-11-07 | 2009-05-28 | Toyota Motor Corp | 炭化水素濃度測定装置および炭化水素濃度測定方法 |
| JP2016515196A (ja) | 2013-02-22 | 2016-05-26 | ケーエルエー−テンカー コーポレイション | 光計測において照明を提供するためのシステム |
| US20150099303A1 (en) | 2013-10-03 | 2015-04-09 | Rosemount Analytical Inc. | Multiple wavelength light source for colorimetric measurement |
| JP2018531395A (ja) | 2015-07-21 | 2018-10-25 | フルイドセンス インターナショナル インコーポレイテッド | 液体中または空気中の粒子検出システムおよび方法 |
| JP6416448B1 (ja) | 2018-02-09 | 2018-10-31 | 三菱電機株式会社 | 光合分波器の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20220236180A1 (en) | 2022-07-28 |
| EP3992614A4 (en) | 2023-06-28 |
| CN113841041A (zh) | 2021-12-24 |
| JPWO2020262640A1 (https=) | 2020-12-30 |
| EP3992614B1 (en) | 2025-03-05 |
| US12111255B2 (en) | 2024-10-08 |
| WO2020262640A1 (ja) | 2020-12-30 |
| EP3992614A1 (en) | 2022-05-04 |
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