JP7471312B2 - センサ計測データ統合 - Google Patents
センサ計測データ統合 Download PDFInfo
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- JP7471312B2 JP7471312B2 JP2021547158A JP2021547158A JP7471312B2 JP 7471312 B2 JP7471312 B2 JP 7471312B2 JP 2021547158 A JP2021547158 A JP 2021547158A JP 2021547158 A JP2021547158 A JP 2021547158A JP 7471312 B2 JP7471312 B2 JP 7471312B2
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0286—Modifications to the monitored process, e.g. stopping operation or adapting control
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Program-control systems
- G05B19/02—Program-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/4183—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by data acquisition, e.g. workpiece identification
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Program-control systems
- G05B19/02—Program-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/41865—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by job scheduling, process planning, material flow
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Program-control systems
- G05B19/02—Program-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form
- G05B19/404—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form characterised by control arrangements for compensation, e.g. for backlash, overshoot, tool offset, tool wear, temperature, machine construction errors, load, inertia
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Program-control systems
- G05B19/02—Program-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/4184—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by fault tolerance, reliability of production system
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Program-control systems
- G05B19/02—Program-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
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- G05B19/00—Program-control systems
- G05B19/02—Program-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/41885—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by modeling, simulation of the manufacturing system
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- G—PHYSICS
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- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
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- G—PHYSICS
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- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
- G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
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- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0262—Confirmation of fault detection, e.g. extra checks to confirm that a failure has indeed occurred
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- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
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- G—PHYSICS
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- G06N3/09—Supervised learning
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24065—Real time diagnostics
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/31—From computer integrated manufacturing till monitoring
- G05B2219/31357—Observer based fault detection, use model
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
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- G05B2219/32—Operator till task planning
- G05B2219/32194—Quality prediction
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
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- G05B2219/00—Program-control systems
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- G05B2219/32201—Build statistical model of past normal proces, compare with actual process
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- G—PHYSICS
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- G05B2219/00—Program-control systems
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Automation & Control Theory (AREA)
- Quality & Reliability (AREA)
- Manufacturing & Machinery (AREA)
- Software Systems (AREA)
- Mathematical Physics (AREA)
- Evolutionary Computation (AREA)
- Artificial Intelligence (AREA)
- Computing Systems (AREA)
- Data Mining & Analysis (AREA)
- Computer Hardware Design (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Medical Informatics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Bioinformatics & Computational Biology (AREA)
- Evolutionary Biology (AREA)
- Human Computer Interaction (AREA)
- General Health & Medical Sciences (AREA)
- Computational Linguistics (AREA)
- Biophysics (AREA)
- Biomedical Technology (AREA)
- Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Testing And Monitoring For Control Systems (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
- Environmental & Geological Engineering (AREA)
- General Factory Administration (AREA)
- Image Analysis (AREA)
- Atmospheric Sciences (AREA)
- Biodiversity & Conservation Biology (AREA)
- Ecology (AREA)
- Environmental Sciences (AREA)
- Electric Propulsion And Braking For Vehicles (AREA)
- Inspection Of Paper Currency And Valuable Securities (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2024015763A JP2024059663A (ja) | 2019-02-19 | 2024-02-05 | センサ計測データ統合 |
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201962807619P | 2019-02-19 | 2019-02-19 | |
| US62/807,619 | 2019-02-19 | ||
| US16/791,081 | 2020-02-14 | ||
| US16/791,081 US11592812B2 (en) | 2019-02-19 | 2020-02-14 | Sensor metrology data integration |
| PCT/US2020/018673 WO2020172186A1 (en) | 2019-02-19 | 2020-02-18 | Sensor metrology data integration |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024015763A Division JP2024059663A (ja) | 2019-02-19 | 2024-02-05 | センサ計測データ統合 |
Publications (4)
| Publication Number | Publication Date |
|---|---|
| JP2022520247A JP2022520247A (ja) | 2022-03-29 |
| JP2022520247A5 JP2022520247A5 (https=) | 2023-03-01 |
| JPWO2020172186A5 JPWO2020172186A5 (https=) | 2023-03-01 |
| JP7471312B2 true JP7471312B2 (ja) | 2024-04-19 |
Family
ID=72043419
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021547158A Active JP7471312B2 (ja) | 2019-02-19 | 2020-02-18 | センサ計測データ統合 |
| JP2024015763A Pending JP2024059663A (ja) | 2019-02-19 | 2024-02-05 | センサ計測データ統合 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024015763A Pending JP2024059663A (ja) | 2019-02-19 | 2024-02-05 | センサ計測データ統合 |
Country Status (7)
| Country | Link |
|---|---|
| US (3) | US11592812B2 (https=) |
| JP (2) | JP7471312B2 (https=) |
| KR (2) | KR102611824B1 (https=) |
| CN (2) | CN113454552B (https=) |
| SG (1) | SG11202108577UA (https=) |
| TW (2) | TW202538611A (https=) |
| WO (1) | WO2020172186A1 (https=) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US9606519B2 (en) * | 2013-10-14 | 2017-03-28 | Applied Materials, Inc. | Matching process controllers for improved matching of process |
| US11940488B2 (en) | 2017-01-05 | 2024-03-26 | Xcalipr Corporation | Systems and methods for high precision optical characterization of carrier transport properties in semiconductor manufacturing |
| US11592812B2 (en) * | 2019-02-19 | 2023-02-28 | Applied Materials, Inc. | Sensor metrology data integration |
| US12283503B2 (en) | 2020-07-22 | 2025-04-22 | Applied Materials, Inc. | Substrate measurement subsystem |
| US11688616B2 (en) | 2020-07-22 | 2023-06-27 | Applied Materials, Inc. | Integrated substrate measurement system to improve manufacturing process performance |
| US20220066411A1 (en) * | 2020-08-31 | 2022-03-03 | Applied Materials, Inc. | Detecting and correcting substrate process drift using machine learning |
| US11375582B2 (en) * | 2020-10-16 | 2022-06-28 | Verizon Patent And Licensing Inc. | Systems and methods for scalable edge-based microcontrollers |
| CN112364561B (zh) * | 2020-10-26 | 2022-07-26 | 上海感探号信息科技有限公司 | 控车动作修正方法、装置、电子设备和存储介质 |
| TWI777317B (zh) * | 2020-11-30 | 2022-09-11 | 智慧貼紙股份有限公司 | 多點量測系統及其方法 |
| JP7632968B2 (ja) * | 2021-02-04 | 2025-02-19 | 東京エレクトロン株式会社 | 情報処理装置、プログラム及びプロセス条件探索方法 |
| US11853042B2 (en) | 2021-02-17 | 2023-12-26 | Applied Materials, Inc. | Part, sensor, and metrology data integration |
| US11532525B2 (en) * | 2021-03-03 | 2022-12-20 | Applied Materials, Inc. | Controlling concentration profiles for deposited films using machine learning |
| US12568791B2 (en) | 2021-03-03 | 2026-03-03 | Applied Materials, Inc. | Controlling concentration profiles for deposited films using machine learning |
| CN117121027A (zh) * | 2021-04-08 | 2023-11-24 | 3M创新有限公司 | 粘合剂预测系统 |
| US12506024B2 (en) | 2021-07-08 | 2025-12-23 | Applied Materials, Inc. | Method and mechanism for contact-free process chamber characterization |
| US12131105B2 (en) * | 2021-09-15 | 2024-10-29 | Applied Materials, Inc. | Virtual measurement of conditions proximate to a substrate with physics-informed compressed sensing |
| US12111355B2 (en) * | 2021-11-22 | 2024-10-08 | Onto Innovation Inc. | Semiconductor substrate yield prediction based on spectra data from multiple substrate dies |
| US12585232B2 (en) * | 2021-12-21 | 2026-03-24 | Applied Materials, Inc. | Substrate support characterization to build a digital twin |
| US12189380B2 (en) | 2022-01-27 | 2025-01-07 | Applied Materials, Inc. | Diagnostic tool to tool matching and comparative drill-down analysis methods for manufacturing equipment |
| US11961030B2 (en) * | 2022-01-27 | 2024-04-16 | Applied Materials, Inc. | Diagnostic tool to tool matching methods for manufacturing equipment |
| US12298748B2 (en) | 2022-01-27 | 2025-05-13 | Applied Materials, Inc. | Diagnostic tool to tool matching and full-trace drill-down analysis methods for manufacturing equipment |
| US12191126B2 (en) * | 2022-02-15 | 2025-01-07 | Applied Materials, Inc. | Process control knob estimation |
| US12105504B2 (en) * | 2022-04-27 | 2024-10-01 | Applied Materials, Inc. | Run-to-run control at a manufacturing system using machine learning |
| US12259719B2 (en) * | 2022-05-25 | 2025-03-25 | Applied Materials, Inc. | Methods and mechanisms for preventing fluctuation in machine-learning model performance |
| US20240005143A1 (en) * | 2022-06-30 | 2024-01-04 | Capital One Services, Llc | Machine learning for power consumption attribution |
| US11731317B1 (en) * | 2022-07-08 | 2023-08-22 | The Boeing Company | System and method for material manufacturing based on predicted properties of unconsolidated composite material |
| US12566132B2 (en) | 2022-07-08 | 2026-03-03 | The Boeing Company | Real time contaminants identification during composite material manufacturing via non-contact chemical sensing |
| US12422831B2 (en) * | 2022-07-08 | 2025-09-23 | The Boeing Company | Property prediction for unconsolidated composite materials |
| US20240037442A1 (en) * | 2022-07-26 | 2024-02-01 | Applied Materials, Inc. | Generating indications of learning of models for semiconductor processing |
| CN115314995B (zh) * | 2022-08-08 | 2023-08-04 | 深圳市海曼科技股份有限公司 | 一种无线级联消防定位方法、装置、电子设备及存储介质 |
| US12591805B2 (en) * | 2022-08-22 | 2026-03-31 | Applied Materials, Inc. | Equipment parameter management at a manufacturing system using machine learning |
| JP7274655B1 (ja) | 2022-09-09 | 2023-05-16 | Dmg森精機株式会社 | 携帯端末および計測管理プログラム |
| US12504726B2 (en) | 2022-11-28 | 2025-12-23 | Applied Materials, Inc. | Determining equipment constant updates by machine learning |
| US12498705B2 (en) | 2022-11-28 | 2025-12-16 | Applied Materials, Inc. | Chamber matching by equipment constant updates |
| US12560916B2 (en) | 2022-11-28 | 2026-02-24 | Applied Materials, Inc. | Adjusting chamber performance by equipment constant updates |
| US20240184858A1 (en) * | 2022-12-05 | 2024-06-06 | Applied Materials, Inc. | Methods and mechanisms for automatic sensor grouping to improve anomaly detection |
| WO2024166508A1 (ja) * | 2023-02-06 | 2024-08-15 | パナソニックIpマネジメント株式会社 | 情報処理方法、および、情報処理装置 |
| JP2024144254A (ja) * | 2023-03-30 | 2024-10-11 | ザ・ボーイング・カンパニー | 未固化複合材料のリアルタイム特性予測 |
| US12474755B2 (en) * | 2023-10-17 | 2025-11-18 | Dell Products, L.P. | Systems and methods for detecting presence or absence of a component on a circuit board |
| CN117234170B (zh) * | 2023-11-16 | 2024-01-12 | 中钢集团武汉安全环保研究院有限公司 | 一种钢铁关键工艺参数监测管理方法和装置 |
| EP4703826A1 (en) | 2024-08-30 | 2026-03-04 | Siemens Aktiengesellschaft | Computer-implemented method and apparatus for monitoring an industrial system |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| WO2018123116A1 (ja) | 2016-12-26 | 2018-07-05 | 三菱電機株式会社 | 加工工程生成装置、加工工程生成方法およびプログラム |
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