JP7470700B2 - ナノ粒子炭化ケイ素及びナノ粒子炭化ケイ素を含む電極 - Google Patents
ナノ粒子炭化ケイ素及びナノ粒子炭化ケイ素を含む電極 Download PDFInfo
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- JP7470700B2 JP7470700B2 JP2021544468A JP2021544468A JP7470700B2 JP 7470700 B2 JP7470700 B2 JP 7470700B2 JP 2021544468 A JP2021544468 A JP 2021544468A JP 2021544468 A JP2021544468 A JP 2021544468A JP 7470700 B2 JP7470700 B2 JP 7470700B2
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- MKGYHFFYERNDHK-UHFFFAOYSA-K P(=O)([O-])([O-])[O-].[Ti+4].[Li+] Chemical compound P(=O)([O-])([O-])[O-].[Ti+4].[Li+] MKGYHFFYERNDHK-UHFFFAOYSA-K 0.000 description 2
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- 229910017604 nitric acid Inorganic materials 0.000 description 2
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- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 150000001242 acetic acid derivatives Chemical class 0.000 description 1
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- AJFXNBUVIBKWBT-UHFFFAOYSA-N disodium;boric acid;hydrogen borate Chemical compound [Na+].[Na+].OB(O)O.OB(O)O.OB(O)O.OB([O-])[O-] AJFXNBUVIBKWBT-UHFFFAOYSA-N 0.000 description 1
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- FGQSJRDKBCVFHH-UHFFFAOYSA-N erbium(3+) pentane-2,4-dione Chemical compound [Er+3].CC(=O)[CH-]C(C)=O.CC(=O)[CH-]C(C)=O.CC(=O)[CH-]C(C)=O FGQSJRDKBCVFHH-UHFFFAOYSA-N 0.000 description 1
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- H01M4/02—Electrodes composed of, or comprising, active material
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- H01M4/58—Selection of substances as active materials, active masses, active liquids of inorganic compounds other than oxides or hydroxides, e.g. sulfides, selenides, tellurides, halogenides or LiCoFy; of polyanionic structures, e.g. phosphates, silicates or borates
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- H01M4/58—Selection of substances as active materials, active masses, active liquids of inorganic compounds other than oxides or hydroxides, e.g. sulfides, selenides, tellurides, halogenides or LiCoFy; of polyanionic structures, e.g. phosphates, silicates or borates
- H01M4/583—Carbonaceous material, e.g. graphite-intercalation compounds or CFx
- H01M4/587—Carbonaceous material, e.g. graphite-intercalation compounds or CFx for inserting or intercalating light metals
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- H01M4/00—Electrodes
- H01M4/02—Electrodes composed of, or comprising, active material
- H01M2004/026—Electrodes composed of, or comprising, active material characterised by the polarity
- H01M2004/027—Negative electrodes
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Description
BET表面積の決定は、DIN 66131(DIN-ISO 9277)に従って実施した。この目的で、Micromeritics Gemini V又はMicromeritics Gemini VIIを測定デバイスとして使用した。
サンプル量 4g
印加圧力 7.5kN
抵抗計 Loresta GP Loresta GP
測定センサ設定 ESP ESP
極 線形 線形
極間隔 3mm 3mm
極サイズ 1.4mm 1.4mm
サンプル形状 円形 円形
サンプルサイズ 直径=20mm 20mm
サンプルの厚さ サンプルに依存 5mm
測定位置 X:10mm;Y:10mm (10,10)
RCF 自動計算 2.758
粉体抵抗[Ω・cm]=抵抗[Ω]×厚さ[cm]×RCF
圧縮密度(g/cm3)=サンプルの質量(g)/Π×r2(cm2)×サンプルの厚さ(cm)
一般的な製造公差は、最大3%である。
活物質の材料密度を決定するために、活物質50%、Super-Pカーボン30wt%及び結合剤(NMP、N-メチル-2-ピロリドン)20wt%の組成を有する電極(厚さ約60μm)を作成した。
(電極式における活物質の割合(50%)×電極の正味重量(g)/(π(0.65cm)2×正味の電極の厚さ(cm))
電極中の活物質密度の値としては、本発明に係る材料について1.7g/cm3が見出された。
混合物又は懸濁液及び生成された材料についての粒子サイズ分布は、市販の装置を使用する光散乱法に基づいて決定される。該方法は、それ自体は当業者にとって既知であり、特に、JP2002-151082及びWO02/083555の開示も参照される。今回の場合、粒子サイズ分布は、レーザー回折計(独国ヘレンベルクのMastersizer S, Firma Malvern Instruments社製)及び製造者のソフトウェア(バージョン2.19)を使用して、測定ユニットとしてMalvern Small Volume Sample Dispersion Unit, DIF2002を使用して、DIN66133に従って決定した。以下の測定条件を選択した:圧縮範囲、アクティブビーム長2.4mm、測定範囲:300 RF、0.05~900μm。サンプルの準備及び測定は、製造者の仕様書に従って実施した。
本発明に係るSiCは、例えば、Yajima et al. Chem.Lett. 1975, 931又はB.Friedel, Dissertation Paderborn, 2007, B. Kettner et al. In Adv. Eng. Mater. 2018, 1701067によって大まかに記載されたものと同様にして、修正されたゾルゲル法によって生成した。
ナノ粒子炭化ケイ素(3C-SiC)の製造
1.1 ゾル-ゲルSi-C前駆体の製造:
オルトケイ酸テトラエチル(TEOS)135gを、エタノール170ml中に溶解した。さらに、ショ糖60gの溶液を60℃で蒸留水75mL中に生成し、HCl(1M)37.15mlを触媒として一滴ずつ加えて、転化糖を形成した。続いて、両方の溶液を攪拌しながら互いに混合し、放冷させた。使用するTEOS/水/ショ糖/HClのモル比には、1/6.5/0.3/0.06の比率が有利であることが証明されている。これらの(個々の又は全ての)比率が+/-10%の範囲で変動しても、本発明の範囲で使用可能であり、最終製品に変化が生じることはない。あるいは、ショ糖溶液の代わりに、液糖(転化糖、122g 70%)を直接使用することもできる。その後、水は追加されず、HCl(5.2mL 1M)の追加もごくわずかであるが、これらの追加は、ゲル化プロセスを開始するために必要なだけだからである。
続いて、顆粒を1800℃で5時間焼結し、1000℃から1800℃への加熱速度を100℃/分の温度勾配で行った。その後、30分以内に室温(25℃)へと冷却した。このようにして得られたナノ粒子純相及び化学量論的3C-SiCの粒子サイズは、一次粒子では40~100nm、D90値は63nm(+/-1nm)であり、二次粒子では1~10μm、D90値は8μmであった。
ドープされたナノ粒子炭化ケイ素(3C-SiC)の製造
製造は、ドープされていないSiCと同様に実行される。しかしながら、ショ糖を添加する前に、(1つ以上の)ドーパント元素又は純粋な元素に対応する化合物を、60℃に加熱した水へと導入する。それ以外は、実施例1と同様の方法で行う。このようにして得られたゾルを、ドーパント元素/化合物に応じて、部分的に着色する。
活物質として3C-SiC:Al及び3C-SiC:Nを有する薄膜電極は、例えば、Anderson et al., Electrochem. 及びSolid State Letters 3 (2) 2000, pages 66-68に記載されたようにして製造された。電極組成物は、典型的には、活物質50重量部と、Super Pカーボン30重量部と、結合剤としてのポリフッ化ビニリデン(Solvay 21216)20%から構成されていた。この電極組成物より、懸濁液をN-メチル-2-ピロリドン中に生成した。スラリーの固形分は、11.5%であった。
Claims (14)
- 二次リチウムイオン電池の電極の電極活物質であって、前記電極活物質が二次粒子の形態のナノ粒子炭化ケイ素SiCを含み、前記二次粒子がSiC一次粒子の凝集体により構成され、前記一次粒子の平均粒子サイズが40~100nmの範囲であり、前記二次粒子の平均粒子サイズが1~10μmである、電極活物質。
- 前記凝集体が1200~1600g/lのかさ密度を有する、請求項1に記載の電極活物質。
- 前記凝集体が1500~3000g/l(1.5~3g/cm3)の圧縮密度を有する、請求項1~2のいずれか一項に記載の電極活物質。
- 前記ナノ粒子炭化ケイ素SiCの粉体抵抗が28Ω・cm未満である、請求項1~3のいずれか一項に記載の電極活物質。
- 前記SiCが、Mg、Nb、Zr、B、Cr、V、Sc、Y、Al、N、P、La、Er及びGa、並びに、それらの混合物から選択される元素を使用してドープされている、請求項1~4のいずれか一項に記載の電極活物質。
- 前記元素が、B及び/若しくはAl、又は、N及び/若しくはPである、請求項5に記載の電極活物質。
- 前記SiCが3C結晶構造中に存在する、請求項1~6のいずれか一項に記載の電極活物質。
- 前記ナノ粒子炭化ケイ素SiCが、6H-SiC、4H-SiC又は15R-SiCを単相又はそれらの混合物として含む結晶構造内に存在する、請求項1~7のいずれか一項に記載の電極活物質。
- 請求項1~8のいずれか一項に記載の電極活物質を含有する、二次リチウムイオン電池用の電極。
- 前記電極活物質の密度が1.5~3g/cm3である、請求項9に記載の電極。
- 前記電極がアノードである、請求項9又は10に記載の電極。
- 前記SiCがN又はAlを使用してドープされる、請求項11に記載の電極。
- Alを使用してドープされた前記電極が、Liに対して0.4V+/-0.05Vにプラトーを有する、請求項12に記載の電極。
- 請求項12又は13に記載の電極であるアノードを含む、二次リチウムイオン電池。
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US20220255077A1 (en) | 2022-08-11 |
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