JP7453215B2 - マルチピース単層放射線検出器 - Google Patents

マルチピース単層放射線検出器 Download PDF

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JP7453215B2
JP7453215B2 JP2021512677A JP2021512677A JP7453215B2 JP 7453215 B2 JP7453215 B2 JP 7453215B2 JP 2021512677 A JP2021512677 A JP 2021512677A JP 2021512677 A JP2021512677 A JP 2021512677A JP 7453215 B2 JP7453215 B2 JP 7453215B2
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pixels
array
sensor
pixel
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JP2021536580A5 (https=
JP2021536580A (ja
Inventor
ヨハネス ウィルヘルムス マリア ヤコブス
ロルフ カール オットー ベーリンフ
ブッケル ロヘル ステッドマン
ヘレオン フォフトメイエール
オンノ ヤン ウィムメールス
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/242—Stacked detectors, e.g. for depth information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/10—Semiconductor bodies
    • H10F77/12—Active materials

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Sustainable Development (AREA)
JP2021512677A 2018-09-10 2019-09-10 マルチピース単層放射線検出器 Active JP7453215B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP18193337.5A EP3620826A1 (en) 2018-09-10 2018-09-10 Multi-piece mono-layer radiation detector
EP18193337.5 2018-09-10
PCT/EP2019/074036 WO2020053174A1 (en) 2018-09-10 2019-09-10 Multi-piece mono-layer radiation detector

Publications (3)

Publication Number Publication Date
JP2021536580A JP2021536580A (ja) 2021-12-27
JP2021536580A5 JP2021536580A5 (https=) 2023-12-08
JP7453215B2 true JP7453215B2 (ja) 2024-03-19

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Family Applications (1)

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JP2021512677A Active JP7453215B2 (ja) 2018-09-10 2019-09-10 マルチピース単層放射線検出器

Country Status (5)

Country Link
US (1) US11506802B2 (https=)
EP (2) EP3620826A1 (https=)
JP (1) JP7453215B2 (https=)
CN (1) CN112673285B (https=)
WO (1) WO2020053174A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3660542A1 (en) * 2018-11-29 2020-06-03 Koninklijke Philips N.V. Hybrid x-ray and optical detector
FR3119708B1 (fr) * 2021-02-11 2023-08-25 Trixell Détecteur numérique à étages de conversion superposés
US12429612B2 (en) * 2021-09-13 2025-09-30 Redlen Technologies, Inc. Radiation sensor dies having visual identifiers and methods of fabricating thereof
CN115808707A (zh) * 2021-09-14 2023-03-17 睿生光电股份有限公司 感测装置
EP4533047A1 (en) * 2022-05-27 2025-04-09 National University of Singapore 3d light field detector, sensor and methods of fabrication thereof
EP4394456A3 (en) * 2022-12-29 2024-07-10 FEI Company Improved detectors for microscopy
WO2025155249A1 (en) * 2024-01-17 2025-07-24 National University Of Singapore Multi wavelength imaging sensor
WO2026053942A1 (ja) * 2024-09-05 2026-03-12 キヤノン株式会社 放射線撮像装置、及び放射線撮像システム

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100135463A1 (en) 2008-12-02 2010-06-03 Samsung Electronics Co., Ltd. X-ray image obtaining/imaging apparatus and method
US20100282972A1 (en) 2007-11-06 2010-11-11 Koninklijke Philips Electronics N.V. Indirect radiation detector
JP2012118060A (ja) 2010-11-30 2012-06-21 General Electric Co <Ge> タイリング可能なセンサアレイ
US20160178762A1 (en) 2014-12-18 2016-06-23 Kabushiki Kaisha Toshiba Non-uniform photon-counting detector array on a fourth-generation ring to achieve uniform noise and spectral performance in z-direction
JP2017161456A (ja) 2016-03-11 2017-09-14 株式会社東芝 光検出器
JP2018013338A (ja) 2016-07-19 2018-01-25 株式会社日立製作所 放射線検出器

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06273796A (ja) * 1993-01-21 1994-09-30 Victor Co Of Japan Ltd 空間光変調素子
CA2241779C (en) * 1998-06-26 2010-02-09 Ftni Inc. Indirect x-ray image detector for radiology
US6243441B1 (en) * 1999-07-13 2001-06-05 Edge Medical Devices Active matrix detector for X-ray imaging
DE10054678A1 (de) 2000-11-03 2002-05-16 Siemens Ag Verfahren zur Herstellung eines ein- oder mehrdimensionalen Detektorarrays
US20050082491A1 (en) * 2003-10-15 2005-04-21 Seppi Edward J. Multi-energy radiation detector
EP1877759A2 (en) 2005-04-29 2008-01-16 Philips Intellectual Property & Standards GmbH Energy-resolved photon counting for ct
US7606346B2 (en) * 2007-01-04 2009-10-20 General Electric Company CT detector module construction
DE102007058447A1 (de) * 2007-12-05 2009-06-10 Siemens Ag Röntgendetektor, Röntgengerät und Verfahren zur Erfassung einer Röntgenstrahlung
CN102066976A (zh) * 2008-06-16 2011-05-18 皇家飞利浦电子股份有限公司 辐射探测器和制造辐射探测器的方法
GB201004121D0 (en) * 2010-03-12 2010-04-28 Durham Scient Crystals Ltd Detector device, inspection apparatus and method
JP5749675B2 (ja) * 2012-03-21 2015-07-15 株式会社東芝 放射線検出装置及びｃｔ装置
DE102012219041B4 (de) * 2012-10-18 2018-09-06 Siemens Healthcare Gmbh Bilddetektor und Verfahren zum Betrieb eines Bilddetektors
CN103886809B (zh) * 2014-02-21 2016-03-23 北京京东方光电科技有限公司 显示方法和显示装置
CN104375302B (zh) * 2014-10-27 2020-09-08 上海中航光电子有限公司 一种像素结构、显示面板及其像素补偿方法
WO2016074945A1 (en) 2014-11-13 2016-05-19 Koninklijke Philips N.V. Pixelated scintillator with optimized efficiency
US9989654B2 (en) * 2016-01-13 2018-06-05 General Electric Company Systems and methods for reducing polarization in imaging detectors
CN105514029B (zh) * 2016-01-20 2018-06-15 京东方科技集团股份有限公司 X射线平板探测器的像素结构及其制备方法、摄像系统
US11147522B2 (en) * 2018-08-31 2021-10-19 Canon Medical Systems Corporation Photon counting detector and x-ray computed tomography apparatus

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100282972A1 (en) 2007-11-06 2010-11-11 Koninklijke Philips Electronics N.V. Indirect radiation detector
US20100135463A1 (en) 2008-12-02 2010-06-03 Samsung Electronics Co., Ltd. X-ray image obtaining/imaging apparatus and method
JP2010133957A (ja) 2008-12-02 2010-06-17 Samsung Electronics Co Ltd Ｘ線映像取得・イメージング装置および方法
JP2012118060A (ja) 2010-11-30 2012-06-21 General Electric Co <Ge> タイリング可能なセンサアレイ
US20160178762A1 (en) 2014-12-18 2016-06-23 Kabushiki Kaisha Toshiba Non-uniform photon-counting detector array on a fourth-generation ring to achieve uniform noise and spectral performance in z-direction
JP2016118533A (ja) 2014-12-18 2016-06-30 株式会社東芝 光子計数検出器及びｘ線コンピュータ断層撮影装置
JP2017161456A (ja) 2016-03-11 2017-09-14 株式会社東芝 光検出器
JP2018013338A (ja) 2016-07-19 2018-01-25 株式会社日立製作所 放射線検出器

Also Published As

Publication number Publication date
US20210356608A1 (en) 2021-11-18
CN112673285B (zh) 2024-10-18
EP3850400A1 (en) 2021-07-21
EP3620826A1 (en) 2020-03-11
JP2021536580A (ja) 2021-12-27
US11506802B2 (en) 2022-11-22
CN112673285A (zh) 2021-04-16
WO2020053174A1 (en) 2020-03-19

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