CN112673285B - 多片式单层辐射探测器 - Google Patents

多片式单层辐射探测器 Download PDF

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Publication number
CN112673285B
CN112673285B CN201980058844.2A CN201980058844A CN112673285B CN 112673285 B CN112673285 B CN 112673285B CN 201980058844 A CN201980058844 A CN 201980058844A CN 112673285 B CN112673285 B CN 112673285B
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pixels
sub
array
sensor
radiation
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CN201980058844.2A
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Chinese (zh)
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CN112673285A (zh
Inventor
J·W·M·雅各布斯
R·K·O·贝林
R·斯特德曼布克
G·福格特米尔
O·J·维默斯
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • G01T1/20181Stacked detectors, e.g. for measuring energy and positional information
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • G01T1/20184Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/242Stacked detectors, e.g. for depth information
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2921Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2985In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Sustainable Development (AREA)
CN201980058844.2A 2018-09-10 2019-09-10 多片式单层辐射探测器 Active CN112673285B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP18193337.5A EP3620826A1 (en) 2018-09-10 2018-09-10 Multi-piece mono-layer radiation detector
EP18193337.5 2018-09-10
PCT/EP2019/074036 WO2020053174A1 (en) 2018-09-10 2019-09-10 Multi-piece mono-layer radiation detector

Publications (2)

Publication Number Publication Date
CN112673285A CN112673285A (zh) 2021-04-16
CN112673285B true CN112673285B (zh) 2024-10-18

Family

ID=63556160

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201980058844.2A Active CN112673285B (zh) 2018-09-10 2019-09-10 多片式单层辐射探测器

Country Status (5)

Country Link
US (1) US11506802B2 (https=)
EP (2) EP3620826A1 (https=)
JP (1) JP7453215B2 (https=)
CN (1) CN112673285B (https=)
WO (1) WO2020053174A1 (https=)

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EP3660542A1 (en) * 2018-11-29 2020-06-03 Koninklijke Philips N.V. Hybrid x-ray and optical detector
FR3119708B1 (fr) * 2021-02-11 2023-08-25 Trixell Détecteur numérique à étages de conversion superposés
US12429612B2 (en) * 2021-09-13 2025-09-30 Redlen Technologies, Inc. Radiation sensor dies having visual identifiers and methods of fabricating thereof
CN115808707A (zh) * 2021-09-14 2023-03-17 睿生光电股份有限公司 感测装置
EP4533047A1 (en) * 2022-05-27 2025-04-09 National University of Singapore 3d light field detector, sensor and methods of fabrication thereof
EP4394456A3 (en) * 2022-12-29 2024-07-10 FEI Company Improved detectors for microscopy
WO2025155249A1 (en) * 2024-01-17 2025-07-24 National University Of Singapore Multi wavelength imaging sensor
WO2026053942A1 (ja) * 2024-09-05 2026-03-12 キヤノン株式会社 放射線撮像装置、及び放射線撮像システム

Citations (1)

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US6243441B1 (en) * 1999-07-13 2001-06-05 Edge Medical Devices Active matrix detector for X-ray imaging
DE10054678A1 (de) 2000-11-03 2002-05-16 Siemens Ag Verfahren zur Herstellung eines ein- oder mehrdimensionalen Detektorarrays
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EP1877759A2 (en) 2005-04-29 2008-01-16 Philips Intellectual Property & Standards GmbH Energy-resolved photon counting for ct
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CN102066976A (zh) * 2008-06-16 2011-05-18 皇家飞利浦电子股份有限公司 辐射探测器和制造辐射探测器的方法
KR101504491B1 (ko) * 2008-12-02 2015-03-23 삼성전자주식회사 엑스선 영상 획득 장치 및 엑스선 영상 획득 방법, 센서 및이미징 장치
GB201004121D0 (en) * 2010-03-12 2010-04-28 Durham Scient Crystals Ltd Detector device, inspection apparatus and method
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JP5749675B2 (ja) * 2012-03-21 2015-07-15 株式会社東芝 放射線検出装置及びct装置
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Also Published As

Publication number Publication date
US20210356608A1 (en) 2021-11-18
EP3850400A1 (en) 2021-07-21
EP3620826A1 (en) 2020-03-11
JP7453215B2 (ja) 2024-03-19
JP2021536580A (ja) 2021-12-27
US11506802B2 (en) 2022-11-22
CN112673285A (zh) 2021-04-16
WO2020053174A1 (en) 2020-03-19

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