JP7452643B2 - 自動試料注入装置 - Google Patents

自動試料注入装置 Download PDF

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Publication number
JP7452643B2
JP7452643B2 JP2022527488A JP2022527488A JP7452643B2 JP 7452643 B2 JP7452643 B2 JP 7452643B2 JP 2022527488 A JP2022527488 A JP 2022527488A JP 2022527488 A JP2022527488 A JP 2022527488A JP 7452643 B2 JP7452643 B2 JP 7452643B2
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Japan
Prior art keywords
solvent
sample injection
injection device
automatic sample
user
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JP2022527488A
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English (en)
Japanese (ja)
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JPWO2021240853A5 (https=
JPWO2021240853A1 (https=
Inventor
大貴 福島
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Shimadzu Corp
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Shimadzu Corp
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Publication of JPWO2021240853A1 publication Critical patent/JPWO2021240853A1/ja
Publication of JPWO2021240853A5 publication Critical patent/JPWO2021240853A5/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/04Preparation or injection of sample to be analysed
    • G01N30/24Automatic injection systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/0092Scheduling
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1095Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices for supplying the samples to flow-through analysers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/0092Scheduling
    • G01N2035/0094Scheduling optimisation; experiment design
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N2035/1027General features of the devices
    • G01N2035/1032Dilution or aliquotting

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Sampling And Sample Adjustment (AREA)
JP2022527488A 2020-05-25 2020-12-15 自動試料注入装置 Active JP7452643B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020090659 2020-05-25
JP2020090659 2020-05-25
PCT/JP2020/046721 WO2021240853A1 (ja) 2020-05-25 2020-12-15 自動試料注入装置

Publications (3)

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JPWO2021240853A1 JPWO2021240853A1 (https=) 2021-12-02
JPWO2021240853A5 JPWO2021240853A5 (https=) 2023-01-10
JP7452643B2 true JP7452643B2 (ja) 2024-03-19

Family

ID=78744172

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022527488A Active JP7452643B2 (ja) 2020-05-25 2020-12-15 自動試料注入装置

Country Status (4)

Country Link
US (1) US12313608B2 (https=)
JP (1) JP7452643B2 (https=)
CN (1) CN115516307B (https=)
WO (1) WO2021240853A1 (https=)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000097947A (ja) 1998-09-28 2000-04-07 Shimadzu Corp 自動合成装置
JP2008020242A (ja) 2006-07-11 2008-01-31 Shimadzu Corp オートサンプラ制御プログラム作成支援システム及び作成支援プログラム
WO2013099660A1 (ja) 2011-12-26 2013-07-04 株式会社日立ハイテクノロジーズ 自動分析装置及び試料分注プローブ洗浄方法
JP2018109520A (ja) 2016-12-28 2018-07-12 シスメックス株式会社 分析方法および分析装置
JP2020056725A (ja) 2018-10-03 2020-04-09 株式会社島津製作所 試料注入装置および試料注入システム

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0810797Y2 (ja) * 1990-07-25 1996-03-29 株式会社島津製作所 ソルベントフラッシュオートサンプラ
JPH06102262A (ja) * 1992-09-18 1994-04-15 Hitachi Ltd ガスクロマトグラフ用試料注入装置
KR100581019B1 (ko) * 2003-11-28 2006-05-17 주식회사 휴텍스 시료의 자동 전처리장치
JP2012042253A (ja) * 2010-08-16 2012-03-01 Shimadzu Corp クロマトグラフ用試料注入装置
JP2012177586A (ja) * 2011-02-25 2012-09-13 Shimadzu Corp シリンジチェック部材及びそれを用いたクロマトグラフ用試料注入装置
JP2015135240A (ja) 2014-01-16 2015-07-27 株式会社島津製作所 自動分析装置用制御装置
US10379087B2 (en) * 2016-08-29 2019-08-13 Shimadzu Corporation Sample injector for chromatography
US10823714B2 (en) 2016-12-29 2020-11-03 Thermo Finnigan Llc Simplified source control interface
CN113383237B (zh) * 2018-09-20 2025-02-07 沃特世科技爱尔兰有限公司 用于生成并执行分析方法的技术

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000097947A (ja) 1998-09-28 2000-04-07 Shimadzu Corp 自動合成装置
JP2008020242A (ja) 2006-07-11 2008-01-31 Shimadzu Corp オートサンプラ制御プログラム作成支援システム及び作成支援プログラム
WO2013099660A1 (ja) 2011-12-26 2013-07-04 株式会社日立ハイテクノロジーズ 自動分析装置及び試料分注プローブ洗浄方法
JP2018109520A (ja) 2016-12-28 2018-07-12 シスメックス株式会社 分析方法および分析装置
JP2020056725A (ja) 2018-10-03 2020-04-09 株式会社島津製作所 試料注入装置および試料注入システム

Also Published As

Publication number Publication date
US20230280315A1 (en) 2023-09-07
CN115516307A (zh) 2022-12-23
US12313608B2 (en) 2025-05-27
JPWO2021240853A1 (https=) 2021-12-02
CN115516307B (zh) 2024-09-13
WO2021240853A1 (ja) 2021-12-02

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