JP7451645B2 - 固体撮像素子 - Google Patents
固体撮像素子 Download PDFInfo
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- JP7451645B2 JP7451645B2 JP2022164176A JP2022164176A JP7451645B2 JP 7451645 B2 JP7451645 B2 JP 7451645B2 JP 2022164176 A JP2022164176 A JP 2022164176A JP 2022164176 A JP2022164176 A JP 2022164176A JP 7451645 B2 JP7451645 B2 JP 7451645B2
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- 238000003384 imaging method Methods 0.000 claims description 126
- 238000006243 chemical reaction Methods 0.000 claims description 63
- 238000000926 separation method Methods 0.000 claims description 51
- 239000003086 colorant Substances 0.000 claims description 5
- 239000012780 transparent material Substances 0.000 claims 1
- 238000000034 method Methods 0.000 description 11
- 239000004065 semiconductor Substances 0.000 description 10
- 239000000758 substrate Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 8
- 230000000903 blocking effect Effects 0.000 description 7
- 239000003989 dielectric material Substances 0.000 description 5
- 238000002955 isolation Methods 0.000 description 5
- 239000010949 copper Substances 0.000 description 4
- 230000009977 dual effect Effects 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229920002120 photoresistant polymer Polymers 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 3
- 238000003491 array Methods 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 238000000465 moulding Methods 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- 229910000679 solder Inorganic materials 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000004049 embossing Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14621—Colour filter arrangements
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14645—Colour imagers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14627—Microlenses
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14629—Reflectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1463—Pixel isolation structures
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Control Of Motors That Do Not Use Commutators (AREA)
- Color Television Image Signal Generators (AREA)
Description
例えば、図14は、図13の線G-G’に沿った固体撮像素子112の一部の断面図であることができる。固体撮像素子112のいくつかの構成要素は、簡潔にするために図13および図14では省略されていることに留意されたい。
10 半導体基板
11、11B、11R 光電変換素子
13 分離構造
13S1 第1の分離セグメント
13S2 第2の分離セグメント
20 カラーフィルタ層
20SB 青色カラーフィルタセグメント
20SG 緑色カラーフィルタセグメント
20SR 赤色カラーフィルタセグメント
30 グリッド構造
32 遮光層
40、40’、40” 光分割構造
41 第1の部分
42 第2の部分
44 補助光分割構造
45 インナーピラー
50 集光構造
A-A’、B-B’、C-C’、D-D’、E-E’、F-F’、G-G’、H-H’、I-I’、J-J’、K-K’、L-L’ 線
C13S1 第1の分離セグメントの中心軸
C13S2 第2の分離セグメントの中心軸
C30 グリッド構造の中心軸
C40、C40’、C40” 光分割構造の中心軸
CS1、CS2、CS3、CS3’、CS4、CS4’、CS5、CS6、CS7、CS8、CS8’、CS9 断面図
d1、d2、d2’ 距離
L 入射光
L1、L2 光
H20 カラーフィルタ層の高さ
H30 グリッド構造の高さ
H32 遮光層の高さ
H40 光分割構造の高さ
H44 補助光分割構造の高さ
H45 インナーピラーの高さ
S1、S2、S3 シフト
W40 光分割構造の幅
W44 補助光分割構造の幅
W45 インナーピラーの幅
θ 夾角
Claims (9)
- 複数の光電変換素子と、
前記光電変換素子の上方に配置され、第1のカラーフィルタセグメントおよび前記第1のカラーフィルタセグメントに隣接した第2のカラーフィルタセグメントを有し、前記第1のカラーフィルタセグメントおよび前記第2のカラーフィルタセグメントは、異なる色に対応するカラーフィルタ層と、
前記第1のカラーフィルタセグメントまたは前記第2のカラーフィルタセグメントに配置された光分割構造と、および
前記第1のカラーフィルタセグメントと前記第2のカラーフィルタセグメントとの間に配置され、前記光分割構造がグリッド構造から分離されたグリッド構造と、を含み、
前記複数の光電変換素子は、複数の第1の光電変換素子と複数の第2の光電変換素子に分割され、前記第1のカラーフィルタセグメントは、前記第1の光電変換素子に対応し、前記第2のカラーフィルタセグメントは、前記第2の光電変換素子に対応し、
前記光電変換素子同士の間に配置され、複数の第1の分離セグメントおよび複数の第2の分離セグメントを有する分離構造をさらに含み、
前記第1の分離セグメントは、前記第1の光電変換素子と前記第2の光電変換素子との間に配置され、前記第2の分離セグメントは、前記第1の光電変換素子同士の間、および前記第2の光電変換素子同士の間に配置され、前記グリッド構造は前記第1の分離セグメントに対応し、前記光分割構造は少なくとも1つの前記第2の分離セグメントに対応し、
前記グリッド構造は、前記第1の分離セグメントに対して第1のシフトを有し、前記光分割構造は、前記複数の第2の分離セグメントのうちの対応する1つに対して第2のシフトを有し、前記第1のシフトは前記第2のシフトと異なる固体撮像素子。 - 前記固体撮像素子の上面図からでは、前記光分割構造は、前記複数の第2の分離セグメントのうちの対応する1つと重なっている請求項1に記載の固体撮像素子。
- 前記固体撮像素子の上面図からでは、前記光分割構造の外形が十字形であるとき、前記光分割構造は、0~45度で前記複数の第2の分離セグメントのうちの対応する1つからオフセットされる請求項1に記載の固体撮像素子。
- 前記光分割構造の高さは、前記グリッド構造の高さ以下であり、前記固体撮像素子の上面図からでは、前記光分割構造の外形は、円形、正方形、長方形、または、十字形である請求項1に記載の固体撮像素子。
- 前記光分割構造の幅は、50nm~200nmの間であり、前記カラーフィルタ層の高さに対する前記光分割構造の高さの比は、0.3~0.9の間である請求項1に記載の固体撮像素子。
- 前記光分割構造の屈折率は、1~1.45の間であり、前記光分割構造は、2つの光電変換素子または4つの光電変換素子に対応する請求項1に記載の固体撮像素子。
- 複数の光電変換素子と、
前記光電変換素子の上方に配置され、第1のカラーフィルタセグメントおよび前記第1のカラーフィルタセグメントに隣接した第2のカラーフィルタセグメントを有し、前記第1のカラーフィルタセグメントおよび前記第2のカラーフィルタセグメントは、異なる色に対応するカラーフィルタ層と、
前記第1のカラーフィルタセグメントまたは前記第2のカラーフィルタセグメントに配置された光分割構造と、および
前記第1のカラーフィルタセグメントと前記第2のカラーフィルタセグメントとの間に配置され、前記光分割構造がグリッド構造から分離されたグリッド構造と、を含み、
前記光分割構造は、前記第1のカラーフィルタセグメントまたは前記第2のカラーフィルタセグメントの中心に配置された第1の部分、および前記第1のカラーフィルタセグメントまたは前記第2のカラーフィルタセグメントの少なくとも1つの角の近くに配置された第2の部分を有する固体撮像素子。 - 前記固体撮像素子は、前記光分割構造の底部に配置され、非透過性材料を含むインナーピラーをさらに含み、
前記インナーピラーの幅及び高さは、それぞれ前記光分割構造の幅及び高さより小さく、
前記インナーピラーの幅は50nm~100nmの間であり、前記インナーピラーの高さは150nm未満である請求項1に記載の固体撮像素子。 - 前記光分割構造の底部に配置された補助光分割構造をさらに含み、前記補助光分割構造は、前記グリッド構造の下部にさらに配置され、前記補助光分割構造は、前記光分割構造と異なる少なくとも1つの材料を含み、前記補助光分割構造の屈折率は、1~1.65の間であり、前記補助光分割構造の幅は、前記光分割構造の幅以上であり、前記補助光分割構造の高さは、前記カラーフィルタ層の高さ、前記グリッド構造の高さ、及び、光分割構造の高さよりも低く、前記補助光分割構造の高さは、50nm~350nmの間である請求項1に記載の固体撮像素子。
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US20190148430A1 (en) | 2017-11-15 | 2019-05-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Color filter uniformity for image sensor devices |
US20190165009A1 (en) | 2017-11-27 | 2019-05-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Multiple deep trench isolation (mdti) structure for cmos image sensor |
WO2020013130A1 (ja) | 2018-07-10 | 2020-01-16 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像装置及び電子装置 |
US20200235148A1 (en) | 2019-01-22 | 2020-07-23 | Samsung Electronics Co., Ltd. | Image sensor |
US20200403025A1 (en) | 2019-06-21 | 2020-12-24 | Samsung Electronics Co., Ltd. | Image sensor |
US20210118929A1 (en) | 2019-10-17 | 2021-04-22 | SK Hynix Inc. | Image sensor |
JP2021145121A (ja) | 2020-03-10 | 2021-09-24 | 采▲ぎょく▼科技股▲ふん▼有限公司VisEra Technologies Company Limited | 固体撮像素子 |
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US20230343808A1 (en) | 2023-10-26 |
KR102711069B1 (ko) | 2024-09-27 |
TW202343769A (zh) | 2023-11-01 |
KR20230150175A (ko) | 2023-10-30 |
JP2023160709A (ja) | 2023-11-02 |
TWI824620B (zh) | 2023-12-01 |
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