JP7441852B2 - 半導体スイッチの故障を確認する方法 - Google Patents
半導体スイッチの故障を確認する方法 Download PDFInfo
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- JP7441852B2 JP7441852B2 JP2021555832A JP2021555832A JP7441852B2 JP 7441852 B2 JP7441852 B2 JP 7441852B2 JP 2021555832 A JP2021555832 A JP 2021555832A JP 2021555832 A JP2021555832 A JP 2021555832A JP 7441852 B2 JP7441852 B2 JP 7441852B2
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- semiconductor switch
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- 239000004065 semiconductor Substances 0.000 title claims description 58
- 238000000034 method Methods 0.000 claims description 15
- 238000005259 measurement Methods 0.000 claims description 10
- 239000003990 capacitor Substances 0.000 claims description 9
- 238000011156 evaluation Methods 0.000 claims description 9
- 238000003745 diagnosis Methods 0.000 description 4
- 230000007613 environmental effect Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000003750 conditioning effect Effects 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000002405 diagnostic procedure Methods 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/18—Modifications for indicating state of switch
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/2617—Circuits therefor for testing bipolar transistors for measuring switching properties thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
- G01R31/275—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements for testing individual semiconductor components within integrated circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0072—Low side switches, i.e. the lower potential [DC] or neutral wire [AC] being directly connected to the switch and not via the load
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Electronic Switches (AREA)
Description
Claims (4)
- 半導体スイッチの故障を確認する方法であって、
前記半導体スイッチ(S3)が可変デューティ・サイクルを有するPWM信号で駆動され、
(a)前記半導体スイッチ(S3)が100%又は0%のデューティ・サイクルで駆動されるとき、前記半導体スイッチ(S3)を流れる電流の電流測定により前記半導体スイッチ(S3)の故障が判定され、
(b)前記半導体スイッチ(S3)が0%より大きく100%より小さいデューティ・サイクルで駆動されるとき、前記半導体スイッチ(S3)で生成された電圧パルスが評価のためにカウントされ、前記電圧パルスの評価の結果、前記電圧パルスが生成されていない場合、前記半導体スイッチ(S3)の短絡又は開回路が検出されることを特徴とする、方法。 - 前記0%より大きく100%より小さいデューティ・サイクルが前記100%又は0%のデューティ・サイクルに変化したとき、前記(b)での前記電圧パルスの評価は中止され、前記半導体スイッチ(S3)の故障は、前記(a)での前記電流測定により判定される、請求項1に記載の方法。
- コンデンサ(C4)及びA/D変換器を備え、
前記半導体スイッチ(S3)で生成された電圧パルスは、前記コンデンサ(C4)を介して前記半導体スイッチ(S3)から分岐され、前記A/D変換器に印加され、前記A/D変換器は、評価のためにコントローラのカウンタ入力にデジタル信号を印加する、請求項1又は2に記載の方法を実施するためのデバイス。 - ダイオード(D1)を更に備え、
前記コンデンサ(C4)によって分岐された電圧パルスが、前記ダイオード(D1)によって、前記A/D変換器に印加される正のパルスに変換される、
請求項3に記載のデバイス。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102019106787.1A DE102019106787B3 (de) | 2019-03-18 | 2019-03-18 | Verfahren zur Überprüfung eines Halbleiterschalters auf einen Fehler |
DE102019106787.1 | 2019-03-18 | ||
PCT/EP2020/055142 WO2020187543A1 (de) | 2019-03-18 | 2020-02-27 | Verfahren zur überprüfung eines halbleiterschalters auf einen fehler |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2022525623A JP2022525623A (ja) | 2022-05-18 |
JPWO2020187543A5 JPWO2020187543A5 (ja) | 2023-12-13 |
JP7441852B2 true JP7441852B2 (ja) | 2024-03-01 |
Family
ID=69714049
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2021555832A Active JP7441852B2 (ja) | 2019-03-18 | 2020-02-27 | 半導体スイッチの故障を確認する方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US11881848B2 (ja) |
EP (1) | EP3942696B1 (ja) |
JP (1) | JP7441852B2 (ja) |
KR (1) | KR102649874B1 (ja) |
CN (1) | CN113597741A (ja) |
DE (1) | DE102019106787B3 (ja) |
WO (1) | WO2020187543A1 (ja) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001268984A (ja) | 2000-03-22 | 2001-09-28 | Advanced Technology Inst Of Commuter Helicopter Ltd | モータ故障検出方法 |
JP2004306858A (ja) | 2003-04-09 | 2004-11-04 | Toyota Motor Corp | 電動パワーステアリング装置 |
JP2008164519A (ja) | 2006-12-28 | 2008-07-17 | Toyota Motor Corp | スイッチングトランジスタの故障検出方法、及び、故障検出回路 |
JP2008199851A (ja) | 2007-02-15 | 2008-08-28 | Denso Corp | Dcモータ接地異常判定装置 |
JP2009159671A (ja) | 2007-12-25 | 2009-07-16 | Mitsubishi Electric Corp | 電力用素子の故障検出装置 |
JP2015119560A (ja) | 2013-12-18 | 2015-06-25 | 株式会社ミツバ | モータ制御回路及びモータ制御回路のショート検出方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3805816B2 (ja) * | 1994-11-30 | 2006-08-09 | ヤマハ発動機株式会社 | スイッチ手段の故障検出装置 |
JP4186934B2 (ja) * | 2005-02-10 | 2008-11-26 | 株式会社デンソー | 電磁弁駆動装置 |
US7705673B2 (en) * | 2008-01-07 | 2010-04-27 | Texas Instruments Incorporated | Over-current sensing during narrow gate drive operation of class D output stages |
JP5203056B2 (ja) * | 2008-06-12 | 2013-06-05 | 古河電気工業株式会社 | 異常電流検出装置および異常電流検出方法 |
DE102010042292A1 (de) | 2010-10-11 | 2012-04-12 | BSH Bosch und Siemens Hausgeräte GmbH | Verfahren zur Funktionsprüfung eines elektrischen Halbleiterschalters, Steuereinheit zur Durchführung des Verfahrens und Hausgerät mit einer solchen Steuereinheit |
US9673704B2 (en) * | 2012-10-15 | 2017-06-06 | Nxp Usa, Inc. | Inductive load control circuit, a braking system for a vehicle and a method of measuring current in an inductive load control circuit |
FR3017958B1 (fr) * | 2014-02-21 | 2017-11-24 | Continental Automotive France | Detection de circuit ouvert dans une structure de commutation |
DE102014214156A1 (de) * | 2014-07-21 | 2016-01-21 | Continental Teves Ag & Co. Ohg | Verfahren und Schaltungsanordnung zur Überprüfung einer Funktionsfähigkeit eines Halbleiterschalters eines Abschaltpfades |
DE102014226165A1 (de) * | 2014-12-17 | 2016-06-23 | Bayerische Motoren Werke Aktiengesellschaft | Adaptiver Treiber für einen Transistor |
US10291225B2 (en) * | 2016-10-07 | 2019-05-14 | Texas Instruments Incorporated | Gate driver with VGTH and VCESAT measurement capability for the state of health monitor |
DE102016221648A1 (de) * | 2016-11-04 | 2018-05-09 | Continental Teves Ag & Co. Ohg | Verfahren zum Überprüfen einer Steuerschaltung und Anordnung |
KR101897640B1 (ko) | 2016-12-12 | 2018-09-12 | 현대오트론 주식회사 | 레졸버 고장 진단 장치 및 방법 |
US10895601B2 (en) * | 2019-05-10 | 2021-01-19 | Infineon Technologies Ag | System and method of monitoring a switching transistor |
-
2019
- 2019-03-18 DE DE102019106787.1A patent/DE102019106787B3/de active Active
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2020
- 2020-02-27 JP JP2021555832A patent/JP7441852B2/ja active Active
- 2020-02-27 KR KR1020217033246A patent/KR102649874B1/ko active IP Right Grant
- 2020-02-27 EP EP20707423.8A patent/EP3942696B1/de active Active
- 2020-02-27 US US17/435,583 patent/US11881848B2/en active Active
- 2020-02-27 WO PCT/EP2020/055142 patent/WO2020187543A1/de unknown
- 2020-02-27 CN CN202080022106.5A patent/CN113597741A/zh active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001268984A (ja) | 2000-03-22 | 2001-09-28 | Advanced Technology Inst Of Commuter Helicopter Ltd | モータ故障検出方法 |
JP2004306858A (ja) | 2003-04-09 | 2004-11-04 | Toyota Motor Corp | 電動パワーステアリング装置 |
JP2008164519A (ja) | 2006-12-28 | 2008-07-17 | Toyota Motor Corp | スイッチングトランジスタの故障検出方法、及び、故障検出回路 |
JP2008199851A (ja) | 2007-02-15 | 2008-08-28 | Denso Corp | Dcモータ接地異常判定装置 |
JP2009159671A (ja) | 2007-12-25 | 2009-07-16 | Mitsubishi Electric Corp | 電力用素子の故障検出装置 |
JP2015119560A (ja) | 2013-12-18 | 2015-06-25 | 株式会社ミツバ | モータ制御回路及びモータ制御回路のショート検出方法 |
Also Published As
Publication number | Publication date |
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US20220158633A1 (en) | 2022-05-19 |
CN113597741A (zh) | 2021-11-02 |
EP3942696B1 (de) | 2024-04-17 |
US11881848B2 (en) | 2024-01-23 |
EP3942696A1 (de) | 2022-01-26 |
WO2020187543A1 (de) | 2020-09-24 |
JP2022525623A (ja) | 2022-05-18 |
KR20210134788A (ko) | 2021-11-10 |
KR102649874B1 (ko) | 2024-03-20 |
DE102019106787B3 (de) | 2020-08-13 |
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