JP7409983B2 - 重合体、感光性樹脂組成物、パターン形成方法、硬化被膜形成方法、層間絶縁膜、表面保護膜、及び電子部品 - Google Patents
重合体、感光性樹脂組成物、パターン形成方法、硬化被膜形成方法、層間絶縁膜、表面保護膜、及び電子部品 Download PDFInfo
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- JP7409983B2 JP7409983B2 JP2020116770A JP2020116770A JP7409983B2 JP 7409983 B2 JP7409983 B2 JP 7409983B2 JP 2020116770 A JP2020116770 A JP 2020116770A JP 2020116770 A JP2020116770 A JP 2020116770A JP 7409983 B2 JP7409983 B2 JP 7409983B2
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- 239000011342 resin composition Substances 0.000 title claims description 132
- 229920000642 polymer Polymers 0.000 title claims description 102
- 238000000034 method Methods 0.000 title claims description 49
- 230000001681 protective effect Effects 0.000 title claims description 21
- 239000011229 interlayer Substances 0.000 title claims description 13
- -1 phenol compound Chemical class 0.000 claims description 124
- 150000001875 compounds Chemical class 0.000 claims description 86
- 125000000962 organic group Chemical group 0.000 claims description 79
- 230000015572 biosynthetic process Effects 0.000 claims description 61
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical group O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 claims description 50
- 125000004432 carbon atom Chemical group C* 0.000 claims description 46
- 239000002253 acid Substances 0.000 claims description 45
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 41
- 239000002904 solvent Substances 0.000 claims description 40
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 39
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 claims description 39
- 125000003118 aryl group Chemical group 0.000 claims description 33
- 239000000758 substrate Substances 0.000 claims description 26
- 239000007864 aqueous solution Substances 0.000 claims description 24
- 239000003431 cross linking reagent Substances 0.000 claims description 24
- 239000000463 material Substances 0.000 claims description 24
- 238000010438 heat treatment Methods 0.000 claims description 22
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 claims description 21
- 125000006165 cyclic alkyl group Chemical group 0.000 claims description 16
- 125000005647 linker group Chemical group 0.000 claims description 16
- 238000011417 postcuring Methods 0.000 claims description 16
- 125000001424 substituent group Chemical group 0.000 claims description 15
- 125000000217 alkyl group Chemical group 0.000 claims description 13
- 150000002989 phenols Chemical class 0.000 claims description 12
- 238000004090 dissolution Methods 0.000 claims description 11
- 238000011161 development Methods 0.000 claims description 10
- 125000004433 nitrogen atom Chemical group N* 0.000 claims description 10
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 claims description 9
- 125000002947 alkylene group Chemical group 0.000 claims description 8
- 229910052757 nitrogen Inorganic materials 0.000 claims description 8
- 239000003504 photosensitizing agent Substances 0.000 claims description 8
- 125000001153 fluoro group Chemical group F* 0.000 claims description 7
- 238000010894 electron beam technology Methods 0.000 claims description 5
- WTQZSMDDRMKJRI-UHFFFAOYSA-N 4-diazoniophenolate Chemical group [O-]C1=CC=C([N+]#N)C=C1 WTQZSMDDRMKJRI-UHFFFAOYSA-N 0.000 claims description 4
- 229910052701 rubidium Inorganic materials 0.000 claims description 3
- 239000010408 film Substances 0.000 description 99
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 69
- 238000003786 synthesis reaction Methods 0.000 description 59
- 238000006243 chemical reaction Methods 0.000 description 50
- 150000004985 diamines Chemical class 0.000 description 48
- 229920005989 resin Polymers 0.000 description 32
- 239000011347 resin Substances 0.000 description 32
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 29
- 239000000243 solution Substances 0.000 description 29
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 27
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 26
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 26
- 239000000203 mixture Substances 0.000 description 23
- 125000006158 tetracarboxylic acid group Chemical group 0.000 description 22
- 239000002585 base Substances 0.000 description 21
- 239000003795 chemical substances by application Substances 0.000 description 21
- 229920001721 polyimide Polymers 0.000 description 21
- 230000007261 regionalization Effects 0.000 description 21
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical group OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 20
- UHOVQNZJYSORNB-UHFFFAOYSA-N monobenzene Natural products C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 20
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 18
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 18
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 18
- 125000001931 aliphatic group Chemical group 0.000 description 18
- 238000004132 cross linking Methods 0.000 description 18
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 16
- 230000000052 comparative effect Effects 0.000 description 16
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 15
- 239000004642 Polyimide Substances 0.000 description 15
- 239000003054 catalyst Substances 0.000 description 15
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 13
- 238000003756 stirring Methods 0.000 description 13
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 13
- NGNBDVOYPDDBFK-UHFFFAOYSA-N 2-[2,4-di(pentan-2-yl)phenoxy]acetyl chloride Chemical compound CCCC(C)C1=CC=C(OCC(Cl)=O)C(C(C)CCC)=C1 NGNBDVOYPDDBFK-UHFFFAOYSA-N 0.000 description 12
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 12
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 11
- 125000002723 alicyclic group Chemical group 0.000 description 11
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 10
- 239000004962 Polyamide-imide Substances 0.000 description 10
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 10
- 230000018044 dehydration Effects 0.000 description 10
- 238000006297 dehydration reaction Methods 0.000 description 10
- 125000005843 halogen group Chemical group 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 10
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 10
- 229920002312 polyamide-imide Polymers 0.000 description 10
- QWKKYJLAUWFPDB-UHFFFAOYSA-N 4-nitrobenzenesulfonamide Chemical compound NS(=O)(=O)C1=CC=C([N+]([O-])=O)C=C1 QWKKYJLAUWFPDB-UHFFFAOYSA-N 0.000 description 9
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 9
- XTHFKEDIFFGKHM-UHFFFAOYSA-N Dimethoxyethane Chemical compound COCCOC XTHFKEDIFFGKHM-UHFFFAOYSA-N 0.000 description 9
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 9
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 9
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 9
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 9
- 230000018109 developmental process Effects 0.000 description 9
- 238000002156 mixing Methods 0.000 description 9
- 239000003960 organic solvent Substances 0.000 description 9
- 239000002243 precursor Substances 0.000 description 9
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 9
- QROUUECTKRZFHF-UHFFFAOYSA-N 4,4,5,5,5-pentafluoropentan-1-ol Chemical compound OCCCC(F)(F)C(F)(F)F QROUUECTKRZFHF-UHFFFAOYSA-N 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 8
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 8
- XSQUKJJJFZCRTK-UHFFFAOYSA-N Urea Chemical compound NC(N)=O XSQUKJJJFZCRTK-UHFFFAOYSA-N 0.000 description 8
- 239000003513 alkali Substances 0.000 description 8
- 150000001408 amides Chemical class 0.000 description 8
- 150000007514 bases Chemical class 0.000 description 8
- 238000001816 cooling Methods 0.000 description 8
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 8
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 8
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 8
- 239000002244 precipitate Substances 0.000 description 8
- 230000002829 reductive effect Effects 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 8
- 239000000126 substance Substances 0.000 description 8
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 8
- 239000008096 xylene Substances 0.000 description 8
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 7
- 150000001412 amines Chemical class 0.000 description 7
- 125000003277 amino group Chemical group 0.000 description 7
- 238000000576 coating method Methods 0.000 description 7
- 125000004122 cyclic group Chemical group 0.000 description 7
- 125000000472 sulfonyl group Chemical group *S(*)(=O)=O 0.000 description 7
- 239000004094 surface-active agent Substances 0.000 description 7
- VHYFNPMBLIVWCW-UHFFFAOYSA-N 4-Dimethylaminopyridine Chemical compound CN(C)C1=CC=NC=C1 VHYFNPMBLIVWCW-UHFFFAOYSA-N 0.000 description 6
- PLIKAWJENQZMHA-UHFFFAOYSA-N 4-aminophenol Chemical compound NC1=CC=C(O)C=C1 PLIKAWJENQZMHA-UHFFFAOYSA-N 0.000 description 6
- SKDHHIUENRGTHK-UHFFFAOYSA-N 4-nitrobenzoyl chloride Chemical compound [O-][N+](=O)C1=CC=C(C(Cl)=O)C=C1 SKDHHIUENRGTHK-UHFFFAOYSA-N 0.000 description 6
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 6
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 6
- 125000003545 alkoxy group Chemical group 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 6
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 6
- 150000003949 imides Chemical group 0.000 description 6
- 238000009413 insulation Methods 0.000 description 6
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 6
- FYSNRJHAOHDILO-UHFFFAOYSA-N thionyl chloride Chemical compound ClS(Cl)=O FYSNRJHAOHDILO-UHFFFAOYSA-N 0.000 description 6
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 5
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 5
- 239000004952 Polyamide Substances 0.000 description 5
- 150000008065 acid anhydrides Chemical class 0.000 description 5
- 239000012670 alkaline solution Substances 0.000 description 5
- 239000007810 chemical reaction solvent Substances 0.000 description 5
- 239000012320 chlorinating reagent Substances 0.000 description 5
- 125000006159 dianhydride group Chemical group 0.000 description 5
- 238000005227 gel permeation chromatography Methods 0.000 description 5
- 150000002576 ketones Chemical class 0.000 description 5
- 229920002647 polyamide Polymers 0.000 description 5
- 239000000047 product Substances 0.000 description 5
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 5
- 230000009257 reactivity Effects 0.000 description 5
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 5
- JOXIMZWYDAKGHI-UHFFFAOYSA-N toluene-4-sulfonic acid Chemical compound CC1=CC=C(S(O)(=O)=O)C=C1 JOXIMZWYDAKGHI-UHFFFAOYSA-N 0.000 description 5
- LJHFIVQEAFAURQ-ZPUQHVIOSA-N (NE)-N-[(2E)-2-hydroxyiminoethylidene]hydroxylamine Chemical class O\N=C\C=N\O LJHFIVQEAFAURQ-ZPUQHVIOSA-N 0.000 description 4
- RFFLAFLAYFXFSW-UHFFFAOYSA-N 1,2-dichlorobenzene Chemical compound ClC1=CC=CC=C1Cl RFFLAFLAYFXFSW-UHFFFAOYSA-N 0.000 description 4
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 4
- GNDKYAWHEKZHPJ-UHFFFAOYSA-N 2-nitrobenzenesulfonimidic acid Chemical compound NS(=O)(=O)C1=CC=CC=C1[N+]([O-])=O GNDKYAWHEKZHPJ-UHFFFAOYSA-N 0.000 description 4
- FAQXMAJQQVDRQM-UHFFFAOYSA-N 4,4,5,5,6,6,7,7,7-nonafluoroheptane-1,2-diol Chemical compound OCC(O)CC(F)(F)C(F)(F)C(F)(F)C(F)(F)F FAQXMAJQQVDRQM-UHFFFAOYSA-N 0.000 description 4
- QQGYZOYWNCKGEK-UHFFFAOYSA-N 5-[(1,3-dioxo-2-benzofuran-5-yl)oxy]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(OC=2C=C3C(=O)OC(C3=CC=2)=O)=C1 QQGYZOYWNCKGEK-UHFFFAOYSA-N 0.000 description 4
- PAYRUJLWNCNPSJ-UHFFFAOYSA-N Aniline Chemical compound NC1=CC=CC=C1 PAYRUJLWNCNPSJ-UHFFFAOYSA-N 0.000 description 4
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 4
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 4
- QUSNBJAOOMFDIB-UHFFFAOYSA-N Ethylamine Chemical compound CCN QUSNBJAOOMFDIB-UHFFFAOYSA-N 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- JLTDJTHDQAWBAV-UHFFFAOYSA-N N,N-dimethylaniline Chemical compound CN(C)C1=CC=CC=C1 JLTDJTHDQAWBAV-UHFFFAOYSA-N 0.000 description 4
- OJGMBLNIHDZDGS-UHFFFAOYSA-N N-Ethylaniline Chemical compound CCNC1=CC=CC=C1 OJGMBLNIHDZDGS-UHFFFAOYSA-N 0.000 description 4
- 239000004793 Polystyrene Substances 0.000 description 4
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 4
- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 description 4
- SMWDFEZZVXVKRB-UHFFFAOYSA-N Quinoline Chemical compound N1=CC=CC2=CC=CC=C21 SMWDFEZZVXVKRB-UHFFFAOYSA-N 0.000 description 4
- KKEYFWRCBNTPAC-UHFFFAOYSA-N Terephthalic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-N 0.000 description 4
- KXKVLQRXCPHEJC-UHFFFAOYSA-N acetic acid trimethyl ester Natural products COC(C)=O KXKVLQRXCPHEJC-UHFFFAOYSA-N 0.000 description 4
- 230000001476 alcoholic effect Effects 0.000 description 4
- 125000004849 alkoxymethyl group Chemical group 0.000 description 4
- 125000003710 aryl alkyl group Chemical group 0.000 description 4
- 125000001246 bromo group Chemical group Br* 0.000 description 4
- 239000004202 carbamide Substances 0.000 description 4
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 4
- 125000001309 chloro group Chemical group Cl* 0.000 description 4
- MVPPADPHJFYWMZ-UHFFFAOYSA-N chlorobenzene Chemical compound ClC1=CC=CC=C1 MVPPADPHJFYWMZ-UHFFFAOYSA-N 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- BGTOWKSIORTVQH-UHFFFAOYSA-N cyclopentanone Chemical compound O=C1CCCC1 BGTOWKSIORTVQH-UHFFFAOYSA-N 0.000 description 4
- 125000006575 electron-withdrawing group Chemical group 0.000 description 4
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 4
- 229910052731 fluorine Inorganic materials 0.000 description 4
- 150000004820 halides Chemical class 0.000 description 4
- 150000008282 halocarbons Chemical class 0.000 description 4
- FUZZWVXGSFPDMH-UHFFFAOYSA-M hexanoate Chemical compound CCCCCC([O-])=O FUZZWVXGSFPDMH-UHFFFAOYSA-M 0.000 description 4
- 150000007974 melamines Chemical class 0.000 description 4
- 238000000059 patterning Methods 0.000 description 4
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 4
- 229920002577 polybenzoxazole Polymers 0.000 description 4
- 238000006068 polycondensation reaction Methods 0.000 description 4
- 239000009719 polyimide resin Substances 0.000 description 4
- 229920002223 polystyrene Polymers 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 239000011253 protective coating Substances 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 4
- 238000004528 spin coating Methods 0.000 description 4
- 229940124530 sulfonamide Drugs 0.000 description 4
- 229910021642 ultra pure water Inorganic materials 0.000 description 4
- 239000012498 ultrapure water Substances 0.000 description 4
- 150000003672 ureas Chemical class 0.000 description 4
- SCYULBFZEHDVBN-UHFFFAOYSA-N 1,1-Dichloroethane Chemical compound CC(Cl)Cl SCYULBFZEHDVBN-UHFFFAOYSA-N 0.000 description 3
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 3
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 3
- CDAWCLOXVUBKRW-UHFFFAOYSA-N 2-aminophenol Chemical compound NC1=CC=CC=C1O CDAWCLOXVUBKRW-UHFFFAOYSA-N 0.000 description 3
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 3
- QPRQEDXDYOZYLA-UHFFFAOYSA-N 2-methylbutan-1-ol Chemical compound CCC(C)CO QPRQEDXDYOZYLA-UHFFFAOYSA-N 0.000 description 3
- MSXVEPNJUHWQHW-UHFFFAOYSA-N 2-methylbutan-2-ol Chemical compound CCC(C)(C)O MSXVEPNJUHWQHW-UHFFFAOYSA-N 0.000 description 3
- PAPNRQCYSFBWDI-UHFFFAOYSA-N DMP Natural products CC1=CC=C(C)N1 PAPNRQCYSFBWDI-UHFFFAOYSA-N 0.000 description 3
- YXHKONLOYHBTNS-UHFFFAOYSA-N Diazomethane Chemical class C=[N+]=[N-] YXHKONLOYHBTNS-UHFFFAOYSA-N 0.000 description 3
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 3
- SJRJJKPEHAURKC-UHFFFAOYSA-N N-Methylmorpholine Chemical compound CN1CCOCC1 SJRJJKPEHAURKC-UHFFFAOYSA-N 0.000 description 3
- RWRDLPDLKQPQOW-UHFFFAOYSA-N Pyrrolidine Chemical compound C1CCNC1 RWRDLPDLKQPQOW-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 239000007983 Tris buffer Substances 0.000 description 3
- ALVGSDOIXRPZFH-UHFFFAOYSA-N [(1-diazonioimino-3,4-dioxonaphthalen-2-ylidene)hydrazinylidene]azanide Chemical group C1=CC=C2C(=N[N+]#N)C(=NN=[N-])C(=O)C(=O)C2=C1 ALVGSDOIXRPZFH-UHFFFAOYSA-N 0.000 description 3
- 125000004018 acid anhydride group Chemical group 0.000 description 3
- 150000001299 aldehydes Chemical class 0.000 description 3
- 238000007112 amidation reaction Methods 0.000 description 3
- 150000004982 aromatic amines Chemical class 0.000 description 3
- 150000004984 aromatic diamines Chemical class 0.000 description 3
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 3
- WKDNYTOXBCRNPV-UHFFFAOYSA-N bpda Chemical compound C1=C2C(=O)OC(=O)C2=CC(C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 WKDNYTOXBCRNPV-UHFFFAOYSA-N 0.000 description 3
- BTANRVKWQNVYAZ-UHFFFAOYSA-N butan-2-ol Chemical compound CCC(C)O BTANRVKWQNVYAZ-UHFFFAOYSA-N 0.000 description 3
- 150000001805 chlorine compounds Chemical class 0.000 description 3
- 238000009833 condensation Methods 0.000 description 3
- 230000005494 condensation Effects 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
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- FBGFQFGNJVSNPX-UHFFFAOYSA-N methyl 2-[hexyl-(2-methoxy-2-oxoethyl)amino]acetate Chemical compound CCCCCCN(CC(=O)OC)CC(=O)OC FBGFQFGNJVSNPX-UHFFFAOYSA-N 0.000 description 1
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- ZSUGJFRMRQCMDI-UHFFFAOYSA-N methyl 5-carbamoylnaphthalene-1-carboxylate Chemical compound COC(=O)C1=CC=CC2=C(C=CC=C12)C(=O)N ZSUGJFRMRQCMDI-UHFFFAOYSA-N 0.000 description 1
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- AABGUJPBJFJVCL-UHFFFAOYSA-N methyl 6-carbamoylnaphthalene-1-carboxylate Chemical compound COC(=O)C1=CC=CC2=CC(=CC=C12)C(=O)N AABGUJPBJFJVCL-UHFFFAOYSA-N 0.000 description 1
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- 150000000000 tetracarboxylic acids Chemical class 0.000 description 1
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- 125000002088 tosyl group Chemical group [H]C1=C([H])C(=C([H])C([H])=C1C([H])([H])[H])S(*)(=O)=O 0.000 description 1
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- AANIRNIRVXARSN-UHFFFAOYSA-M trifluoromethanesulfonate;trimethylsulfanium Chemical compound C[S+](C)C.[O-]S(=O)(=O)C(F)(F)F AANIRNIRVXARSN-UHFFFAOYSA-M 0.000 description 1
- TUODWSVQODNTSU-UHFFFAOYSA-M trifluoromethanesulfonate;tris[4-[(2-methylpropan-2-yl)oxy]phenyl]sulfanium Chemical compound [O-]S(=O)(=O)C(F)(F)F.C1=CC(OC(C)(C)C)=CC=C1[S+](C=1C=CC(OC(C)(C)C)=CC=1)C1=CC=C(OC(C)(C)C)C=C1 TUODWSVQODNTSU-UHFFFAOYSA-M 0.000 description 1
- RKBCYCFRFCNLTO-UHFFFAOYSA-N triisopropylamine Chemical compound CC(C)N(C(C)C)C(C)C RKBCYCFRFCNLTO-UHFFFAOYSA-N 0.000 description 1
- 239000013638 trimer Substances 0.000 description 1
- NRZWQKGABZFFKE-UHFFFAOYSA-N trimethylsulfonium Chemical compound C[S+](C)C NRZWQKGABZFFKE-UHFFFAOYSA-N 0.000 description 1
- FAYMLNNRGCYLSR-UHFFFAOYSA-M triphenylsulfonium triflate Chemical compound [O-]S(=O)(=O)C(F)(F)F.C1=CC=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 FAYMLNNRGCYLSR-UHFFFAOYSA-M 0.000 description 1
- YFTHZRPMJXBUME-UHFFFAOYSA-N tripropylamine Chemical compound CCCN(CCC)CCC YFTHZRPMJXBUME-UHFFFAOYSA-N 0.000 description 1
- FVHPPQILUTTWCV-UHFFFAOYSA-N undecane-1,3,7,9-tetracarboxylic acid Chemical compound CCC(C(O)=O)CC(C(O)=O)CCCC(C(O)=O)CCC(O)=O FVHPPQILUTTWCV-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1067—Wholly aromatic polyimides, i.e. having both tetracarboxylic and diamino moieties aromatically bound
- C08G73/1071—Wholly aromatic polyimides containing oxygen in the form of ether bonds in the main chain
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/0226—Quinonediazides characterised by the non-macromolecular additives
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
- G03F7/0233—Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1003—Preparatory processes
- C08G73/1007—Preparatory processes from tetracarboxylic acids or derivatives and diamines
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
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Description
また、パターン形成において、アルカリ水溶液に可溶であり、解像性に優れ、微細なパターン形成が可能であり、且つ低温で硬化した場合でも機械特性が良好である、上記重合体を用いたポジ型感光性樹脂組成物及びネガ型感光性樹脂組成物を提供することを別の目的とする。
(A)上述の重合体、
(B)光により酸を発生しアルカリ水溶液に対する溶解速度が増大する感光剤であって、キノンジアジド構造を有する化合物、及び
(D)溶剤、
を含むポジ型感光性樹脂組成物を提供する。
(A’)上述の重合体、
(B’)光酸発生剤、
(C)ホルムアルデヒド又はホルムアルデヒド-アルコールにより変性されたアミノ縮合物、1分子中に平均して2個以上のメチロール基又はアルコキシメチロール基を有するフェノール化合物、多価フェノールの水酸基の水素原子をグリシジル基に置換した化合物、多価フェノールの水酸基の水素原子を下記式(C-1)で示される置換基に置換した化合物、及び下記式(C-2)で示されるグリシジル基を有した窒素原子を2つ以上含有した化合物から選ばれる1種又は2種以上の架橋剤、及び
(D)溶剤、
を含むネガ型感光性樹脂組成物を提供する。
(1)上述のポジ型感光性樹脂組成物を基板上に塗布し、感光材皮膜を形成する工程、
(2)前記感光材皮膜を加熱する工程、
(3)フォトマスクを介して波長190~500nmの高エネルギー線もしくは電子線で前記感光材皮膜を露光する工程、及び、
(4)アルカリ水溶液の現像液を用いて現像する工程、
を含むパターン形成方法を提供する。
(I)上述のネガ型感光性樹脂組成物を基板上に塗布し、感光材皮膜を形成する工程、
(II)前記感光材皮膜を加熱する工程、
(III)フォトマスクを介して波長190~500nmの高エネルギー線もしくは電子線で前記感光材皮膜を露光する工程、及び、
(IV)アルカリ水溶液の現像液を用いて現像する工程、
を含むパターン形成方法を提供する。
また、パターン形成において、アルカリ水溶液に可溶であり、解像性に優れ、微細なパターン形成が可能であり、且つ低温で硬化した場合でも機械特性が良好である、上記重合体を用いたポジ型感光性樹脂組成物及びネガ型感光性樹脂組成物を提供することができる。
本発明の重合体は、下記一般式(1)及び/又は(2)で表される構造単位(構造単位(1)、構造単位(2))を含むものである。
本発明の重合体は、下記一般式(1)及び/又は(2)で表される構造単位を含むものである。
上記一般式(1)で示される構造単位を含む重合体は、下記一般式(22)で示されるテトラカルボン酸二無水物と下記一般式(23)で示されるジアミンとを反応させることで得ることができる。まず、下記一般式(22)で示されるテトラカルボン酸二無水物と下記一般式(23)で示されるジアミンとを反応させることで、アミド酸を合成した後、次いで、加熱脱水によりイミド環を形成することで構造単位(1)を含む重合体を得ることができる。
一方、上記一般式(2)で示される構造単位を含む重合体は、下記一般式(27)で示されるジカルボン酸化合物と下記一般式(28)で示されるジアミンとを反応させることによって得ることができる。
上述したように本発明の重合体は、上記一般式(1)、(2)で示される構造単位に加え、更に他の構造単位を含有することができる。具体的には、更に、下記構造単位(3)を含有することができる。
上述のアルカリ可溶性樹脂の好適な重量平均分子量は、好ましくは5,000~100,000、より好ましくは7,000~30,000である。分子量が5,000以上であれば、上記アルカリ可溶性樹脂をベース樹脂に用いた感光性樹脂組成物を基板上に所望な膜厚に成膜することは容易になり、分子量が100,000以下であれば、該感光性樹脂組成物の粘度が著しく高いものとはならず、成膜できなくなる恐れがない。
なお、本発明において、重量平均分子量はゲルパーミエーションクロマトグラフィー(GPC)によるポリスチレン換算の測定値である。
次に、本発明の重合体をベース樹脂とした感光性樹脂組成物に関して説明する。本発明では、上述した本発明の重合体をベース樹脂として用いることにより、ポジ型感光性樹脂組成物やネガ型感光性樹脂組成物を得ることができる。
まず、本発明の重合体をベース樹脂とした感光性樹脂組成物において、アルカリ現像可能なポジ型感光性樹脂組成物について説明する。本発明のポジ型感光性樹脂組成物は、例えば以下に説明する2つの形態とすることができるが、これらに限定されない。
(A)構造単位(1)及び/又は構造単位(2)を含む重合体、又は、構造単位(1)、構造単位(2)に加え、更に、構造単位(3)~(5)及び(7)のいずれか1種以上を含む重合体、
(B)光により酸を発生しアルカリ水溶液に対する溶解速度が増大する感光剤であって、キノンジアジド構造を有する化合物、
(D)溶剤、
を含むものである。
即ち、現像液にアルカリ水溶液を用いた場合、未露光部は現像液に溶解することがなく、露光部は現像液に可溶であることから、ポジ型のパターンを形成することが可能となる。
上記R9としては、例えば、メチロール基、メトキシメチル基、エトキシメチル基等のアルコキシメチル基及び水素原子等が挙げられる。
上記ホルムアルデヒド又はホルムアルデヒド-アルコールにより変性された尿素縮合物の具体例としては、例えば、メトキシメチル化尿素縮合物、エトキシメチル化尿素縮合物、プロポキシメチル化尿素縮合物等が挙げられる。
なお、これら変性メラミン縮合物及び変性尿素縮合物の1種又は2種以上を混合して使用することもできる。
これら多価フェノールの水酸基をグリシドキシ基に置換した化合物(多価フェノールの水酸基の水素原子をグリシジル基に置換した化合物)の1種又は2種を、架橋剤として使用することができる。
本発明の重合体をベース樹脂とした感光性樹脂組成物において、アルカリ現像可能なネガ型感光性樹脂組成物について説明する。本発明のネガ型感光性樹脂組成物は、例えば以下に説明する形態とすることができるが、これらに限定されない。
(A’)構造単位(1)及び/又は構造単位(2)を含む重合体、又は、構造単位(1)、構造単位(2)に加え、更に、構造単位(3)~(5)及び(7)のいずれか1種以上を含む重合体、
(B’)光酸発生剤、
(C)ホルムアルデヒド又はホルムアルデヒド-アルコールにより変性されたアミノ縮合物、1分子中に平均して2個以上のメチロール基又はアルコキシメチロール基を有するフェノール化合物、多価フェノールの水酸基の水素原子をグリシジル基に置換した化合物、多価フェノールの水酸基の水素原子を下記式(C-1)で示される置換基に置換した化合物、及び下記式(C-2)で示されるグリシジル基を有した窒素原子を2つ以上含有した化合物から選ばれる1種又は2種以上の架橋剤、及び
(D)溶剤、
を含むものである。
(R10)jM+K- (56a)
(式中、R10は置換基を有してもよい炭素数1~12の直鎖状、分岐状、又は環状のアルキル基、炭素数6~12のアリール基又は炭素数7~12のアラルキル基を表し、M+はヨードニウム又はスルホニウムを表し、K-は非求核性対向イオンを表し、jは2又は3を表す。)
N(α)q(β)3-q (57)
イミド誘導体としては、例えばフタルイミド、サクシンイミド、マレイミド等が例示される。
次に、本発明のポジ型感光性樹脂組成物及びネガ型感光性樹脂組成物を用いたパターン形成方法に関して、説明を行う。
また、上記パターン形成方法により得られたパターン形成された被膜をオーブンやホットプレートなどを用いて、温度100~300℃、好ましくは150~300℃、さらに好ましくは180~250℃において加熱、後硬化することで硬化被膜を形成することができる。後硬化温度が100~300℃であれば、感光性樹脂組成物の皮膜の架橋密度を上げ、残存する揮発成分を除去でき、基板に対する密着力、耐熱性や強度、さらに電気特性の観点から好ましい。そして、後硬化時間は10分間~10時間とすることができる。
このようにして得られた硬化被膜は、基板との密着性、耐熱性、電気特性、機械的強度及びアルカリ性剥離液等に対する薬品耐性に優れ、それを保護用被膜とした半導体素子の信頼性にも優れ、特に温度サイクル試験の際のクラック発生を防止でき、電気・電子部品、半導体素子等の保護用被膜(層間絶縁膜あるいは表面保護膜)として好適に用いられる。
このような電子部品は、耐熱性、薬品耐性、絶縁性を有する保護用被膜(層間絶縁膜又は表面保護膜)を有することから、信頼性に優れたものとなる。
BPS ビス(3―アミノ-4-ヒドロキシフェニル)スルホン
ODA 4,4’-ジアミノジフェニルエーテル
APB 1,3-ビス(3-アミノフェノキシ)ベンゼン
s-ODPA 3,3’,4,4’-オキシジフタル酸二無水物
s-BPDA 3,3’,4,4’-ビフェニルテトラカルボン酸二無水物
DC-2 セバシン酸ジクロライド
PAP 4-アミノフェノール
PEA 4-エチニルアニリン
Rf-1 4,4,5,5,5-ペンタフルオロペンタノール
Rf-2 1-トリフルオロメチル-2,2,2-トリフルオロエチル-2’-ヒドロキシエチルエーテル
Rf-3 3-ヒドロキシ-2,2-ジメチルプロピルトリフルオロアセテート
Rf-4 4,4,5,5,6,6,7,7,7-ノナフルオロ-1,2-ヘプタンジオール
撹拌機、温度計を具備し、窒素で置換した1Lのフラスコ内に4-ニトロベンゼンスルホンアミド20.0g(98.9mmol)、トリエチルアミン25.0g(247mmol)、N,N-ジメチル-4-アミノピリジン0.6g(5mmol)、トルエン200gを加え、60℃まで昇温し溶解させた後、撹拌しているところに4-ニトロベンゾイルクロライド18.7g(101mmol)をトルエン100gに溶解させたものを1時間かけて滴下後、60℃で1時間撹拌した。その後、室温まで冷却し、析出物を濾別し、濾別した析出物を10%塩酸水溶液で洗浄後、水で数回洗浄した。得られた結晶を60℃で15時間減圧乾燥することにより、4-ニトロ-N-[(4-ニトロフェニル)スルホニル]ベンズアミド31.3gを得た。
合成例1において、4-ニトロベンゼンスルホンアミドを2-ニトロベンゼンスルホンアミド20.0g(98.9mmol)に代え、それ以外は同様の処方でジアミン(DA-2)を得た。
合成例1において、4-ニトロベンゼンスルホンアミドを3-ニトロベンゼンスルホンアミド20.0g(98.9mmol)に代え、それ以外は同様の処方でジアミン(DA-3)を得た。
合成例1において、4-ニトロベンゼンスルホンアミドを2-ニトロベンゼンスルホンアミド20.0g(98.9mmol)に、4-ニトロベンゾイルクロライドを2-ニトロベンゾイルクロライド18.7g(101mmol)に代え、それ以外は同様の処方でジアミン(DA-4)を得た。
合成例1において、4-ニトロベンゼンスルホンアミドを4-ニトロベンズアミド16.4g(98.9mmol)に代え、それ以外は同様の処方でジアミン(DA-5)を得た。
合成例1において、4-ニトロベンゾイルクロライドを4-ニトロベンゼンスルホニルクロライド22.4g(101mmol)に代え、それ以外は同様の処方でジアミン(DA-6)を得た。
合成例1において、4-ニトロベンゼンスルホンアミドを6-ニトロ-2-ナフタレンスルホンアミド24.9g(98.9mmol)に、4-ニトロベンゾイルクロライドを6-ニトロ-2-ナフタレンカルボニルクロライド23.8g(101mmol)に代え、それ以外は同様の処方でジアミン(DA-7)を得た。
合成例1において、4-ニトロベンゼンスルホンアミドを5-ニトロ-1-ナフタレンスルホンアミド24.9g(98.9mmol)に、4-ニトロベンゾイルクロライドを5-ニトロ-1-ナフタレンカルボニルクロライド23.8g(101mmol)に代え、それ以外は同様の処方でジアミン(DA-8)を得た。
撹拌機、温度計を具備し、窒素で置換した1Lのフラスコ内に4-シアノベンゼンスルホンアミド20.0g(110mmol)、トリエチルアミン27.8g(275mmol)、N,N-ジメチル-4-アミノピリジン0.7g(5.5mmol)、トルエン200gを加え、60℃まで昇温し溶解させた後、撹拌しているところに4-シアノベンゾイルクロライド18.5g(112mmol)をトルエン100gに溶解させたものを1時間かけて滴下後、60℃で1時間撹拌した。その後、室温まで冷却し、析出物を濾別し、濾別した析出物を10%塩酸水溶液で洗浄後、水で数回洗浄した。得られた結晶を60℃で15時間減圧乾燥することにより、4-シアノ-N-[(4-シアノフェニル)スルホニル]ベンズアミド30.8gを得た。
撹拌機、温度計を具備した3Lのフラスコ内に3,3’,4,4’-オキシジフタル酸二無水物(s-ODPA)100g(322mmol)、トリエチルアミン65.2g(644mmol)、N,N-ジメチル-4-アミノピリジン39.3g(322mmol)、γ-ブチロラクトン400gを加え、室温で撹拌しているところに4,4,5,5,5-ペンタフルオロペンタノール(Rf-1)114.7g(644mmol)を滴下後、室温下で24時間撹拌した。その後、氷冷下10%塩酸水溶液370gを滴下し反応を停止させた。反応液に、4-メチル-2-ペンタノン800gを加え有機層を分取した後、超純水600gで6回洗浄した。得られた有機層の溶媒を留去し、テトラカルボン酸ジエステル化合物(X-1)を193g得た。得られたテトラカルボン酸ジエステル化合物にN-メチル-2-ピロリドン772gを加え、室温で撹拌し溶解した。次に氷冷下、塩化チオニル75.8g(637mmol)を反応溶液温度が10℃以下を保つように滴下し、滴下終了後氷冷下で2時間撹拌し、テトラカルボン酸ジエステルジクロライド(X-1)のN-メチル-2-ピロリドン溶液を得た。
合成例10において、4,4,5,5,5-ペンタフルオロペンタノール(Rf-1)を1-トリフルオロメチル-2,2,2-トリフルオロエチル-2’-ヒドロキシエチルエーテル(Rf-2)136.6g(644mmol)に代え、それ以外は同様の処方でテトラカルボン酸ジエステルジクロライド(X-2)のN-メチル-2-ピロリドン溶液を得た。
合成例10において、4,4,5,5,5-ペンタフルオロペンタノール(Rf-1)を3-ヒドロキシ-2,2-ジメチルプロピルトリフルオロアセテート(Rf-3)101.8g(644mmol)に代え、それ以外は同様の処方でテトラカルボン酸ジエステルジクロライド(X-3)のN-メチル-2-ピロリドン溶液を得た。
合成例10において、4,4,5,5,5-ペンタフルオロペンタノール(Rf-1)を4,4,5,5,6,6,7,7,7-ノナフルオロ-1,2-ヘプタンジオール(Rf-4)189.4g(644mmol)に代え、それ以外は同様の処方でテトラカルボン酸ジエステルジクロライド(X-4)のN-メチル-2-ピロリドン溶液を得た。
撹拌機、温度計を具備した500mlのフラスコ内に合成例1で合成したジアミン(DA-1)23.3g(80.0mmol)、4-アミノフェノール(PAP)0.9g(8.4mmol)、N-メチル-2-ピロリドン97gを加え、室温で撹拌し溶解した。次に室温下、3,3’,4,4’-オキシジフタル酸二無水物(s-ODPA)26.1g(84.2mmol)、をN-メチル-2-ピロリドン264gに溶解した溶液を滴下し、滴下終了後室温下3時間撹拌した。その後、この反応液にキシレン20gを加え、170℃で生成する水を系外へ除きながら3時間加熱還流を行った。室温まで冷却後、この反応液を超純水2Lの撹拌下に滴下し、析出物をろ別し、適宜水洗後、40℃で48時間減圧乾燥することにより、ポリイミド樹脂(A-1)を得た。この重合体の分子量をGPCにより測定すると、ポリスチレン換算で重量平均分子量34,000であった。
撹拌機、温度計を具備した500mlのフラスコ内に2,2―ビス(3―アミノ―4―ヒドロキシフェニル)ヘキサフルオロプロパン(6FAP)23.4g(64.0mmol)、合成例1で合成したジアミン(DA-1)4.7g(16.0mmol)、4-アミノフェノール(PAP)0.9g(8.4mmol)、N-メチル-2-ピロリドン116gを加え、室温で撹拌し溶解した。次に室温下、3,3’,4,4’-オキシジフタル酸二無水物(s-ODPA)22.3g(72.0mmol)、3,3’,4,4’-ビフェニルテトラカルボン酸二無水物(s-BPDA)2.4g(8.0mmol)をN-メチル-2-ピロリドン250gに溶解した溶液を滴下し、滴下終了後、室温下3時間撹拌した。その後、この反応液にキシレン20gを加え、170℃で生成する水を系外へ除きながら3時間加熱還流を行った。室温まで冷却後、ピリジン1.4g(17.6mmol)を加え、合成例10で別途調製したテトラカルボン酸ジエステルジクロライドのN-メチル-2-ピロリドン溶液(X-1)15.1g[テトラカルボン酸ジエステルジクロライドとして3.0g(4.2mmol))]を5℃以下に保つように滴下した。滴下終了後、室温まで戻し、この反応液を超純水2Lの撹拌下に滴下し、析出物をろ別し、適宜水洗後、40℃で48時間減圧乾燥することにより、ポリアミドイミド樹脂(A-2)を得た。この重合体の分子量をGPCにより測定すると、ポリスチレン換算で重量平均分子量32,000であった。
ジアミン化合物、モノアミン化合物、テトラカルボン酸二無水物、ジカルボン酸ジクロライド、テトラカルボン酸ジエステルジクロライドとして下記表1中に示す重量の化合物を用い、ポリイミド樹脂の場合、合成例14と同様の処方で、ポリアミドイミド樹脂の場合、合成例15と同様の処方で樹脂(A-3)~(A-19)、(B-1)、(B-2)を得た。それぞれの重合体の分子量をGPCにより測定し、ポリスチレン換算で重量平均分子量を下記表1に示す。
上記合成例14~合成例32及び比較合成例1、2で合成した重合体をベース樹脂として使用して、表2及び表3に記載した組成と配合量で、樹脂換算30質量%の樹脂組成物を調製した。その後、撹拌、混合、溶解した後、テフロン(登録商標)製0.5μmフィルターで精密濾過を行って感光性樹脂組成物を得た。表中溶剤のPGMEAはプロピレングリコールモノメチルエーテルアセテート、GBLはγ―ブチロラクトンを示す。
エポキシ樹脂:ADEKA(株)社製 EP4000L
上記の感光性樹脂組成物1~42、比較感光性樹脂組成物1~4をシリコン基板上へ5mLディスペンスした後に基板を回転することによって、即ち、スピンコート法によって、パターン形成後施す後硬化の加熱後に膜厚が10μmとなるように塗布した。即ち、後硬化工程後、膜厚が減少することを予め検討し、後硬化後の仕上がり膜厚が10μmとなるように塗布時の回転数を調整した。
次に、ホットプレート上100℃、2分間のプリベークを施した。そして次に、ニコン社製i線ステッパーNSR-2205i11を用いてi線露光、パターン形成を行った。パターン形成においては、ポジ型パターン用、ネガ型パターン用のマスクを、適宜、使用した感光性樹脂組成物に合わせて用いた。該マスクは、縦横1:1配列の20μmのホールが形成できるパターンを有し、50μm~20μmまでは10μm刻み、20μm~10μmまでは5μm刻み、10μm~1μmまでは1μm刻みのホールパターンが形成できるものである。
良好:ホールが矩形又は順テーパー形状(ホール上部の寸法が底部の寸法より大きい形状)が観察されたもの
不良:逆テーパー形状(ホール上部の寸法が底部の寸法より小さい形状)、オーバーハング形状(ホール上部が張り出した形状)、著しい膜減りが観察されたもの、又はホール底部に残渣が観察されたもの
上記の感光性樹脂組成物1~42、比較感光性樹脂組成物1~4をアルミ基板上へ硬化後の仕上がり膜厚が10μmとなるようにスピンコートした。次に、ホットプレート上100℃、3分間のプリベークを施し、感光性樹脂膜を得た。
Claims (14)
- 前記一般式(1)及び/又は(2)で表される構造単位に加え、さらに下記一般式(3)から(5)及び(7)で表される構造単位のいずれか1種以上を含むものであることを特徴とする請求項1に記載の重合体。
- (A)請求項1から請求項4のいずれか一項に記載の重合体、
(B)光により酸を発生しアルカリ水溶液に対する溶解速度が増大する感光剤であって、キノンジアジド構造を有する化合物、及び、
(D)溶剤、
を含むものであることを特徴とするポジ型感光性樹脂組成物。 - さらに下記(C)成分を含むものであることを特徴とする請求項5に記載のポジ型感光性樹脂組成物。
(C)ホルムアルデヒド又はホルムアルデヒド-アルコールにより変性されたアミノ縮合物、1分子中に平均して2個以上のメチロール基又はアルコキシメチロール基を有するフェノール化合物、多価フェノールの水酸基の水素原子をグリシジル基に置換した化合物、多価フェノールの水酸基の水素原子を下記式(C-1)で示される置換基に置換した化合物、及び下記式(C-2)で示されるグリシジル基を有した窒素原子を2つ以上含有した化合物から選ばれる1種又は2種以上の架橋剤
- (A’)請求項1から請求項4のいずれか一項に記載の重合体、
(B’)光酸発生剤、
(C)ホルムアルデヒド又はホルムアルデヒド-アルコールにより変性されたアミノ縮合物、1分子中に平均して2個以上のメチロール基又はアルコキシメチロール基を有するフェノール化合物、多価フェノールの水酸基の水素原子をグリシジル基に置換した化合物、多価フェノールの水酸基の水素原子を下記式(C-1)で示される置換基に置換した化合物、及び下記式(C-2)で示されるグリシジル基を有した窒素原子を2つ以上含有した化合物から選ばれる1種又は2種以上の架橋剤、及び
(D)溶剤、
を含むものであることを特徴とするネガ型感光性樹脂組成物。 - (1)請求項5又は請求項6に記載のポジ型感光性樹脂組成物を基板上に塗布し、感光材皮膜を形成する工程、
(2)前記感光材皮膜を加熱する工程、
(3)フォトマスクを介して波長190~500nmの高エネルギー線もしくは電子線で前記感光材皮膜を露光する工程、及び、
(4)アルカリ水溶液の現像液を用いて現像する工程、
を含むことを特徴とするパターン形成方法。 - (I)請求項7に記載のネガ型感光性樹脂組成物を基板上に塗布し、感光材皮膜を形成する工程、
(II)前記感光材皮膜を加熱する工程、
(III)フォトマスクを介して波長190~500nmの高エネルギー線もしくは電子線で前記感光材皮膜を露光する工程、及び、
(IV)アルカリ水溶液の現像液を用いて現像する工程、
を含むことを特徴とするパターン形成方法。 - 前記露光工程(III)と前記現像工程(IV)との間に、さらに前記感光材皮膜の露光後加熱工程を含むことを特徴とする請求項9に記載のパターン形成方法。
- 請求項8から請求項10のいずれか一項に記載のパターン形成方法により得られたパターン形成された被膜を、温度100~300℃において加熱、後硬化する工程を含むことを特徴とする硬化被膜形成方法。
- 請求項5又は請求項6に記載のポジ型感光性樹脂組成物、又は請求項7に記載のネガ型感光性樹脂組成物が硬化してなる硬化被膜からなるものであることを特徴とする層間絶縁膜。
- 請求項5又は請求項6に記載のポジ型感光性樹脂組成物、又は請求項7に記載のネガ型感光性樹脂組成物が硬化してなる硬化被膜からなるものであることを特徴とする表面保護膜。
- 請求項12に記載の層間絶縁膜又は請求項13に記載の表面保護膜を有するものであることを特徴とする電子部品。
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