JP7399160B2 - 光パターン照射制御装置及び光パターン照射制御方法 - Google Patents

光パターン照射制御装置及び光パターン照射制御方法 Download PDF

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JP7399160B2
JP7399160B2 JP2021520697A JP2021520697A JP7399160B2 JP 7399160 B2 JP7399160 B2 JP 7399160B2 JP 2021520697 A JP2021520697 A JP 2021520697A JP 2021520697 A JP2021520697 A JP 2021520697A JP 7399160 B2 JP7399160 B2 JP 7399160B2
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irradiation
light pattern
image
unit
irradiation area
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JPWO2020235348A1 (https=
JPWO2020235348A5 (https=
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貴志 島津
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Sony Interactive Entertainment Inc
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Sony Interactive Entertainment Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G01C3/06—Use of electric means to obtain final indication

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP2021520697A 2019-05-17 2020-05-07 光パターン照射制御装置及び光パターン照射制御方法 Active JP7399160B2 (ja)

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JP2019093819 2019-05-17
JP2019093819 2019-05-17
PCT/JP2020/018591 WO2020235348A1 (ja) 2019-05-17 2020-05-07 光パターン照射制御装置及び光パターン照射制御方法

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JPWO2020235348A1 JPWO2020235348A1 (https=) 2020-11-26
JPWO2020235348A5 JPWO2020235348A5 (https=) 2023-04-04
JP7399160B2 true JP7399160B2 (ja) 2023-12-15

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115218820B (zh) * 2021-04-20 2025-08-08 上海图漾信息科技有限公司 结构光投射装置、深度数据测量头、计算设备和测量方法
JP7508150B2 (ja) 2020-07-22 2024-07-01 上海図漾信息科技有限公司 深度データ測定機器及び構造化光投影ユニット
JP7388601B1 (ja) * 2022-05-09 2023-11-29 三菱電機株式会社 構造物計測装置、データ処理装置、及び構造物計測方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007017355A (ja) 2005-07-08 2007-01-25 Omron Corp ステレオ対応づけのための投光パターンの生成装置及び生成方法
JP2008232776A (ja) 2007-03-20 2008-10-02 Fujifilm Corp ３次元形状計測装置および方法並びにプログラム
JP2010091492A (ja) 2008-10-10 2010-04-22 Fujifilm Corp ３次元形状計測用撮影装置および方法並びにプログラム
JP2011209019A (ja) 2010-03-29 2011-10-20 Sony Corp ロボット装置及びロボット装置の制御方法
JP2012098087A (ja) 2010-10-29 2012-05-24 Canon Inc 測定装置及び測定方法
JP2017530352A (ja) 2014-09-11 2017-10-12 サイバーオプティクス コーポレーション 三次元表面形状計測における多数のカメラ及び光源からの点群統合

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10186051B2 (en) * 2017-05-11 2019-01-22 Dantec Dynamics A/S Method and system for calibrating a velocimetry system

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007017355A (ja) 2005-07-08 2007-01-25 Omron Corp ステレオ対応づけのための投光パターンの生成装置及び生成方法
JP2008232776A (ja) 2007-03-20 2008-10-02 Fujifilm Corp ３次元形状計測装置および方法並びにプログラム
JP2010091492A (ja) 2008-10-10 2010-04-22 Fujifilm Corp ３次元形状計測用撮影装置および方法並びにプログラム
JP2011209019A (ja) 2010-03-29 2011-10-20 Sony Corp ロボット装置及びロボット装置の制御方法
JP2012098087A (ja) 2010-10-29 2012-05-24 Canon Inc 測定装置及び測定方法
JP2017530352A (ja) 2014-09-11 2017-10-12 サイバーオプティクス コーポレーション 三次元表面形状計測における多数のカメラ及び光源からの点群統合

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JPWO2020235348A1 (https=) 2020-11-26

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