JP7389472B2 - 半導体デバイスの製造方法及び半導体デバイス - Google Patents
半導体デバイスの製造方法及び半導体デバイス Download PDFInfo
- Publication number
- JP7389472B2 JP7389472B2 JP2020014220A JP2020014220A JP7389472B2 JP 7389472 B2 JP7389472 B2 JP 7389472B2 JP 2020014220 A JP2020014220 A JP 2020014220A JP 2020014220 A JP2020014220 A JP 2020014220A JP 7389472 B2 JP7389472 B2 JP 7389472B2
- Authority
- JP
- Japan
- Prior art keywords
- gallium
- diamond
- diamond substrate
- semiconductor device
- based semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Recrystallisation Techniques (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019125039 | 2019-07-04 | ||
| JP2019125039 | 2019-07-04 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2021013007A JP2021013007A (ja) | 2021-02-04 |
| JP2021013007A5 JP2021013007A5 (https=) | 2022-05-20 |
| JP7389472B2 true JP7389472B2 (ja) | 2023-11-30 |
Family
ID=74226528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020014220A Active JP7389472B2 (ja) | 2019-07-04 | 2020-01-30 | 半導体デバイスの製造方法及び半導体デバイス |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP7389472B2 (https=) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022184075A (ja) * | 2021-05-31 | 2022-12-13 | 国立研究開発法人産業技術総合研究所 | モザイクダイヤモンドウェハと異種半導体との接合体及びその製造方法、並びに、異種半導体との接合体用モザイクダイヤモンドウェハ |
| JP7741539B2 (ja) * | 2021-08-10 | 2025-09-18 | 国立研究開発法人産業技術総合研究所 | 半導体素子および半導体素子の製造方法 |
| US12424594B2 (en) | 2022-03-31 | 2025-09-23 | Raytheon Company | Integrated diamond substrate for thermal management |
| WO2024247933A1 (ja) * | 2023-06-01 | 2024-12-05 | 日本碍子株式会社 | 積層基板 |
| WO2025017863A1 (ja) * | 2023-07-19 | 2025-01-23 | 三菱電機株式会社 | 半導体装置および半導体装置の製造方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001102675A (ja) | 1999-09-29 | 2001-04-13 | Toshiba Corp | 半導体発光素子 |
| JP2007189171A (ja) | 2006-01-16 | 2007-07-26 | Musashino Eng:Kk | ダイヤモンドヒートスプレッダの常温接合方法,及び半導体デバイスの放熱部 |
| JP2008528420A (ja) | 2005-01-26 | 2008-07-31 | アポロ ダイヤモンド,インク | ダイヤモンド上の窒化ガリウム発光デバイス |
| WO2018143344A1 (ja) | 2017-02-02 | 2018-08-09 | 三菱電機株式会社 | 半導体製造方法および半導体製造装置 |
-
2020
- 2020-01-30 JP JP2020014220A patent/JP7389472B2/ja active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001102675A (ja) | 1999-09-29 | 2001-04-13 | Toshiba Corp | 半導体発光素子 |
| JP2008528420A (ja) | 2005-01-26 | 2008-07-31 | アポロ ダイヤモンド,インク | ダイヤモンド上の窒化ガリウム発光デバイス |
| JP2007189171A (ja) | 2006-01-16 | 2007-07-26 | Musashino Eng:Kk | ダイヤモンドヒートスプレッダの常温接合方法,及び半導体デバイスの放熱部 |
| WO2018143344A1 (ja) | 2017-02-02 | 2018-08-09 | 三菱電機株式会社 | 半導体製造方法および半導体製造装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2021013007A (ja) | 2021-02-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7389472B2 (ja) | 半導体デバイスの製造方法及び半導体デバイス | |
| US7023010B2 (en) | Si/C superlattice useful for semiconductor devices | |
| CN100573822C (zh) | 衬底及其制备方法以及半导体器件及其制备方法 | |
| TWI527099B (zh) | 用於回收基材之方法 | |
| KR101321654B1 (ko) | Ⅲ족 질화물 반도체 성장용 기판, ⅲ족 질화물 반도체 에피택셜 기판, ⅲ족 질화물 반도체 소자 및 ⅲ족 질화물 반도체 자립 기판, 및 이들의 제조 방법 | |
| JP2009038344A (ja) | 格子整合基板上への窒化物系光電子/電子デバイス構造体の形成 | |
| US20100258814A1 (en) | Light emitting diode and method of fabrication thereof | |
| JP2010056458A (ja) | 発光素子の製造方法 | |
| TW201417148A (zh) | Iii族氮化物複合基板與其製造方法、及iii族氮化物半導體裝置之製造方法 | |
| KR20170137180A (ko) | 다이아몬드-반도체 복합체 기판의 제조 방법 | |
| KR101178505B1 (ko) | 반도체 기판과 이의 제조 방법 | |
| JP2009270200A (ja) | 半導体をその基板から分離する方法 | |
| TW200945416A (en) | Method of fabricating photoelectric device of III-nitride based semiconductor and structure thereof | |
| CN107731903A (zh) | 基于SOI结构金刚石复合衬底的GaN高电子迁移率器件及制备方法 | |
| TW201413783A (zh) | 碳化矽紋層 | |
| JP5771968B2 (ja) | 半導体デバイスの製造方法、エピ成長用積層支持基板およびデバイス用積層支持基板 | |
| KR101428066B1 (ko) | 수직구조 그룹 3족 질화물계 반도체 발광다이오드 소자 및이의 제조 방법 | |
| TW200939518A (en) | Method of fabricating photoelectric device of III-nitride based semiconductor and structure thereof | |
| JP2012243792A (ja) | GaN薄膜貼り合わせ基板およびその製造方法、ならびにGaN系高電子移動度トランジスタおよびその製造方法 | |
| JP5564799B2 (ja) | 窒化ガリウム系半導体電子デバイスを作製する方法 | |
| CN113838816B (zh) | 一种具有金刚石钝化层的氮化镓基二极管器件的制备方法 | |
| JP2010226023A (ja) | 窒化物系化合物半導体層を支持基板上に有する基板生産物を製造する方法、及び半導体デバイスの製造方法 | |
| Chung et al. | Layer-transferred GaN template by ion cut for nitride-based light-emitting diodes | |
| CN102640258B (zh) | 一种制作氮化物半导体器件的方法 | |
| KR20090106294A (ko) | 수직구조 그룹 3족 질화물계 반도체 발광다이오드 소자 및이의 제조 방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20220512 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20220512 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20230601 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20230704 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230822 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20231024 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20231110 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 7389472 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
| R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |