JP7358191B2 - 音波検査方法、音波検査装置、及び接触媒質 - Google Patents

音波検査方法、音波検査装置、及び接触媒質 Download PDF

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JP7358191B2
JP7358191B2 JP2019194490A JP2019194490A JP7358191B2 JP 7358191 B2 JP7358191 B2 JP 7358191B2 JP 2019194490 A JP2019194490 A JP 2019194490A JP 2019194490 A JP2019194490 A JP 2019194490A JP 7358191 B2 JP7358191 B2 JP 7358191B2
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couplant
sonic
inspected
rubber
convex
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JP2021067603A (ja
JP2021067603A5 (enExample
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明子 平尾
紀子 山本
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Toshiba Corp
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Toshiba Corp
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Priority to JP2019194490A priority Critical patent/JP7358191B2/ja
Priority to US17/012,329 priority patent/US11788991B2/en
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Publication of JP2021067603A5 publication Critical patent/JP2021067603A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/28—Details, e.g. general constructional or apparatus details providing acoustic coupling, e.g. water
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/043—Analysing solids in the interior, e.g. by shear waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2437—Piezoelectric probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/0289—Internal structure, e.g. defects, grain size, texture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/10—Number of transducers
    • G01N2291/102—Number of transducers one emitter, one receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/263—Surfaces
    • G01N2291/2638—Complex surfaces

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP2019194490A 2019-10-25 2019-10-25 音波検査方法、音波検査装置、及び接触媒質 Active JP7358191B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2019194490A JP7358191B2 (ja) 2019-10-25 2019-10-25 音波検査方法、音波検査装置、及び接触媒質
US17/012,329 US11788991B2 (en) 2019-10-25 2020-09-04 Acoustic inspection method, acoustic inspection device, and couplant

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019194490A JP7358191B2 (ja) 2019-10-25 2019-10-25 音波検査方法、音波検査装置、及び接触媒質

Publications (3)

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JP2021067603A JP2021067603A (ja) 2021-04-30
JP2021067603A5 JP2021067603A5 (enExample) 2022-03-15
JP7358191B2 true JP7358191B2 (ja) 2023-10-10

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US (1) US11788991B2 (enExample)
JP (1) JP7358191B2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112020006623T5 (de) * 2020-01-29 2022-12-08 Noritake Co., Limited AE-Signal-Erfassungsvorrichtung für eine Schleifscheibe
US11835485B2 (en) * 2020-09-30 2023-12-05 Baker Hughes Oilfield Operations Llc Ultrasonic probe having flexible stabilizing element for probe alignment
US11656202B2 (en) 2021-03-15 2023-05-23 Kabushiki Kaisha Toshiba Sonic inspection device, sonic inspection method, and contact member
US12031947B2 (en) 2021-09-16 2024-07-09 Kabushiki Kaisha Toshiba Sonic inspection device, sonic inspection method, and contact member
JP7693577B2 (ja) * 2021-09-16 2025-06-17 株式会社東芝 音波検査装置、音波検査方法、及び接触部材
CN114019032B (zh) * 2021-11-16 2024-11-12 西安热工研究院有限公司 一种压气机叶片超声检测耦合剂辅助装置及方法
JP7788258B2 (ja) * 2021-11-24 2025-12-18 Ｔｏｙｏ Ｔｉｒｅ株式会社 スティックスリップ周波数特定方法及び装置
DE102022120723A1 (de) * 2022-08-17 2024-02-22 Endress + Hauser Flowtec Ag Koppelkörper und Ultraschall-Durchflussmessgerät

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002181796A (ja) 2000-12-12 2002-06-26 Akebono Brake Ind Co Ltd 超音波探傷装置の探触子用接触媒体
JP2008089317A (ja) 2006-09-29 2008-04-17 Hitachi Ltd 超音波探触子
JP2010117294A (ja) 2008-11-14 2010-05-27 Mitsubishi Heavy Ind Ltd 超音波測定方法及び装置
JP2011002320A (ja) 2009-06-18 2011-01-06 Jfe Steel Corp 溶接部の亀裂検査装置及び亀裂検査方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3564303A (en) * 1968-10-07 1971-02-16 Westinghouse Electric Corp Encapsulated transducer assembly
US3663842A (en) * 1970-09-14 1972-05-16 North American Rockwell Elastomeric graded acoustic impedance coupling device
US3741003A (en) * 1971-02-22 1973-06-26 W Gunkel Ultrasonic inspection apparatus
US6298727B1 (en) * 1999-10-18 2001-10-09 Sierra Matrix, Inc. Apparatus for acoustic inspection of a workpiece in arbitrary scanning orientations
JP2009284933A (ja) * 2008-05-27 2009-12-10 Marusho:Kk 超音波診断用カプラの製造方法
JP2017019644A (ja) 2015-07-13 2017-01-26 藤倉化成株式会社 シート送り機構
JP2018191882A (ja) 2017-05-16 2018-12-06 オリンパス株式会社 超音波内視鏡用音響レンズおよび超音波内視鏡装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002181796A (ja) 2000-12-12 2002-06-26 Akebono Brake Ind Co Ltd 超音波探傷装置の探触子用接触媒体
JP2008089317A (ja) 2006-09-29 2008-04-17 Hitachi Ltd 超音波探触子
JP2010117294A (ja) 2008-11-14 2010-05-27 Mitsubishi Heavy Ind Ltd 超音波測定方法及び装置
JP2011002320A (ja) 2009-06-18 2011-01-06 Jfe Steel Corp 溶接部の亀裂検査装置及び亀裂検査方法

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US11788991B2 (en) 2023-10-17
JP2021067603A (ja) 2021-04-30

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