JP7354934B2 - 製品品質分析支援システム - Google Patents

製品品質分析支援システム Download PDF

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Publication number
JP7354934B2
JP7354934B2 JP2020099484A JP2020099484A JP7354934B2 JP 7354934 B2 JP7354934 B2 JP 7354934B2 JP 2020099484 A JP2020099484 A JP 2020099484A JP 2020099484 A JP2020099484 A JP 2020099484A JP 7354934 B2 JP7354934 B2 JP 7354934B2
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JP2021192915A (ja
JP2021192915A5 (https=
Inventor
治樹 井波
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Toshiba Mitsubishi Electric Industrial Systems Corp
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Toshiba Mitsubishi Electric Industrial Systems Corp
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Priority to JP2020099484A priority Critical patent/JP7354934B2/ja
Priority to KR1020210021059A priority patent/KR102419234B1/ko
Priority to CN202110319682.2A priority patent/CN113834828A/zh
Publication of JP2021192915A publication Critical patent/JP2021192915A/ja
Publication of JP2021192915A5 publication Critical patent/JP2021192915A5/ja
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0232—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on qualitative trend analysis, e.g. system evolution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0106—General arrangement of respective parts
    • G01N2021/0112—Apparatus in one mechanical, optical or electronic block
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • General Factory Administration (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Control Of Metal Rolling (AREA)
JP2020099484A 2020-06-08 2020-06-08 製品品質分析支援システム Active JP7354934B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2020099484A JP7354934B2 (ja) 2020-06-08 2020-06-08 製品品質分析支援システム
KR1020210021059A KR102419234B1 (ko) 2020-06-08 2021-02-17 제품 품질 분석 지원 시스템
CN202110319682.2A CN113834828A (zh) 2020-06-08 2021-03-25 产品品质分析支援系统

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020099484A JP7354934B2 (ja) 2020-06-08 2020-06-08 製品品質分析支援システム

Publications (3)

Publication Number Publication Date
JP2021192915A JP2021192915A (ja) 2021-12-23
JP2021192915A5 JP2021192915A5 (https=) 2022-09-01
JP7354934B2 true JP7354934B2 (ja) 2023-10-03

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JP2020099484A Active JP7354934B2 (ja) 2020-06-08 2020-06-08 製品品質分析支援システム

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Country Link
JP (1) JP7354934B2 (https=)
KR (1) KR102419234B1 (https=)
CN (1) CN113834828A (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102741831B1 (ko) 2021-11-08 2024-12-11 주식회사 엘지에너지솔루션 리폼 핀
WO2023181127A1 (ja) * 2022-03-22 2023-09-28 東芝三菱電機産業システム株式会社 製品品質分析支援システム
JP7648004B2 (ja) * 2023-03-30 2025-03-18 株式会社Tmeic 圧延製品の品質不良分析支援システム
KR20250150591A (ko) 2024-02-26 2025-10-20 가부시키가이샤 티마이크 철강 플랜트의 메인터넌스 지원 시스템

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001025819A (ja) 1999-07-14 2001-01-30 Hitachi Ltd 圧延機の異常診断方法および装置
JP2003223210A (ja) 2002-01-30 2003-08-08 Jfe Steel Kk 長尺製品の長手方向特性データ編集・保管方法
JP2007083300A (ja) 2005-09-26 2007-04-05 Toshiba Mitsubishi-Electric Industrial System Corp 材質記録装置
JP2008296251A (ja) 2007-05-31 2008-12-11 Jfe Steel Kk 熱延金属帯の品質判定結果記録用コンピュータシステム、製造・品質実績管理および通過工程指示・管理用ビジコンシステムと、それらを用いた後工程での熱延金属帯の品質不良部切除方法
WO2019102614A1 (ja) 2017-11-27 2019-05-31 東芝三菱電機産業システム株式会社 鉄鋼プラントのメンテナンス支援装置
JP2020003871A (ja) 2018-06-25 2020-01-09 東芝三菱電機産業システム株式会社 鉄鋼プラント用監視作業支援システム

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CN1107229A (zh) * 1994-07-21 1995-08-23 本溪钢铁公司连轧厂 活套辊式带钢板形检测装置
JP2003141101A (ja) * 2001-11-06 2003-05-16 Hitachi Ltd 解析情報管理システム
JP3982428B2 (ja) * 2002-09-04 2007-09-26 株式会社日立製作所 欠陥情報解析方法およびその装置
JP2007072522A (ja) * 2005-09-02 2007-03-22 Mazda Motor Corp 品質向上支援システムおよびその制御方法、ならびに制御プログラム
JP5150302B2 (ja) * 2008-02-20 2013-02-20 株式会社東芝 超音波検査データ評価装置及び超音波検査データ評価方法
JP2010286880A (ja) * 2009-06-09 2010-12-24 Sharp Corp 不良要因推定システムおよび不良要因推定方法
CN102621147A (zh) * 2012-03-09 2012-08-01 武汉钢铁工程技术集团有限责任公司 钢板表面色差缺陷检测装置
JP6116445B2 (ja) * 2013-02-18 2017-04-19 株式会社神戸製鋼所 品質異常の原因推定支援システム
CN105983585B (zh) * 2015-01-29 2017-10-31 宝山钢铁股份有限公司 一种热轧带钢扣尾检测方法
CN104759488B (zh) * 2015-04-02 2017-02-22 山东钢铁股份有限公司 一种实现热轧带钢卷取侧导板过钢过程中分段控制的方法
CN104794491B (zh) * 2015-04-28 2018-01-23 重庆大学 基于预分类的模糊聚类钢板表面缺陷检测方法
KR101797383B1 (ko) * 2016-08-09 2017-11-13 주식회사 포스코 재질편차가 적고 표면품질이 우수한 고강도 열연강판 및 그 제조방법
JP2019016209A (ja) 2017-07-07 2019-01-31 株式会社東芝 診断装置、診断方法およびコンピュータプログラム
CN109420683B (zh) * 2017-08-31 2020-05-19 宝山钢铁股份有限公司 一种热连轧精轧带钢边沿降的控制方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001025819A (ja) 1999-07-14 2001-01-30 Hitachi Ltd 圧延機の異常診断方法および装置
JP2003223210A (ja) 2002-01-30 2003-08-08 Jfe Steel Kk 長尺製品の長手方向特性データ編集・保管方法
JP2007083300A (ja) 2005-09-26 2007-04-05 Toshiba Mitsubishi-Electric Industrial System Corp 材質記録装置
JP2008296251A (ja) 2007-05-31 2008-12-11 Jfe Steel Kk 熱延金属帯の品質判定結果記録用コンピュータシステム、製造・品質実績管理および通過工程指示・管理用ビジコンシステムと、それらを用いた後工程での熱延金属帯の品質不良部切除方法
WO2019102614A1 (ja) 2017-11-27 2019-05-31 東芝三菱電機産業システム株式会社 鉄鋼プラントのメンテナンス支援装置
JP2020003871A (ja) 2018-06-25 2020-01-09 東芝三菱電機産業システム株式会社 鉄鋼プラント用監視作業支援システム

Also Published As

Publication number Publication date
JP2021192915A (ja) 2021-12-23
CN113834828A (zh) 2021-12-24
KR20210152370A (ko) 2021-12-15
KR102419234B1 (ko) 2022-07-08

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