JP7327872B2 - コンピュータによる検査システム及び方法 - Google Patents

コンピュータによる検査システム及び方法 Download PDF

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JP7327872B2
JP7327872B2 JP2020520008A JP2020520008A JP7327872B2 JP 7327872 B2 JP7327872 B2 JP 7327872B2 JP 2020520008 A JP2020520008 A JP 2020520008A JP 2020520008 A JP2020520008 A JP 2020520008A JP 7327872 B2 JP7327872 B2 JP 7327872B2
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JP2021524014A (ja
JP2021524014A5 (https=
JPWO2019222255A5 (https=
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ガービス サルギアン，
ボグダン シー． マテル，
タラガイ オスキパー，
ミハイル シジンツェヴ，
ラケッシュ クマー，
スプン サマラセケラ，
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SRI International Inc
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SRI International Inc
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/01—Head-up displays
    • G02B27/017—Head mounted
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/01—Head-up displays
    • G02B27/0101—Head-up displays characterised by optical features
    • G02B2027/0138—Head-up displays characterised by optical features comprising image capture systems, e.g. camera
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/01—Head-up displays
    • G02B27/0101—Head-up displays characterised by optical features
    • G02B2027/014—Head-up displays characterised by optical features comprising information/image processing systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/01—Head-up displays
    • G02B27/0179—Display position adjusting means not related to the information to be displayed
    • G02B2027/0187—Display position adjusting means not related to the information to be displayed slaved to motion of at least a part of the body of the user, e.g. head, eye
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30181—Earth observation
    • G06T2207/30184—Infrastructure

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Processing Or Creating Images (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP2020520008A 2018-05-14 2019-05-14 コンピュータによる検査システム及び方法 Active JP7327872B2 (ja)

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US201862670985P 2018-05-14 2018-05-14
US62/670,985 2018-05-14
US16/412,067 2019-05-14
US16/412,067 US11270426B2 (en) 2018-05-14 2019-05-14 Computer aided inspection system and methods
PCT/US2019/032276 WO2019222255A1 (en) 2018-05-14 2019-05-14 Computer aided inspection system and methods

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JP2021524014A JP2021524014A (ja) 2021-09-09
JP2021524014A5 JP2021524014A5 (https=) 2022-04-04
JPWO2019222255A5 JPWO2019222255A5 (https=) 2022-04-04
JP7327872B2 true JP7327872B2 (ja) 2023-08-16

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WO2019222255A1 (en) 2019-11-21
JP2021524014A (ja) 2021-09-09
US20190347783A1 (en) 2019-11-14
US11270426B2 (en) 2022-03-08

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