JP7225644B2 - レンズ測定装置 - Google Patents

レンズ測定装置 Download PDF

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Publication number
JP7225644B2
JP7225644B2 JP2018184527A JP2018184527A JP7225644B2 JP 7225644 B2 JP7225644 B2 JP 7225644B2 JP 2018184527 A JP2018184527 A JP 2018184527A JP 2018184527 A JP2018184527 A JP 2018184527A JP 7225644 B2 JP7225644 B2 JP 7225644B2
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lens
optical system
light
reflected
lens surface
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JP2020052004A5 (https=
JP2020052004A (ja
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利朗 松本
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Nidek Co Ltd
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Nidek Co Ltd
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JP2018184527A 2018-09-28 2018-09-28 レンズ測定装置 Active JP7225644B2 (ja)

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JP2018184527A JP7225644B2 (ja) 2018-09-28 2018-09-28 レンズ測定装置

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JP2018184527A JP7225644B2 (ja) 2018-09-28 2018-09-28 レンズ測定装置

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JP2020052004A JP2020052004A (ja) 2020-04-02
JP2020052004A5 JP2020052004A5 (https=) 2021-10-14
JP7225644B2 true JP7225644B2 (ja) 2023-02-21

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005249487A (ja) 2004-03-02 2005-09-15 Seiko Epson Corp 表面形状測定方法及び眼鏡レンズの特性測定方法
JP3186077U (ja) 2012-05-01 2013-09-19 アップル インコーポレイテッド レンズ検査システム
US20160187222A1 (en) 2014-12-24 2016-06-30 Trioptics Gmbh Measurement of the positions of centres of curvature of optical surfaces of a single- or multi-lens optical system
JP2018515747A (ja) 2015-06-03 2018-06-14 ローデンシュトック ゲーエムベーハー 少なくとも部分的に透明な物体の表面に関連する表面データおよび／または測定データを決定するための方法および装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5340467B2 (https=) * 1973-08-31 1978-10-27

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005249487A (ja) 2004-03-02 2005-09-15 Seiko Epson Corp 表面形状測定方法及び眼鏡レンズの特性測定方法
JP3186077U (ja) 2012-05-01 2013-09-19 アップル インコーポレイテッド レンズ検査システム
US20160187222A1 (en) 2014-12-24 2016-06-30 Trioptics Gmbh Measurement of the positions of centres of curvature of optical surfaces of a single- or multi-lens optical system
JP2018515747A (ja) 2015-06-03 2018-06-14 ローデンシュトック ゲーエムベーハー 少なくとも部分的に透明な物体の表面に関連する表面データおよび／または測定データを決定するための方法および装置

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