JP7182243B2 - 分光測定装置及び分光測定方法 - Google Patents

分光測定装置及び分光測定方法 Download PDF

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JP7182243B2
JP7182243B2 JP2018112764A JP2018112764A JP7182243B2 JP 7182243 B2 JP7182243 B2 JP 7182243B2 JP 2018112764 A JP2018112764 A JP 2018112764A JP 2018112764 A JP2018112764 A JP 2018112764A JP 7182243 B2 JP7182243 B2 JP 7182243B2
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JP2019215262A5 (enExample
JP2019215262A (ja
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伊知郎 石丸
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Kagawa University NUC
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Kagawa University NUC
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Priority to JP2018112764A priority Critical patent/JP7182243B2/ja
Priority to EP25208942.0A priority patent/EP4657036A1/en
Priority to EP19820128.7A priority patent/EP3809103B1/en
Priority to PCT/JP2019/023519 priority patent/WO2019240227A1/ja
Priority to US17/121,100 priority patent/US11402270B2/en
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JP2018112764A 2018-06-13 2018-06-13 分光測定装置及び分光測定方法 Active JP7182243B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2018112764A JP7182243B2 (ja) 2018-06-13 2018-06-13 分光測定装置及び分光測定方法
EP25208942.0A EP4657036A1 (en) 2018-06-13 2019-06-13 Spectrometer and spectroscopic method
EP19820128.7A EP3809103B1 (en) 2018-06-13 2019-06-13 Spectrometer and spectroscopic method
PCT/JP2019/023519 WO2019240227A1 (ja) 2018-06-13 2019-06-13 分光測定装置及び分光測定方法
US17/121,100 US11402270B2 (en) 2018-06-13 2019-06-13 Spectral measurement device and spectral measurement method

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JP2018112764A JP7182243B2 (ja) 2018-06-13 2018-06-13 分光測定装置及び分光測定方法

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JP2019215262A5 JP2019215262A5 (enExample) 2021-05-27
JP7182243B2 true JP7182243B2 (ja) 2022-12-02

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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12235157B2 (en) 2019-09-03 2025-02-25 National University Corporation Kagawa University Spectrometry device
WO2023163105A1 (ja) * 2022-02-28 2023-08-31 翼 西藤 分光分析装置および干渉光形成機構
JP7240773B1 (ja) 2022-02-28 2023-03-16 翼 西藤 分光分析装置および干渉光形成機構
CN117629405B (zh) * 2023-11-27 2025-02-07 上海纪光光电科技有限公司 光谱仪

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012058068A (ja) 2010-09-08 2012-03-22 Kagawa Univ 分光計測装置及び分光計測方法
WO2012118079A1 (ja) 2011-02-28 2012-09-07 国立大学法人香川大学 光学特性測定装置及び光学特性測定方法
JP2012181060A (ja) 2011-02-28 2012-09-20 Kagawa Univ 分光特性測定装置及びその校正方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012058068A (ja) 2010-09-08 2012-03-22 Kagawa Univ 分光計測装置及び分光計測方法
WO2012118079A1 (ja) 2011-02-28 2012-09-07 国立大学法人香川大学 光学特性測定装置及び光学特性測定方法
JP2012181060A (ja) 2011-02-28 2012-09-20 Kagawa Univ 分光特性測定装置及びその校正方法

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Marja-Leena Junttila，Stationary Fourier-transform spectrometer，APPLIED OPTICS，1992年，Vol.31 No.21，pp.4106-4112
小島大輔，結像型ワンショットフーリエ分光イメージングによる高時間分解能計測，2011年度精密工学会春季大会学術講演会講演論文集，2011年，pp.1059-1060

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