JP2019215262A5 - - Google Patents

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Publication number
JP2019215262A5
JP2019215262A5 JP2018112764A JP2018112764A JP2019215262A5 JP 2019215262 A5 JP2019215262 A5 JP 2019215262A5 JP 2018112764 A JP2018112764 A JP 2018112764A JP 2018112764 A JP2018112764 A JP 2018112764A JP 2019215262 A5 JP2019215262 A5 JP 2019215262A5
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JP
Japan
Prior art keywords
luminous flux
light
incident
parallel
light receiving
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JP2018112764A
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English (en)
Japanese (ja)
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JP7182243B2 (ja
JP2019215262A (ja
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Priority claimed from JP2018112764A external-priority patent/JP7182243B2/ja
Priority to JP2018112764A priority Critical patent/JP7182243B2/ja
Priority to US17/121,100 priority patent/US11402270B2/en
Priority to EP19820128.7A priority patent/EP3809103B1/en
Priority to PCT/JP2019/023519 priority patent/WO2019240227A1/ja
Priority to EP25208942.0A priority patent/EP4657036A1/en
Publication of JP2019215262A publication Critical patent/JP2019215262A/ja
Publication of JP2019215262A5 publication Critical patent/JP2019215262A5/ja
Publication of JP7182243B2 publication Critical patent/JP7182243B2/ja
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JP2018112764A 2018-06-13 2018-06-13 分光測定装置及び分光測定方法 Active JP7182243B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2018112764A JP7182243B2 (ja) 2018-06-13 2018-06-13 分光測定装置及び分光測定方法
EP25208942.0A EP4657036A1 (en) 2018-06-13 2019-06-13 Spectrometer and spectroscopic method
EP19820128.7A EP3809103B1 (en) 2018-06-13 2019-06-13 Spectrometer and spectroscopic method
PCT/JP2019/023519 WO2019240227A1 (ja) 2018-06-13 2019-06-13 分光測定装置及び分光測定方法
US17/121,100 US11402270B2 (en) 2018-06-13 2019-06-13 Spectral measurement device and spectral measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018112764A JP7182243B2 (ja) 2018-06-13 2018-06-13 分光測定装置及び分光測定方法

Publications (3)

Publication Number Publication Date
JP2019215262A JP2019215262A (ja) 2019-12-19
JP2019215262A5 true JP2019215262A5 (enExample) 2021-05-27
JP7182243B2 JP7182243B2 (ja) 2022-12-02

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JP2018112764A Active JP7182243B2 (ja) 2018-06-13 2018-06-13 分光測定装置及び分光測定方法

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JP (1) JP7182243B2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12235157B2 (en) 2019-09-03 2025-02-25 National University Corporation Kagawa University Spectrometry device
WO2023163105A1 (ja) * 2022-02-28 2023-08-31 翼 西藤 分光分析装置および干渉光形成機構
JP7240773B1 (ja) 2022-02-28 2023-03-16 翼 西藤 分光分析装置および干渉光形成機構
CN117629405B (zh) * 2023-11-27 2025-02-07 上海纪光光电科技有限公司 光谱仪

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5317298B2 (ja) * 2010-09-08 2013-10-16 国立大学法人 香川大学 分光計測装置及び分光計測方法
JP5648961B2 (ja) * 2011-02-28 2015-01-07 国立大学法人 香川大学 分光特性測定装置及びその校正方法
KR101590241B1 (ko) * 2011-02-28 2016-01-29 고쿠리츠다이가쿠호우징 카가와다이가쿠 광학특성 측정장치 및 광학특성 측정방법

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