JP7181283B2 - モノリシックシンチレータを有する多層検出器 - Google Patents

モノリシックシンチレータを有する多層検出器 Download PDF

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JP7181283B2
JP7181283B2 JP2020511809A JP2020511809A JP7181283B2 JP 7181283 B2 JP7181283 B2 JP 7181283B2 JP 2020511809 A JP2020511809 A JP 2020511809A JP 2020511809 A JP2020511809 A JP 2020511809A JP 7181283 B2 JP7181283 B2 JP 7181283B2
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scintillator
monolithic
photosensors
region
ray radiation
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Japanese (ja)
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JP2020531183A (ja
JP2020531183A5 (enExample
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ブッカー ロジャー ステッドマン
ワルター リュッタン
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2020511809A 2017-08-31 2018-08-20 モノリシックシンチレータを有する多層検出器 Active JP7181283B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022146094A JP2022174229A (ja) 2017-08-31 2022-09-14 モノリシックシンチレータを有する多層検出器

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762552563P 2017-08-31 2017-08-31
US62/552,563 2017-08-31
PCT/EP2018/072383 WO2019042797A1 (en) 2017-08-31 2018-08-20 MULTILAYER MONOLITHIC SCINTILLATOR DETECTOR

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JP2020531183A JP2020531183A (ja) 2020-11-05
JP2020531183A5 JP2020531183A5 (enExample) 2021-09-30
JP7181283B2 true JP7181283B2 (ja) 2022-11-30

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JP2022146094A Pending JP2022174229A (ja) 2017-08-31 2022-09-14 モノリシックシンチレータを有する多層検出器

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US (1) US11181488B2 (enExample)
EP (1) EP3676639B1 (enExample)
JP (2) JP7181283B2 (enExample)
CN (1) CN111133338B (enExample)
WO (1) WO2019042797A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022174229A (ja) * 2017-08-31 2022-11-22 コーニンクレッカ フィリップス エヌ ヴェ モノリシックシンチレータを有する多層検出器

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019226859A1 (en) 2018-05-23 2019-11-28 The Research Foundation For The State University Of New York Flat panel x-ray imager with scintillating glass substrate
CN114076972B (zh) * 2020-08-19 2025-05-27 清华大学 探测准直单元、探测装置及spect成像系统
CN114966813A (zh) * 2022-05-26 2022-08-30 西安交通大学 一种可用于快中子束流大面积成像的阵列型结构探测器
WO2023235270A1 (en) * 2022-05-31 2023-12-07 University Of Washington Coded detection for single photon emission computed tomography
CN114878604A (zh) * 2022-07-11 2022-08-09 芯晟捷创光电科技(常州)有限公司 一种射线探测器、探测方法和探测系统
CN115462821B (zh) * 2022-10-18 2025-03-21 明峰医疗系统股份有限公司 Ct探测器模块

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JP2013246156A (ja) 2012-05-29 2013-12-09 Natl Inst Of Radiological Sciences ３次元放射線位置検出器
JP2017072573A (ja) 2015-01-30 2017-04-13 浜松ホトニクス株式会社 放射線検出器
WO2017067846A1 (en) 2015-10-21 2017-04-27 Koninklijke Philips N.V. Radiation detector for combined detection of low-energy radiation quanta and high-energy radiation quanta

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JP5268633B2 (ja) * 2005-04-26 2013-08-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ スペクトルｃｔのための検出器アレイ
CN101166469B (zh) * 2005-04-26 2015-05-06 皇家飞利浦电子股份有限公司 用于光谱ct的双层探测器
JP2012509492A (ja) 2008-11-18 2012-04-19 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ スペクトルイメージング検出器
CN101937095B (zh) * 2009-06-30 2012-05-09 同方威视技术股份有限公司 双能x射线探测器及双能x射线探测器阵列装置
US9040924B2 (en) * 2009-10-27 2015-05-26 University Of Washington Through Its Center For Commercialization Optical-interface patterning for radiation detector crystals
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BR112014012832A2 (pt) 2011-12-02 2017-06-13 Koninklijke Philips Nv aparelho de detecção para detectar radiação, sistema de formação de imagens para formar a imagem de um objeto, método de detecção para detectar radiação, método de formação de imagens para formar a imagem de um objeto, programa de computador de detecção para detectar radiação, e programa de computador de formação de imagens para formar a imagem de um objeto
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JP2013246156A (ja) 2012-05-29 2013-12-09 Natl Inst Of Radiological Sciences ３次元放射線位置検出器
JP2017072573A (ja) 2015-01-30 2017-04-13 浜松ホトニクス株式会社 放射線検出器
WO2017067846A1 (en) 2015-10-21 2017-04-27 Koninklijke Philips N.V. Radiation detector for combined detection of low-energy radiation quanta and high-energy radiation quanta

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Publication number Priority date Publication date Assignee Title
JP2022174229A (ja) * 2017-08-31 2022-11-22 コーニンクレッカ フィリップス エヌ ヴェ モノリシックシンチレータを有する多層検出器

Also Published As

Publication number Publication date
JP2020531183A (ja) 2020-11-05
JP2022174229A (ja) 2022-11-22
EP3676639A1 (en) 2020-07-08
US11181488B2 (en) 2021-11-23
EP3676639B1 (en) 2024-04-24
CN111133338B (zh) 2024-06-11
CN111133338A (zh) 2020-05-08
WO2019042797A1 (en) 2019-03-07
US20210072167A1 (en) 2021-03-11

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