JP2020531183A5 - - Google Patents

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Publication number
JP2020531183A5
JP2020531183A5 JP2020511809A JP2020511809A JP2020531183A5 JP 2020531183 A5 JP2020531183 A5 JP 2020531183A5 JP 2020511809 A JP2020511809 A JP 2020511809A JP 2020511809 A JP2020511809 A JP 2020511809A JP 2020531183 A5 JP2020531183 A5 JP 2020531183A5
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JP
Japan
Prior art keywords
scintillator
monolithic
computed tomography
region
ray radiation
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JP2020511809A
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English (en)
Japanese (ja)
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JP2020531183A (ja
JP7181283B2 (ja
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Priority claimed from PCT/EP2018/072383 external-priority patent/WO2019042797A1/en
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Priority to JP2022146094A priority Critical patent/JP2022174229A/ja
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JP2020511809A 2017-08-31 2018-08-20 モノリシックシンチレータを有する多層検出器 Active JP7181283B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022146094A JP2022174229A (ja) 2017-08-31 2022-09-14 モノリシックシンチレータを有する多層検出器

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762552563P 2017-08-31 2017-08-31
US62/552,563 2017-08-31
PCT/EP2018/072383 WO2019042797A1 (en) 2017-08-31 2018-08-20 MULTILAYER MONOLITHIC SCINTILLATOR DETECTOR

Related Child Applications (1)

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JP2022146094A Division JP2022174229A (ja) 2017-08-31 2022-09-14 モノリシックシンチレータを有する多層検出器

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JP2020531183A JP2020531183A (ja) 2020-11-05
JP2020531183A5 true JP2020531183A5 (enExample) 2021-09-30
JP7181283B2 JP7181283B2 (ja) 2022-11-30

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JP2020511809A Active JP7181283B2 (ja) 2017-08-31 2018-08-20 モノリシックシンチレータを有する多層検出器
JP2022146094A Pending JP2022174229A (ja) 2017-08-31 2022-09-14 モノリシックシンチレータを有する多層検出器

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US (1) US11181488B2 (enExample)
EP (1) EP3676639B1 (enExample)
JP (2) JP7181283B2 (enExample)
CN (1) CN111133338B (enExample)
WO (1) WO2019042797A1 (enExample)

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WO2019042797A1 (en) * 2017-08-31 2019-03-07 Koninklijke Philips N.V. MULTILAYER MONOLITHIC SCINTILLATOR DETECTOR
WO2019226859A1 (en) 2018-05-23 2019-11-28 The Research Foundation For The State University Of New York Flat panel x-ray imager with scintillating glass substrate
CN114076972B (zh) * 2020-08-19 2025-05-27 清华大学 探测准直单元、探测装置及spect成像系统
CN114966813A (zh) * 2022-05-26 2022-08-30 西安交通大学 一种可用于快中子束流大面积成像的阵列型结构探测器
WO2023235270A1 (en) * 2022-05-31 2023-12-07 University Of Washington Coded detection for single photon emission computed tomography
CN114878604A (zh) * 2022-07-11 2022-08-09 芯晟捷创光电科技(常州)有限公司 一种射线探测器、探测方法和探测系统
CN115462821B (zh) * 2022-10-18 2025-03-21 明峰医疗系统股份有限公司 Ct探测器模块

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JP5268633B2 (ja) * 2005-04-26 2013-08-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ スペクトルctのための検出器アレイ
CN101166469B (zh) * 2005-04-26 2015-05-06 皇家飞利浦电子股份有限公司 用于光谱ct的双层探测器
JP2012509492A (ja) 2008-11-18 2012-04-19 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ スペクトルイメージング検出器
CN101937095B (zh) * 2009-06-30 2012-05-09 同方威视技术股份有限公司 双能x射线探测器及双能x射线探测器阵列装置
US9040924B2 (en) * 2009-10-27 2015-05-26 University Of Washington Through Its Center For Commercialization Optical-interface patterning for radiation detector crystals
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WO2012104775A2 (en) * 2011-02-03 2012-08-09 Koninklijke Philips Electronics N.V. Single or multi-energy vertical radiation sensitive detectors
EP2689269B1 (en) * 2011-03-24 2015-05-13 Koninklijke Philips N.V. Production of a spectral imaging detector
US9411057B2 (en) * 2011-04-01 2016-08-09 Medtronic Navigation, Inc. X-ray imaging system and method
WO2012137160A2 (en) * 2011-04-06 2012-10-11 Koninklijke Philips Electronics N.V. Imaging detector
BR112014012832A2 (pt) 2011-12-02 2017-06-13 Koninklijke Philips Nv aparelho de detecção para detectar radiação, sistema de formação de imagens para formar a imagem de um objeto, método de detecção para detectar radiação, método de formação de imagens para formar a imagem de um objeto, programa de computador de detecção para detectar radiação, e programa de computador de formação de imagens para formar a imagem de um objeto
US9012857B2 (en) * 2012-05-07 2015-04-21 Koninklijke Philips N.V. Multi-layer horizontal computed tomography (CT) detector array with at least one thin photosensor array layer disposed between at least two scintillator array layers
JP2013246156A (ja) * 2012-05-29 2013-12-09 Natl Inst Of Radiological Sciences 3次元放射線位置検出器
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JP6704737B2 (ja) * 2015-01-30 2020-06-03 浜松ホトニクス株式会社 放射線検出器
WO2017067846A1 (en) * 2015-10-21 2017-04-27 Koninklijke Philips N.V. Radiation detector for combined detection of low-energy radiation quanta and high-energy radiation quanta
WO2019042797A1 (en) * 2017-08-31 2019-03-07 Koninklijke Philips N.V. MULTILAYER MONOLITHIC SCINTILLATOR DETECTOR

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