JP7172537B2 - イメージング分析装置 - Google Patents

イメージング分析装置 Download PDF

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Publication number
JP7172537B2
JP7172537B2 JP2018231434A JP2018231434A JP7172537B2 JP 7172537 B2 JP7172537 B2 JP 7172537B2 JP 2018231434 A JP2018231434 A JP 2018231434A JP 2018231434 A JP2018231434 A JP 2018231434A JP 7172537 B2 JP7172537 B2 JP 7172537B2
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control
measurement
region
analysis
data
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JP2018231434A
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Japanese (ja)
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JP2020094854A5 (https=
JP2020094854A (ja
Inventor
哲朗 古田
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2018231434A priority Critical patent/JP7172537B2/ja
Priority to US16/671,237 priority patent/US11062456B2/en
Priority to CN201911148975.8A priority patent/CN111307920B/zh
Publication of JP2020094854A publication Critical patent/JP2020094854A/ja
Publication of JP2020094854A5 publication Critical patent/JP2020094854A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/62—Analysis of geometric attributes of area, perimeter, diameter or volume
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T9/00—Image coding
    • G06T9/005—Statistical coding, e.g. Huffman, run length coding
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T9/00—Image coding
    • G06T9/20—Contour coding, e.g. using detection of edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30004—Biomedical image processing
    • G06T2207/30024—Cell structures in vitro; Tissue sections in vitro
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30004—Biomedical image processing
    • G06T2207/30096—Tumor; Lesion

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Multimedia (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Toxicology (AREA)
  • Geometry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2018231434A 2018-12-11 2018-12-11 イメージング分析装置 Active JP7172537B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2018231434A JP7172537B2 (ja) 2018-12-11 2018-12-11 イメージング分析装置
US16/671,237 US11062456B2 (en) 2018-12-11 2019-11-01 Imaging analyzer
CN201911148975.8A CN111307920B (zh) 2018-12-11 2019-11-21 成像分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018231434A JP7172537B2 (ja) 2018-12-11 2018-12-11 イメージング分析装置

Publications (3)

Publication Number Publication Date
JP2020094854A JP2020094854A (ja) 2020-06-18
JP2020094854A5 JP2020094854A5 (https=) 2021-04-30
JP7172537B2 true JP7172537B2 (ja) 2022-11-16

Family

ID=70971841

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018231434A Active JP7172537B2 (ja) 2018-12-11 2018-12-11 イメージング分析装置

Country Status (3)

Country Link
US (1) US11062456B2 (https=)
JP (1) JP7172537B2 (https=)
CN (1) CN111307920B (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6901038B1 (ja) 2020-05-29 2021-07-14 Ｉ−Ｐｅｘ株式会社 匂い検出装置、匂い検出方法及びプログラム
WO2022123968A1 (ja) 2020-12-07 2022-06-16 株式会社堀場製作所 ラマン分析用プレート、ラマン分析装置、分析システム、及びラマン分析方法
CN114040030B (zh) * 2021-11-18 2023-11-24 深圳智慧林网络科技有限公司 一种基于预设规则的数据压缩方法、装置、设备和介质

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002162366A (ja) 2000-11-27 2002-06-07 Hitachi Ltd 欠陥検査方法とその装置、及び欠陥の自動分類のための欠陥位置検出方法
JP2007127485A (ja) 2005-11-02 2007-05-24 Shimadzu Corp イメージ質量分析装置
JP2009025268A (ja) 2007-07-24 2009-02-05 Shimadzu Corp 質量分析装置
WO2010100675A1 (ja) 2009-03-05 2010-09-10 株式会社島津製作所 質量分析装置
JP2012038459A (ja) 2010-08-04 2012-02-23 Shimadzu Corp 質量分析装置
JP2014215043A (ja) 2013-04-22 2014-11-17 株式会社島津製作所 イメージング質量分析データ処理方法及びイメージング質量分析装置
JP2015146288A (ja) 2014-02-04 2015-08-13 日本電子株式会社 質量分析装置
WO2016098247A1 (ja) 2014-12-19 2016-06-23 株式会社島津製作所 分析装置
JP2016223975A (ja) 2015-06-02 2016-12-28 株式会社メック 欠陥検査装置、及び欠陥検査方法
WO2018037471A1 (ja) 2016-08-23 2018-03-01 三菱電機株式会社 放射パネルおよび空調システム

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05120427A (ja) * 1991-10-25 1993-05-18 Dainippon Printing Co Ltd 圧縮画像データからの輪郭線抽出方法
JP3321197B2 (ja) * 1992-06-22 2002-09-03 オリンパス光学工業株式会社 顕微鏡静止画像伝送システム
DE10236344B4 (de) * 2002-08-08 2007-03-29 Bruker Daltonik Gmbh Ionisieren an Atmosphärendruck für massenspektrometrische Analysen
JP5556695B2 (ja) * 2011-02-16 2014-07-23 株式会社島津製作所 質量分析データ処理方法及び該方法を用いた質量分析装置
CN106104452B (zh) * 2014-03-05 2020-06-19 株式会社岛津制作所 信息显示处理装置以及信息显示处理装置的控制方法
CN107850567A (zh) * 2015-07-01 2018-03-27 株式会社岛津制作所 数据处理装置
US9748972B2 (en) * 2015-09-14 2017-08-29 Leco Corporation Lossless data compression
CN109642889B (zh) 2016-08-24 2021-08-10 株式会社岛津制作所 成像质谱分析装置

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002162366A (ja) 2000-11-27 2002-06-07 Hitachi Ltd 欠陥検査方法とその装置、及び欠陥の自動分類のための欠陥位置検出方法
JP2007127485A (ja) 2005-11-02 2007-05-24 Shimadzu Corp イメージ質量分析装置
JP2009025268A (ja) 2007-07-24 2009-02-05 Shimadzu Corp 質量分析装置
WO2010100675A1 (ja) 2009-03-05 2010-09-10 株式会社島津製作所 質量分析装置
JP2012038459A (ja) 2010-08-04 2012-02-23 Shimadzu Corp 質量分析装置
JP2014215043A (ja) 2013-04-22 2014-11-17 株式会社島津製作所 イメージング質量分析データ処理方法及びイメージング質量分析装置
JP2015146288A (ja) 2014-02-04 2015-08-13 日本電子株式会社 質量分析装置
WO2016098247A1 (ja) 2014-12-19 2016-06-23 株式会社島津製作所 分析装置
JP2016223975A (ja) 2015-06-02 2016-12-28 株式会社メック 欠陥検査装置、及び欠陥検査方法
WO2018037471A1 (ja) 2016-08-23 2018-03-01 三菱電機株式会社 放射パネルおよび空調システム

Also Published As

Publication number Publication date
US11062456B2 (en) 2021-07-13
US20200184650A1 (en) 2020-06-11
JP2020094854A (ja) 2020-06-18
CN111307920A (zh) 2020-06-19
CN111307920B (zh) 2023-04-07

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