JP7118133B2 - 光子カウントコンピュータ断層撮影のための薄型散乱防止及び電荷共有防止グリッド、当該グリッドを有する撮像装置、当該グリッドの製造方法 - Google Patents

光子カウントコンピュータ断層撮影のための薄型散乱防止及び電荷共有防止グリッド、当該グリッドを有する撮像装置、当該グリッドの製造方法 Download PDF

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JP7118133B2
JP7118133B2 JP2020507557A JP2020507557A JP7118133B2 JP 7118133 B2 JP7118133 B2 JP 7118133B2 JP 2020507557 A JP2020507557 A JP 2020507557A JP 2020507557 A JP2020507557 A JP 2020507557A JP 7118133 B2 JP7118133 B2 JP 7118133B2
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ハイナー デア
ローランド プロクサ
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Koninklijke Philips NV
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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Molecular Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Pulmonology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2020507557A 2017-08-14 2018-08-14 光子カウントコンピュータ断層撮影のための薄型散乱防止及び電荷共有防止グリッド、当該グリッドを有する撮像装置、当該グリッドの製造方法 Expired - Fee Related JP7118133B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17186194.1A EP3444826A1 (en) 2017-08-14 2017-08-14 Low profile anti scatter and anti charge sharing grid for photon counting computed tomography
EP17186194.1 2017-08-14
PCT/EP2018/072018 WO2019034650A1 (en) 2017-08-14 2018-08-14 ANTI-DISPERSAL GRID AND LOW PROFILE LOAD DISPERSION FOR TOMODENSITOMETRY WITH PHOTON COUNTING

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JP2020530903A JP2020530903A (ja) 2020-10-29
JP2020530903A5 JP2020530903A5 (cg-RX-API-DMAC7.html) 2021-09-24
JP7118133B2 true JP7118133B2 (ja) 2022-08-15

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US (1) US11152129B2 (cg-RX-API-DMAC7.html)
EP (2) EP3444826A1 (cg-RX-API-DMAC7.html)
JP (1) JP7118133B2 (cg-RX-API-DMAC7.html)
CN (1) CN111133532B (cg-RX-API-DMAC7.html)
WO (1) WO2019034650A1 (cg-RX-API-DMAC7.html)

Families Citing this family (1)

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Publication number Priority date Publication date Assignee Title
US11320545B2 (en) * 2020-07-07 2022-05-03 GE Precision Healthcare LLC Systems and methods for improved medical imaging

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008506945A (ja) 2004-07-14 2008-03-06 オーボテック メディカル ソリューションズ リミティド 放射線検出器ヘッド
US20130168567A1 (en) 2011-12-28 2013-07-04 General Electric Company Collimator for a pixelated detector
JP2016137097A (ja) 2015-01-28 2016-08-04 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線検出器及び放射線断層撮影装置
JP2017125692A (ja) 2016-01-12 2017-07-20 株式会社日立製作所 放射線撮像装置

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4875227A (en) * 1986-12-06 1989-10-17 Rossi Remo J Anti-scatter grid system
FR2830976B1 (fr) 2001-10-17 2004-01-09 Ge Med Sys Global Tech Co Llc Grilles anti-diffusantes a faible attenuation et procede de fabrication de telles grilles
DE10202987A1 (de) 2002-01-26 2003-07-31 Philips Intellectual Property Gitter zur Absorption von Röntgenstrahlung
SE524731C2 (sv) * 2002-06-07 2004-09-21 Xcounter Ab Metod och apparat för detektering av joniserande strålning
US7072446B2 (en) 2003-05-13 2006-07-04 Analogic Corporation Method for making X-ray anti-scatter grid
DE10354808A1 (de) * 2003-11-21 2005-06-30 Siemens Ag Verfahren zur Abschattung von Streustrahlung vor einem Detektorarray
JP2008510132A (ja) 2004-08-12 2008-04-03 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 放射線検出器用の抗散乱グリッド
WO2008059425A2 (en) * 2006-11-17 2008-05-22 Koninklijke Philips Electronics N.V. Radiation detector with multiple electrodes on a sensitive layer
US7486764B2 (en) * 2007-01-23 2009-02-03 General Electric Company Method and apparatus to reduce charge sharing in pixellated energy discriminating detectors
US20090008564A1 (en) * 2007-07-05 2009-01-08 Cmt Medical Technologies Ltd. Modular X-Ray Detector With Single Photon Counting, Energy Sensitivity And Integration Capabilities
DE102009031481A1 (de) * 2008-07-03 2010-02-11 Ohnesorge, Frank, Dr. Konzept für optische (Fernfeld-/Fresnel-Regime aber auch Nahfeld-) Mikroskopie/Spektroskopie unterhalb/jenseits des Beugungslimits - Anwendungen für optisches (aber auch elektronisches) schnelles Auslesen von ultrakleinen Speicherzellen in Form von lumineszierenden Quantentrögen - sowie in der Biologie/Kristallographie
WO2010010607A1 (ja) 2008-07-22 2010-01-28 株式会社 島津製作所 散乱線除去グリッドの製造方法
WO2010018617A1 (ja) 2008-08-11 2010-02-18 株式会社島津製作所 放射線グリッドおよびそれを備えた放射線撮影装置
US8183535B2 (en) * 2009-02-11 2012-05-22 Mats Danielsson Silicon detector assembly for X-ray imaging
WO2013004574A1 (en) * 2011-07-04 2013-01-10 Koninklijke Philips Electronics N.V Phase contrast imaging apparatus
IN2014CN01055A (cg-RX-API-DMAC7.html) * 2011-08-30 2015-04-10 Koninkl Philips Nv
US9135728B2 (en) * 2012-04-04 2015-09-15 General Electric Company System and method for multi-energy computed tomography imaging
CN104569002B (zh) * 2013-10-23 2018-04-27 北京纳米维景科技有限公司 基于光子计数的x射线相衬成像系统、方法及其设备
EP3178089B1 (en) * 2014-08-05 2018-01-10 Koninklijke Philips N.V. Grating device for an x-ray imaging device
US20160206255A1 (en) * 2015-01-16 2016-07-21 Kabushiki Kaisha Toshiba Hybrid passive/active multi-layer energy discriminating photon-counting detector
WO2016209138A1 (en) * 2015-06-26 2016-12-29 Prismatic Sensors Ab Scatter estimation and/or correction in x-ray imaging
WO2017089363A1 (en) * 2015-11-26 2017-06-01 Koninklijke Philips N.V. Dark current compensation
US10444381B2 (en) * 2015-12-03 2019-10-15 Koninklijke Philips N.V. Radiation detector and imaging apparatus
EP3545534B1 (en) * 2016-11-24 2020-04-29 Koninklijke Philips N.V. Anti-scatter grid assembly for detector arrangement
US10222489B2 (en) * 2017-03-13 2019-03-05 General Electric Company Pixel-design for use in a radiation detector
WO2018194937A1 (en) * 2017-04-17 2018-10-25 The Regents Of The University Of Colorado, A Body Corporate A hybrid flat panel detector for cone beam ct systems
US10779778B2 (en) * 2017-05-08 2020-09-22 General Electric Company Reference detector elements in conjunction with an anti-scatter collimator
US10610191B2 (en) * 2017-07-06 2020-04-07 Prismatic Sensors Ab Managing geometric misalignment in x-ray imaging systems
CN113167917B (zh) * 2018-11-19 2024-03-12 棱镜传感器公司 使用光子计数事件进行相衬成像的x射线成像系统

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008506945A (ja) 2004-07-14 2008-03-06 オーボテック メディカル ソリューションズ リミティド 放射線検出器ヘッド
US20130168567A1 (en) 2011-12-28 2013-07-04 General Electric Company Collimator for a pixelated detector
JP2016137097A (ja) 2015-01-28 2016-08-04 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線検出器及び放射線断層撮影装置
JP2017125692A (ja) 2016-01-12 2017-07-20 株式会社日立製作所 放射線撮像装置

Also Published As

Publication number Publication date
US11152129B2 (en) 2021-10-19
WO2019034650A1 (en) 2019-02-21
EP3444826A1 (en) 2019-02-20
CN111133532A (zh) 2020-05-08
JP2020530903A (ja) 2020-10-29
CN111133532B (zh) 2023-11-17
EP3669381A1 (en) 2020-06-24
US20200251236A1 (en) 2020-08-06

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