JP7105254B2 - 波面技術に基づく非球面レンズ偏心検出装置及びその検出方法 - Google Patents

波面技術に基づく非球面レンズ偏心検出装置及びその検出方法 Download PDF

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JP7105254B2
JP7105254B2 JP2019565415A JP2019565415A JP7105254B2 JP 7105254 B2 JP7105254 B2 JP 7105254B2 JP 2019565415 A JP2019565415 A JP 2019565415A JP 2019565415 A JP2019565415 A JP 2019565415A JP 7105254 B2 JP7105254 B2 JP 7105254B2
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lens
image
measured
center position
light source
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JPWO2020103221A5 (https=
JP2021510412A (ja
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国華 史
益 何
峰 高
利娜 ▲しん▼
欣 張
文 孔
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Suzhou Institute of Biomedical Engineering and Technology of CAS
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
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  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2019565415A 2018-11-22 2018-12-12 波面技術に基づく非球面レンズ偏心検出装置及びその検出方法 Active JP7105254B2 (ja)

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Application Number Priority Date Filing Date Title
CN201811399344.9A CN109580179B (zh) 2018-11-22 2018-11-22 基于波前技术的非球面透镜偏心检测装置及其检测方法
CN201811399344.9 2018-11-22
PCT/CN2018/120449 WO2020103221A1 (zh) 2018-11-22 2018-12-12 基于波前技术的非球面透镜偏心检测装置及其检测方法

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JP2021510412A JP2021510412A (ja) 2021-04-22
JPWO2020103221A5 JPWO2020103221A5 (https=) 2022-02-28
JP2021510412A5 JP2021510412A5 (https=) 2022-02-28
JP7105254B2 true JP7105254B2 (ja) 2022-07-22

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US (1) US11506567B2 (https=)
EP (1) EP3677893B1 (https=)
JP (1) JP7105254B2 (https=)
KR (1) KR102292329B1 (https=)
CN (1) CN109580179B (https=)
WO (1) WO2020103221A1 (https=)

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CN109990986B (zh) * 2019-05-09 2020-11-24 长春理工大学 一种用于单轴光学系统光轴的标定方法及装置
CN110736610B (zh) * 2019-10-22 2021-08-20 歌尔光学科技有限公司 测量光学中心偏移的方法、装置、存储介质及深度相机
CN110793754A (zh) * 2019-11-01 2020-02-14 中国科学院光电技术研究所 一种基于相移调制的拼接式望远镜系统偏心误差探测方法
CN111044260B (zh) * 2019-12-27 2021-05-18 中国科学院长春光学精密机械与物理研究所 显微物镜畸变测试装置及测试方法
CN112797961B (zh) * 2020-12-30 2022-03-04 中国工程物理研究院激光聚变研究中心 光学准直系统
US20250180429A1 (en) * 2022-02-28 2025-06-05 Engelbert Hofbauer Method for measuring optical lens surfaces
CN114459395B (zh) * 2022-03-28 2023-09-22 深圳众庭联合科技有限公司 一种平面平晶检定装置及检定方法
CN114778079B (zh) * 2022-03-31 2024-01-23 宜宾市极米光电有限公司 一种偏心仪及偏心检测方法
CN115638741A (zh) * 2022-10-11 2023-01-24 淮安艾利光电仪器有限公司 一种非球面镜片面型检测系统
CN115962922B (zh) * 2023-01-18 2025-04-22 中国科学院长春光学精密机械与物理研究所 基于光纤互联的高精度大行程光学间隔测量装置及方法
CN116295096B (zh) * 2023-02-10 2025-08-26 北京华卓精科科技股份有限公司 器件面形检测方法、装置及系统
CN116399561A (zh) * 2023-03-31 2023-07-07 中国科学院长春光学精密机械与物理研究所 子孔径拼接光谱定标检测装置及其检测方法
CN120740775A (zh) * 2025-08-28 2025-10-03 中国工程物理研究院应用电子学研究所 一种宽光谱波前和光轴探测装置以及使用方法

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JP2008096233A (ja) 2006-10-11 2008-04-24 Pentax Corp 光学部材検査装置
JP2011196954A (ja) 2010-03-23 2011-10-06 Fujifilm Corp 非球面体測定方法および装置
JP2014115077A (ja) 2011-03-31 2014-06-26 Fujifilm Corp レンズの面ズレ・面倒れを測定するレンズ測定方法及び装置

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TW283201B (https=) * 1993-08-13 1996-08-11 Ricoh Kk
JP2000193441A (ja) * 1998-12-25 2000-07-14 Canon Inc 偏心測定方法及び偏心測定装置
JP2005201703A (ja) 2004-01-14 2005-07-28 Konica Minolta Opto Inc 干渉測定方法及び干渉測定システム
CN100582715C (zh) * 2006-12-25 2010-01-20 鸿富锦精密工业（深圳）有限公司 镜片偏心检测系统及方法
JP4880513B2 (ja) 2007-03-29 2012-02-22 富士フイルム株式会社 非球面レンズの面ずれ測定方法および装置
JP5084327B2 (ja) 2007-04-04 2012-11-28 オリンパス株式会社 偏心検査装置及び偏心調整装置
CN101226344B (zh) * 2008-01-31 2010-06-02 上海微电子装备有限公司 测量光学系统参数的测量装置及其测量方法
JP5988643B2 (ja) * 2012-03-26 2016-09-07 キヤノン株式会社 計測装置、計測方法及び光学部品の製造方法
CN102944194B (zh) * 2012-11-21 2015-04-01 中国科学院光电技术研究所 一种高精度高次非球面透镜偏心测定系统及方法
JP5925972B2 (ja) 2012-11-30 2016-05-25 キューイーディー・テクノロジーズ・インターナショナル・インコーポレーテッド 一体型の波面センサおよび粗面計
CN207540510U (zh) * 2017-12-13 2018-06-26 广东技术师范学院 一种用于检测透镜中心偏离的装置

Patent Citations (3)

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Publication number Priority date Publication date Assignee Title
JP2008096233A (ja) 2006-10-11 2008-04-24 Pentax Corp 光学部材検査装置
JP2011196954A (ja) 2010-03-23 2011-10-06 Fujifilm Corp 非球面体測定方法および装置
JP2014115077A (ja) 2011-03-31 2014-06-26 Fujifilm Corp レンズの面ズレ・面倒れを測定するレンズ測定方法及び装置

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EP3677893A4 (en) 2020-08-19
JP2021510412A (ja) 2021-04-22
CN109580179B (zh) 2021-01-08
EP3677893B1 (en) 2021-06-30
US20210270694A1 (en) 2021-09-02
KR102292329B1 (ko) 2021-08-25
CN109580179A (zh) 2019-04-05
US11506567B2 (en) 2022-11-22
WO2020103221A1 (zh) 2020-05-28
EP3677893A1 (en) 2020-07-08
KR20200063099A (ko) 2020-06-04

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