JP7086492B2 - 電圧検出装置 - Google Patents
電圧検出装置 Download PDFInfo
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- JP7086492B2 JP7086492B2 JP2020020384A JP2020020384A JP7086492B2 JP 7086492 B2 JP7086492 B2 JP 7086492B2 JP 2020020384 A JP2020020384 A JP 2020020384A JP 2020020384 A JP2020020384 A JP 2020020384A JP 7086492 B2 JP7086492 B2 JP 7086492B2
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- 230000003321 amplification Effects 0.000 claims description 113
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 113
- 238000001514 detection method Methods 0.000 claims description 41
- 239000003990 capacitor Substances 0.000 description 63
- 230000006866 deterioration Effects 0.000 description 21
- 238000004364 calculation method Methods 0.000 description 14
- 230000006870 function Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 238000007599 discharging Methods 0.000 description 4
- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 description 2
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 2
- 229910001416 lithium ion Inorganic materials 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000002250 progressing effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/3644—Constructional arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
- G01R31/3835—Arrangements for monitoring battery or accumulator variables, e.g. SoC involving only voltage measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/389—Measuring internal impedance, internal conductance or related variables
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03G—CONTROL OF AMPLIFICATION
- H03G3/00—Gain control in amplifiers or frequency changers
- H03G3/20—Automatic control
- H03G3/30—Automatic control in amplifiers having semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/392—Determining battery ageing or deterioration, e.g. state of health
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/396—Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03G—CONTROL OF AMPLIFICATION
- H03G2201/00—Indexing scheme relating to subclass H03G
- H03G2201/10—Gain control characterised by the type of controlled element
- H03G2201/103—Gain control characterised by the type of controlled element being an amplifying element
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Secondary Cells (AREA)
- Charge And Discharge Circuits For Batteries Or The Like (AREA)
- Measurement Of Current Or Voltage (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Description
上記電圧検出装置において、前記増幅率調整回路は、複数の抵抗器と、前記複数の抵抗器の接続を切り替えるスイッチ回路とを有し、前記スイッチ回路により前記複数の抵抗器の接続を切り替えることで前記増幅回路の増幅率を調整することが好ましい。
図面を参照しながら実施形態に係る電池状態検出装置1について説明する。図1は、実施形態に係る電池状態検出装置1の構成例を示す回路図である。図2は、実施形態に係る差電圧と放電電流との関係を示す図である。尚、図2では、放電電流を示しているが、充電電流であっても電圧低下が電圧上昇に変わるのみで同様な傾向の関係図が得られる。電池状態検出装置1は、車両に搭載され、当該車両の組電池Bを構成する複数の電池セルBC(BC1~BC4)の劣化を推定する装置である。電池状態検出装置1は、電池切替回路10と、電圧検出回路20とを備える。
R=|(G×(V2-V1))/(G×(I2-I1))|・・・(1)
次に、実施形態の変形例について説明する。なお、変形例では、実施形態と同等の構成要素には同じ符号を付し、その詳細な説明を省略する。図4は、実施形態の変形例に係る電池状態検出装置1Aの構成例を示す回路図である。変形例に係る電池状態検出装置1Aは、電池セルBCを使用した使用期間に応じてオペアンプOP1~OP3の増幅率を設定する点で実施形態に係る電池状態検出装置1とは異なる。変形例に係る電池状態検出装置1Aは、図4に示すように、電池切替回路10と、電圧検出回路20Aとを備える。この電圧検出回路20Aは、差動増幅回路21と、MCU22Aとを含んで構成される。
21 差動増幅回路
21a 増幅率調整回路
22、22A MCU(制御回路)
BC 電池セル(電池)
V1in 入力端子(第1入力端子)
V2in 入力端子(第2入力端子)
V3out 出力端子
OP1~OP3 オペアンプ(増幅回路)
R 抵抗器
SW60~SW120 スイッチ回路
Claims (2)
- 電池から供給される電力の第1電圧を入力する第1入力端子、前記第1電圧とは異なる電圧であり前記電池から供給される電力の第2電圧を入力する第2入力端子、電圧の増幅率を調整可能な増幅率調整回路、前記第1入力端子から入力した前記第1電圧と前記第2入力端子から入力した前記第2電圧との差電圧を、前記増幅率調整回路により調整された増幅率で増幅する増幅回路、前記増幅回路により増幅された差電圧を出力する出力端子を有する差動増幅回路と、
前記差動増幅回路から出力された差電圧を検出し当該差電圧に基づいて前記電池の内部抵抗値を演算すると共に前記増幅率調整回路を制御する制御回路と、を備え、
前記制御回路は、前記電池を使用した使用期間に応じて前記増幅率調整回路を制御し前記増幅回路の増幅率を設定することを特徴とする電圧検出装置。 - 前記増幅率調整回路は、複数の抵抗器と、前記複数の抵抗器の接続を切り替えるスイッチ回路とを有し、前記スイッチ回路により前記複数の抵抗器の接続を切り替えることで前記増幅回路の増幅率を調整する請求項1に記載の電圧検出装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020020384A JP7086492B2 (ja) | 2020-02-10 | 2020-02-10 | 電圧検出装置 |
EP21155209.6A EP3862767B1 (en) | 2020-02-10 | 2021-02-04 | Voltage detection device |
US17/168,174 US11549986B2 (en) | 2020-02-10 | 2021-02-05 | Voltage detection device |
CN202110183394.9A CN113252973B (zh) | 2020-02-10 | 2021-02-08 | 电压检测装置 |
Applications Claiming Priority (1)
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JP2020020384A JP7086492B2 (ja) | 2020-02-10 | 2020-02-10 | 電圧検出装置 |
Publications (2)
Publication Number | Publication Date |
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JP2021124477A JP2021124477A (ja) | 2021-08-30 |
JP7086492B2 true JP7086492B2 (ja) | 2022-06-20 |
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JP2020020384A Active JP7086492B2 (ja) | 2020-02-10 | 2020-02-10 | 電圧検出装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US11549986B2 (ja) |
EP (1) | EP3862767B1 (ja) |
JP (1) | JP7086492B2 (ja) |
CN (1) | CN113252973B (ja) |
Families Citing this family (1)
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CN115674071A (zh) | 2021-07-29 | 2023-02-03 | 株式会社牧田 | 电动工具以及冲击起子 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2004117095A (ja) | 2002-09-25 | 2004-04-15 | Sony Corp | 電圧検出装置及び方法 |
JP2017032349A (ja) | 2015-07-30 | 2017-02-09 | 矢崎総業株式会社 | 二次電池状態検出装置 |
US20170292997A1 (en) | 2014-11-27 | 2017-10-12 | China Resources Powtech (Shanghai) Co., Ltd. | System and method for detecting voltage of battery pack |
Family Cites Families (18)
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JP2593253B2 (ja) | 1991-05-29 | 1997-03-26 | 富士通株式会社 | 電流測定回路 |
DE10125366A1 (de) * | 2001-05-23 | 2002-12-12 | Infineon Technologies Ag | dB-lineare VGA-Stufe mit hoher Bandbreite |
JP3615500B2 (ja) * | 2001-06-22 | 2005-02-02 | 三洋電機株式会社 | 組電池の充電率調整回路 |
US7084700B2 (en) * | 2003-04-17 | 2006-08-01 | Fujitsu Limited | Differential voltage amplifier circuit |
WO2007135947A1 (ja) * | 2006-05-18 | 2007-11-29 | Rohm Co., Ltd. | 照度センサおよび電子機器 |
US7598706B2 (en) * | 2007-01-26 | 2009-10-06 | General Electric Company | Cell balancing battery pack and method of balancing the cells of a battery |
JP5955680B2 (ja) * | 2011-09-02 | 2016-07-20 | アークレイ株式会社 | 核酸検出装置、方法、及びプログラム |
US20130204560A1 (en) * | 2012-02-02 | 2013-08-08 | Ying-Che Lo | Gas Gauge Device |
US9083297B2 (en) * | 2012-05-10 | 2015-07-14 | That Corporation | Programmable-gain amplifier |
JP6211302B2 (ja) * | 2013-05-09 | 2017-10-11 | 矢崎総業株式会社 | 電池状態検出装置 |
CN103411902A (zh) * | 2013-07-22 | 2013-11-27 | 山东大学 | 一种基于可编程放大器的宽范围微水测量系统 |
TWI528171B (zh) * | 2015-04-23 | 2016-04-01 | 緯創資通股份有限公司 | 功率控制方法、以及使用該功率控制方法之行動裝置和功率控制系統 |
CN106597068A (zh) * | 2015-10-19 | 2017-04-26 | 沈阳新松机器人自动化股份有限公司 | 电流采样电路及采样方法 |
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JP6809911B2 (ja) | 2017-01-20 | 2021-01-06 | 矢崎総業株式会社 | 差電圧測定装置 |
CN109104157B (zh) * | 2018-07-19 | 2021-04-02 | 电子科技大学 | 一种自调零运算放大器 |
CN110061711B (zh) * | 2019-05-31 | 2024-04-30 | 卓尔智联(武汉)研究院有限公司 | 信号放大电路及电子装置 |
CN110460316A (zh) * | 2019-09-03 | 2019-11-15 | 四川长虹电器股份有限公司 | 可控增益放大器 |
-
2020
- 2020-02-10 JP JP2020020384A patent/JP7086492B2/ja active Active
-
2021
- 2021-02-04 EP EP21155209.6A patent/EP3862767B1/en active Active
- 2021-02-05 US US17/168,174 patent/US11549986B2/en active Active
- 2021-02-08 CN CN202110183394.9A patent/CN113252973B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004117095A (ja) | 2002-09-25 | 2004-04-15 | Sony Corp | 電圧検出装置及び方法 |
US20170292997A1 (en) | 2014-11-27 | 2017-10-12 | China Resources Powtech (Shanghai) Co., Ltd. | System and method for detecting voltage of battery pack |
JP2017032349A (ja) | 2015-07-30 | 2017-02-09 | 矢崎総業株式会社 | 二次電池状態検出装置 |
Also Published As
Publication number | Publication date |
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CN113252973B (zh) | 2024-06-11 |
US20210247449A1 (en) | 2021-08-12 |
US11549986B2 (en) | 2023-01-10 |
EP3862767B1 (en) | 2022-04-20 |
EP3862767A1 (en) | 2021-08-11 |
CN113252973A (zh) | 2021-08-13 |
JP2021124477A (ja) | 2021-08-30 |
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