JP7053946B2 - ラマン分光法、および品質管理のための機械学習 - Google Patents
ラマン分光法、および品質管理のための機械学習 Download PDFInfo
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- JP7053946B2 JP7053946B2 JP2021504134A JP2021504134A JP7053946B2 JP 7053946 B2 JP7053946 B2 JP 7053946B2 JP 2021504134 A JP2021504134 A JP 2021504134A JP 2021504134 A JP2021504134 A JP 2021504134A JP 7053946 B2 JP7053946 B2 JP 7053946B2
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Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US201862653791P | 2018-04-06 | 2018-04-06 | |
US62/653,791 | 2018-04-06 | ||
PCT/US2019/026073 WO2019195737A1 (en) | 2018-04-06 | 2019-04-05 | Raman spectroscopy and machine learning for quality control |
Publications (3)
Publication Number | Publication Date |
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JP2021521463A JP2021521463A (ja) | 2021-08-26 |
JP2021521463A5 JP2021521463A5 (ko) | 2021-11-04 |
JP7053946B2 true JP7053946B2 (ja) | 2022-04-12 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2021504134A Active JP7053946B2 (ja) | 2018-04-06 | 2019-04-05 | ラマン分光法、および品質管理のための機械学習 |
Country Status (10)
Country | Link |
---|---|
US (1) | US10955362B2 (ko) |
EP (1) | EP3775759A4 (ko) |
JP (1) | JP7053946B2 (ko) |
KR (1) | KR102282867B1 (ko) |
CN (1) | CN112513561B (ko) |
BR (1) | BR112020020417A2 (ko) |
CA (1) | CA3095905C (ko) |
MX (1) | MX2020010504A (ko) |
SG (1) | SG11202009818PA (ko) |
WO (1) | WO2019195737A1 (ko) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111819441B (zh) | 2018-03-09 | 2022-08-09 | 昭和电工株式会社 | 聚合物的物理性质预测装置、存储介质、及聚合物的物理性质预测方法 |
JP7109339B2 (ja) * | 2018-11-02 | 2022-07-29 | 昭和電工株式会社 | ポリマー設計装置、プログラム、および方法 |
CN112633307A (zh) * | 2019-10-08 | 2021-04-09 | 中强光电股份有限公司 | 用于光谱仪的自动化模型训练装置和自动化模型训练方法 |
EP4078601A1 (en) * | 2019-12-18 | 2022-10-26 | Dow Global Technologies LLC | Machine vision for characterization based on analytical data |
US11237111B2 (en) | 2020-01-30 | 2022-02-01 | Trustees Of Boston University | High-speed delay scanning and deep learning techniques for spectroscopic SRS imaging |
US11353394B2 (en) | 2020-09-30 | 2022-06-07 | X Development Llc | Deformulation techniques for deducing the composition of a material from a spectrogram |
TW202221549A (zh) * | 2020-11-26 | 2022-06-01 | 中強光電股份有限公司 | 優化光譜儀的輸出結果的方法及使用該方法的電子裝置 |
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