JP7011283B2 - 放射線イメージング装置用光学素子、光学素子の製造方法、放射線イメージング装置及びｘ線イメージング装置 - Google Patents

放射線イメージング装置用光学素子、光学素子の製造方法、放射線イメージング装置及びｘ線イメージング装置 Download PDF

Info

Publication number
JP7011283B2
JP7011283B2 JP2017141073A JP2017141073A JP7011283B2 JP 7011283 B2 JP7011283 B2 JP 7011283B2 JP 2017141073 A JP2017141073 A JP 2017141073A JP 2017141073 A JP2017141073 A JP 2017141073A JP 7011283 B2 JP7011283 B2 JP 7011283B2
Authority
JP
Japan
Prior art keywords
lens
radiation
scintillator
optical element
shaped substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2017141073A
Other languages
English (en)
Japanese (ja)
Other versions
JP2019020336A (ja
JP2019020336A5 (enExample
Inventor
敬 亀島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIKEN
Original Assignee
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIKEN filed Critical RIKEN
Priority to JP2017141073A priority Critical patent/JP7011283B2/ja
Priority to DE112018003696.0T priority patent/DE112018003696B4/de
Priority to US16/630,555 priority patent/US11137503B2/en
Priority to PCT/JP2018/027073 priority patent/WO2019017425A1/ja
Publication of JP2019020336A publication Critical patent/JP2019020336A/ja
Publication of JP2019020336A5 publication Critical patent/JP2019020336A5/ja
Application granted granted Critical
Publication of JP7011283B2 publication Critical patent/JP7011283B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP2017141073A 2017-07-20 2017-07-20 放射線イメージング装置用光学素子、光学素子の製造方法、放射線イメージング装置及びｘ線イメージング装置 Active JP7011283B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2017141073A JP7011283B2 (ja) 2017-07-20 2017-07-20 放射線イメージング装置用光学素子、光学素子の製造方法、放射線イメージング装置及びｘ線イメージング装置
DE112018003696.0T DE112018003696B4 (de) 2017-07-20 2018-07-19 Optisches Element für eine strahlungsbildgebende Einrichtung, strahlungsbildgebende Einrichtung und röntgenbildgebende Einrichtung
US16/630,555 US11137503B2 (en) 2017-07-20 2018-07-19 Optical element for a radiation imaging apparatus, radiation imaging apparatus, and X-ray imaging apparatus
PCT/JP2018/027073 WO2019017425A1 (ja) 2017-07-20 2018-07-19 放射線イメージング装置用光学素子、放射線イメージング装置及びｘ線イメージング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017141073A JP7011283B2 (ja) 2017-07-20 2017-07-20 放射線イメージング装置用光学素子、光学素子の製造方法、放射線イメージング装置及びｘ線イメージング装置

Publications (3)

Publication Number Publication Date
JP2019020336A JP2019020336A (ja) 2019-02-07
JP2019020336A5 JP2019020336A5 (enExample) 2020-07-16
JP7011283B2 true JP7011283B2 (ja) 2022-01-26

Family

ID=65016059

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017141073A Active JP7011283B2 (ja) 2017-07-20 2017-07-20 放射線イメージング装置用光学素子、光学素子の製造方法、放射線イメージング装置及びｘ線イメージング装置

Country Status (4)

Country Link
US (1) US11137503B2 (enExample)
JP (1) JP7011283B2 (enExample)
DE (1) DE112018003696B4 (enExample)
WO (1) WO2019017425A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111948699B (zh) * 2020-08-26 2024-08-30 中国科学院西安光学精密机械研究所 一种紧凑型质子能谱测量装置
JP7735867B2 (ja) * 2020-12-25 2025-09-09 東レ株式会社 シンチレータパネル、放射線検出器、放射線検査装置およびシンチレータパネルの製造方法
EP4357817A4 (en) * 2021-06-18 2025-05-07 Riken Radiation imaging device and radiation imaging method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001074847A (ja) 1999-07-08 2001-03-23 Canon Inc 放射線撮像装置および放射線撮像システム
JP2012159483A (ja) 2011-02-03 2012-08-23 Sony Corp 放射線撮像装置および放射線撮像表示システム
US20120294416A1 (en) 2011-05-20 2012-11-22 General Electric Company Imaging detector and methods for image detection
JP2016045183A (ja) 2014-08-27 2016-04-04 国立研究開発法人理化学研究所 放射線検出素子、放射線検出装置および放射線検出素子の製造方法
JP2016223997A (ja) 2015-06-03 2016-12-28 パナソニックＩｐマネジメント株式会社 放射線カメラ

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7057187B1 (en) 2003-11-07 2006-06-06 Xradia, Inc. Scintillator optical system and method of manufacture
JP2006162293A (ja) * 2004-12-02 2006-06-22 Ge Medical Systems Global Technology Co Llc Ｘ線検出器およびｘ線ｃｔ装置
JP4217788B2 (ja) * 2005-07-13 2009-02-04 大学共同利用機関法人 高エネルギー加速器研究機構 放射線到達位置検出方法及び装置
JP2009222578A (ja) * 2008-03-17 2009-10-01 Toshiba Corp Ｘ線固体検出器、ｘ線固体検出方法及びｘ線ｃｔ装置
JP2011137665A (ja) * 2009-12-26 2011-07-14 Canon Inc シンチレータパネル及び放射線撮像装置とその製造方法、ならびに放射線撮像システム
BR112012018130A2 (pt) * 2010-01-22 2019-09-24 DenCT Ltd "método e aparelho para detector de raio x de painel plano multicâmera"
US8692204B2 (en) * 2011-04-26 2014-04-08 Kla-Tencor Corporation Apparatus and methods for electron beam detection
US9110292B1 (en) * 2012-05-10 2015-08-18 Lockheed Martin Corporation Multiple filter photon conversion assembly
US9129715B2 (en) * 2012-09-05 2015-09-08 SVXR, Inc. High speed x-ray inspection microscope
TWI500926B (zh) * 2012-11-23 2015-09-21 Innocom Tech Shenzhen Co Ltd Ｘ光平板偵測裝置
US9606244B2 (en) * 2013-03-14 2017-03-28 Varex Imaging Corporation X-ray imager with lens array and transparent non-structured scintillator
FR3003652A1 (fr) * 2013-03-25 2014-09-26 Commissariat Energie Atomique Detecteur de traces de particules ionisantes
US20170234992A1 (en) * 2014-10-23 2017-08-17 Sony Semiconductor Solutions Corporation Imaging apparatus and manufacturing method thereof

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001074847A (ja) 1999-07-08 2001-03-23 Canon Inc 放射線撮像装置および放射線撮像システム
JP2012159483A (ja) 2011-02-03 2012-08-23 Sony Corp 放射線撮像装置および放射線撮像表示システム
US20120294416A1 (en) 2011-05-20 2012-11-22 General Electric Company Imaging detector and methods for image detection
JP2012242397A (ja) 2011-05-20 2012-12-10 General Electric Co <Ge> 撮像用検出器及び画像検出の方法
JP2016045183A (ja) 2014-08-27 2016-04-04 国立研究開発法人理化学研究所 放射線検出素子、放射線検出装置および放射線検出素子の製造方法
JP2016223997A (ja) 2015-06-03 2016-12-28 パナソニックＩｐマネジメント株式会社 放射線カメラ

Also Published As

Publication number Publication date
US20210088677A1 (en) 2021-03-25
DE112018003696T5 (de) 2020-04-02
JP2019020336A (ja) 2019-02-07
US11137503B2 (en) 2021-10-05
DE112018003696B4 (de) 2025-12-04
WO2019017425A1 (ja) 2019-01-24

Similar Documents

Publication Publication Date Title
EP3341782B1 (en) Mobile microscope
KR20100126233A (ko) 유리 시트 검사 시스템
CN104469183B (zh) 一种x射线闪烁体成像系统的光场捕捉和后处理方法
JP6255268B2 (ja) 大開口数で撮像するための多重反射素子を有する反射屈折光学系
JP7011283B2 (ja) 放射線イメージング装置用光学素子、光学素子の製造方法、放射線イメージング装置及びｘ線イメージング装置
JP6179925B2 (ja) 放射線検出素子、放射線検出装置および放射線検出素子の製造方法
US9465211B2 (en) Microscope and ghosting elimination method
JP6895768B2 (ja) 欠陥検査装置、および欠陥検査方法
CN115128008B (zh) 半导体显微检测的筒镜镜组及半导体显微检测系统
US20140063224A1 (en) Image-pickup optical system, image-pickup apparatus, and image-pickup system
TWI476537B (zh) 用於測量空間影像之位置的成像微光學機構
CN112020641A (zh) 用于增加收集的镜像显微术
US11067438B2 (en) Laser beam profile measurement device
WO2020021662A1 (ja) 顕微鏡対物レンズおよび顕微鏡
JP7738925B2 (ja) 放射線イメージング装置、および放射線イメージング方法
US20170280076A1 (en) Device for imaging a sample
US12498496B2 (en) Radiation imaging system and radiation imaging method
WO2020235145A1 (ja) 紫外線用光学系及び配光測定装置
JP2015036706A (ja) 撮像装置
KR102032251B1 (ko) 이미지 센서 모듈, 소형 디지털 현미경 및 소형 디지털 현미경 어레이 시스템
US20110141582A1 (en) Camera, handlens, and microscope optical system for imaging and coupled optical spectroscopy
TWI407244B (zh) Ｘ射線成像設備
TW202542544A (zh) X射線成像偵測器之循序陣列
JP2002022422A (ja) レーザ光撮像装置及びキャップ部材
JP2023059523A (ja) 撮像光学系、カメラ装置及びステレオカメラ装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20200512

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20200512

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20201215

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20210210

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20210525

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20210706

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20211221

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20220106

R150 Certificate of patent or registration of utility model

Ref document number: 7011283

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250