JP6862710B2 - Ｘ線回折装置 - Google Patents

Ｘ線回折装置 Download PDF

Info

Publication number
JP6862710B2
JP6862710B2 JP2016153517A JP2016153517A JP6862710B2 JP 6862710 B2 JP6862710 B2 JP 6862710B2 JP 2016153517 A JP2016153517 A JP 2016153517A JP 2016153517 A JP2016153517 A JP 2016153517A JP 6862710 B2 JP6862710 B2 JP 6862710B2
Authority
JP
Japan
Prior art keywords
ray
rays
sample
diffracted
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2016153517A
Other languages
English (en)
Japanese (ja)
Other versions
JP2018021836A (ja
JP2018021836A5 (https=
Inventor
隆雄 丸井
隆雄 丸井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2016153517A priority Critical patent/JP6862710B2/ja
Publication of JP2018021836A publication Critical patent/JP2018021836A/ja
Publication of JP2018021836A5 publication Critical patent/JP2018021836A5/ja
Application granted granted Critical
Publication of JP6862710B2 publication Critical patent/JP6862710B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP2016153517A 2016-08-04 2016-08-04 Ｘ線回折装置 Active JP6862710B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2016153517A JP6862710B2 (ja) 2016-08-04 2016-08-04 Ｘ線回折装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016153517A JP6862710B2 (ja) 2016-08-04 2016-08-04 Ｘ線回折装置

Publications (3)

Publication Number Publication Date
JP2018021836A JP2018021836A (ja) 2018-02-08
JP2018021836A5 JP2018021836A5 (https=) 2019-02-21
JP6862710B2 true JP6862710B2 (ja) 2021-04-21

Family

ID=61166136

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016153517A Active JP6862710B2 (ja) 2016-08-04 2016-08-04 Ｘ線回折装置

Country Status (1)

Country Link
JP (1) JP6862710B2 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116429804B (zh) * 2023-02-23 2026-04-21 中国原子能科学研究院 X射线衍射用样品台

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01141344A (ja) * 1987-11-27 1989-06-02 Nec Corp 蛍光ｘ線分析装置
JP2867523B2 (ja) * 1990-01-13 1999-03-08 株式会社島津製作所 Ｘ線回折装置
JP3590681B2 (ja) * 1995-11-27 2004-11-17 株式会社リガク Ｘ線吸収微細構造分析方法およびその装置
JPH09166488A (ja) * 1995-12-13 1997-06-24 Shimadzu Corp Ｘ線分光器
JP2000146872A (ja) * 1998-11-17 2000-05-26 Rigaku Corp Ｘ線回折装置
JP3465141B2 (ja) * 1998-11-18 2003-11-10 理学電機工業株式会社 蛍光ｘ線分析装置
JP4639971B2 (ja) * 2005-06-06 2011-02-23 株式会社島津製作所 Ｘ線分析装置
JP4715345B2 (ja) * 2005-07-08 2011-07-06 株式会社島津製作所 Ｘ線分析装置
JP4656009B2 (ja) * 2006-06-30 2011-03-23 株式会社島津製作所 Ｘ線分析装置
JP5626750B2 (ja) * 2009-08-04 2014-11-19 国立大学法人広島大学 測定装置及び測定方法
JP2015121501A (ja) * 2013-12-25 2015-07-02 株式会社島津製作所 Ｘ線回折装置

Also Published As

Publication number Publication date
JP2018021836A (ja) 2018-02-08

Similar Documents

Publication Publication Date Title
CN110678743B (zh) X射线分光分析装置
US8548123B2 (en) Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer
US7646849B2 (en) Ultra-small angle x-ray scattering measuring apparatus
US7590220B1 (en) X-ray inspection and detection system and method
US9417341B2 (en) Device and method for determining the energetic composition of electromagnetic waves
JP5127976B2 (ja) 可変コリメータを有する放射分析用装置
JP6009156B2 (ja) 回折装置
KR20160067527A (ko) 미세패턴 측정용 Micro-XRF 장치 및 방법
JP6862710B2 (ja) Ｘ線回折装置
JP3968350B2 (ja) Ｘ線回折装置及び方法
US2835820A (en) Curved crystal fluorescent x-ray spectrograph
US6285736B1 (en) Method for X-ray micro-diffraction measurement and X-ray micro-diffraction apparatus
US3344274A (en) Ray analysis apparatus having both diffraction amd spectrometer tubes mounted on a common housing
JP2000504422A (ja) ２つのコリメータマスクを有するｘ線分析装置
EP0697109B1 (en) X-ray spectrometer with a grazing take-off angle
JP2004117362A (ja) 測定対象物のスペクトル反射率を決定する装置
JPH09257726A (ja) Ｘ線分析装置および蛍光ｘ線分析用アタッチメント
JP2001194325A (ja) Ｘ線分析装置および方法
JPH1151883A (ja) 蛍光ｘ線分析装置および方法
JP2921597B2 (ja) 全反射スペクトル測定装置
CN204789410U (zh) 一种用于x荧光光谱分析仪的多层膜晶体分光装置
JPH0798285A (ja) Ｘ線評価装置
KR100429830B1 (ko) X-선 전자 분광 분석장치
US3427451A (en) X-ray diffractometer having several detectors movable on a goniometer circle
EP0815437A1 (en) X-ray analysis apparatus including a rotatable primary collimator

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20190109

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20190109

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20191111

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20191119

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20200114

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20200804

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20200917

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20210302

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20210315

R151 Written notification of patent or utility model registration

Ref document number: 6862710

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151