JP6838149B2 - マトリックス支援レーザ脱離/イオン化質量分析方法 - Google Patents
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Description
Claims (11)
- 1000ダルトン以下の低分子量の化合物をマトリックス支援レーザ脱離イオン化させて質量スペクトルを得て、二つ以上の互いに異なるマトリックスそれぞれを用いて前記低分子量の化合物の質量スペクトルである検出スペクトルを得るステップと、各検出スペクトルにおいて該マトリックスのピークを除去してマトリックス‐除去スペクトルを収得した後、互いに異なるマトリックス別マトリックス‐除去スペクトルに基づいて前記低分子量の化合物の補正された質量スペクトルを得るステップと、を含むマトリックス支援レーザ脱離イオン化(Matrix‐Assisted Laser Desorption Ionization)質量分析方法。
- 前記補正された質量スペクトルは二つ以上のマトリックス‐除去スペクトルにおいて共通して存在するピークと一つのマトリックス‐除去スペクトルにのみ存在するピークを併合(merge)して算出される、請求項1に記載のマトリックス支援レーザ脱離イオン化質量分析方法。
- a)前記低分子量の化合物と第1マトリックスを含む第1試料にレーザを照射して第1検出スペクトルを得て、前記低分子量の化合物と第2マトリックスを含む第2試料にレーザを照射して第2検出スペクトルを得るステップと、
b)前記第1検出スペクトルにおいて前記第1マトリックスのピークを除去して第1マトリックス‐除去スペクトルを得て、前記第2検出スペクトルにおいて前記第2マトリックスのピークを除去して第2マトリックス‐除去スペクトルを得るステップと、
c)前記第1マトリックス‐除去スペクトルと前記第2マトリックス‐除去スペクトルに基づいて、前記低分子量の化合物の補正された質量スペクトルを得るステップと、を含む、請求項1に記載のマトリックス支援レーザ脱離イオン化質量分析方法。 - 前記c)ステップは、
前記第1マトリックス‐除去スペクトルと前記第2マトリックス‐除去スペクトルに共通して存在するピークである共通ピークと、前記第1マトリックス‐除去スペクトルと前記第2マトリックス‐除去スペクトルのうち一スペクトルにのみ存在するピークである補完ピークを併合(merge)するステップを含む、請求項3に記載のマトリックス支援レーザ脱離イオン化質量分析方法。 - 前記併合時に、前記第1マトリックス‐除去スペクトルの共通ピークと前記第2マトリックス‐除去スペクトルの共通ピーク間の強度比を用いて、前記補完ピークの強度を補正するステップをさらに含む、請求項4に記載のマトリックス支援レーザ脱離イオン化質量分析方法。
- 前記併合時に、前記共通ピークの各m/z別平均強度を算出して共通ピークスペクトルを得るステップと、
前記共通ピークスペクトル上の一つのピークの強度を併合される補完ピークが属するマトリックス‐除去スペクトル上の前記一つのピークと同一のm/zでの強度で割った比を前記補完ピークの強度と乗じて補完ピークの強度を補正するステップと、をさらに含む、請求項4に記載のマトリックス支援レーザ脱離イオン化質量分析方法。 - 前記b)ステップはマトリックスのピークの除去前、第1検出スペクトルおよび第2検出スペクトルをそれぞれ標準化するステップをさらに含み、
前記標準化ステップは検出スペクトルに存在する各ピークの強度を検出スペクトルに存在する各ピークの強度を累積した総強度で割って行われる、請求項3に記載のマトリックス支援レーザ脱離イオン化質量分析方法。 - 前記a)ステップの前、前記低分子量の化合物を含有せずに第1マトリックスを含有する第1基準試料および前記低分子量の化合物を含有せずに第2マトリックスを含有する第2基準試料それぞれにレーザを照射して、マトリックス別、マトリックス由来質量スペクトルを得るステップをさらに含む、請求項3に記載のマトリックス支援レーザ脱離イオン化質量分析方法。
- 前記第1マトリックスのピークと前記第2マトリックスのピークにおいて、互いに異なるマトリックスに属するピーク間の質量(m/z)差のうち最も小さい質量(m/z)差は1以上である、請求項3に記載のマトリックス支援レーザ脱離イオン化質量分析方法。
- 前記互いに異なるマトリックスはα‐cyano‐4‐hydroxycinnamic acid(CHCA)、2,5‐dihydroxybenzoic acid(DHB)、2‐(4‐hydroxyphenylazo)‐benzoic acid(HABA)、2‐mercaptobenzo‐thiazole(MBT)および3‐Hydroxypicolinic acid(3‐HPA)から選択される二つ以上の物質である、請求項1に記載のマトリックス支援レーザ脱離イオン化質量分析方法。
- 前記マトリックス支援レーザ脱離イオン化(MALDI)質量分析はTOF(Time Of Flight)MS(Mass Spectrometer)、IT(Ion trap)MS、FT‐ICR(Fourier transform ion cyclotron resonance)MS、Quadrupole MSまたはOrbitrap MSを用いた、請求項1に記載のマトリックス支援レーザ脱離イオン化質量分析方法。
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CN112986374A (zh) * | 2019-12-13 | 2021-06-18 | 中国科学院大连化学物理研究所 | 一种激光解吸电离质谱基质、检测方法、质谱以及质谱在神经递质检测中的应用 |
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WO2013008723A1 (ja) | 2011-07-08 | 2013-01-17 | 国立大学法人九州大学 | Maldi質量分析用マトリックス |
JP5857873B2 (ja) | 2012-05-11 | 2016-02-10 | 株式会社島津製作所 | 1h−テトラゾール誘導体及び質量分析用マトリックス |
WO2014014353A1 (en) * | 2012-07-18 | 2014-01-23 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | New classification method for spectral data |
EP2778684A1 (en) * | 2013-03-14 | 2014-09-17 | Zentech | Detection of compounds in a dried fluid spot by direct MALDI/MS |
US9659759B2 (en) * | 2013-09-25 | 2017-05-23 | Council Of Scientific And Industrial Research | Quantitation of structural isomers using MALDI MS/MS |
GB201317837D0 (en) | 2013-10-09 | 2013-11-20 | Kratos Analytical Ltd | Microbial analysis |
JP2015121500A (ja) | 2013-12-25 | 2015-07-02 | 株式会社島津製作所 | 質量分析方法及び質量分析装置 |
JP6403204B2 (ja) * | 2015-01-16 | 2018-10-10 | 日本電子株式会社 | 質量分析データ処理装置および質量分析データ処理方法 |
CN108780065B (zh) * | 2016-03-14 | 2021-03-19 | 株式会社岛津制作所 | 质谱分析数据解析装置、方法及非暂时性计算机可读介质 |
US11991343B2 (en) * | 2019-06-07 | 2024-05-21 | Interdigital Madison Patent Holdings, Sas | Optical method and system for light field displays based on distributed apertures |
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CN109906377A (zh) | 2019-06-18 |
KR101834720B1 (ko) | 2018-03-06 |
EP3537143A1 (en) | 2019-09-11 |
US11545349B2 (en) | 2023-01-03 |
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