JP6820766B2 - ガス導入機構及び熱処理装置 - Google Patents
ガス導入機構及び熱処理装置 Download PDFInfo
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- JP6820766B2 JP6820766B2 JP2017039197A JP2017039197A JP6820766B2 JP 6820766 B2 JP6820766 B2 JP 6820766B2 JP 2017039197 A JP2017039197 A JP 2017039197A JP 2017039197 A JP2017039197 A JP 2017039197A JP 6820766 B2 JP6820766 B2 JP 6820766B2
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- 238000010438 heat treatment Methods 0.000 title claims description 19
- 238000012545 processing Methods 0.000 claims description 63
- 230000001105 regulatory effect Effects 0.000 claims description 32
- 230000002093 peripheral effect Effects 0.000 claims description 26
- 238000003780 insertion Methods 0.000 claims description 25
- 230000037431 insertion Effects 0.000 claims description 25
- 239000007789 gas Substances 0.000 description 97
- 235000012431 wafers Nutrition 0.000 description 27
- 238000010586 diagram Methods 0.000 description 8
- 239000010453 quartz Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 238000004891 communication Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 230000005489 elastic deformation Effects 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- 230000003028 elevating effect Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000011553 magnetic fluid Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Furnace Details (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017039197A JP6820766B2 (ja) | 2017-03-02 | 2017-03-02 | ガス導入機構及び熱処理装置 |
KR1020180022985A KR102274966B1 (ko) | 2017-03-02 | 2018-02-26 | 가스 도입 기구 및 열처리 장치 |
CN201810158626.3A CN108538748B (zh) | 2017-03-02 | 2018-02-26 | 气体导入机构及热处理装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017039197A JP6820766B2 (ja) | 2017-03-02 | 2017-03-02 | ガス導入機構及び熱処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018145460A JP2018145460A (ja) | 2018-09-20 |
JP6820766B2 true JP6820766B2 (ja) | 2021-01-27 |
Family
ID=63485906
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017039197A Active JP6820766B2 (ja) | 2017-03-02 | 2017-03-02 | ガス導入機構及び熱処理装置 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6820766B2 (ko) |
KR (1) | KR102274966B1 (ko) |
CN (1) | CN108538748B (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112530826B (zh) * | 2020-11-27 | 2024-05-17 | 北京北方华创微电子装备有限公司 | 半导体热处理设备的承载装置及半导体热处理设备 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3436955B2 (ja) * | 1993-10-18 | 2003-08-18 | 東京エレクトロン株式会社 | 熱処理装置 |
JP2001035187A (ja) * | 1999-07-21 | 2001-02-09 | Hitachi Ltd | 半導体装置およびその冗長救済方法 |
JP2001351871A (ja) * | 2000-06-09 | 2001-12-21 | Asm Japan Kk | 半導体製造装置 |
JP3538737B2 (ja) * | 2002-03-20 | 2004-06-14 | 東京エレクトロン株式会社 | 管継手 |
JP5237133B2 (ja) * | 2008-02-20 | 2013-07-17 | 株式会社日立国際電気 | 基板処理装置 |
JP4924676B2 (ja) * | 2009-08-13 | 2012-04-25 | 東京エレクトロン株式会社 | ガスポート構造及び処理装置 |
JP2012004408A (ja) * | 2010-06-18 | 2012-01-05 | Tokyo Electron Ltd | 支持体構造及び処理装置 |
JP5545061B2 (ja) * | 2010-06-18 | 2014-07-09 | 東京エレクトロン株式会社 | 処理装置及び成膜方法 |
JP6176732B2 (ja) | 2014-03-20 | 2017-08-09 | 株式会社日立国際電気 | ガス供給部、基板処理装置及び半導体装置の製造方法 |
JP2016176584A (ja) * | 2015-03-23 | 2016-10-06 | 東京エレクトロン株式会社 | ガス導入配管接続構造及びこれを用いた基板処理装置 |
WO2016194843A1 (ja) * | 2015-05-29 | 2016-12-08 | 株式会社フジキン | 管継手方法、管継手用部品、該部品を備える管継手、流体制御器、流体制御装置、及び半導体製造装置 |
-
2017
- 2017-03-02 JP JP2017039197A patent/JP6820766B2/ja active Active
-
2018
- 2018-02-26 CN CN201810158626.3A patent/CN108538748B/zh active Active
- 2018-02-26 KR KR1020180022985A patent/KR102274966B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
JP2018145460A (ja) | 2018-09-20 |
KR20180101199A (ko) | 2018-09-12 |
CN108538748A (zh) | 2018-09-14 |
KR102274966B1 (ko) | 2021-07-07 |
CN108538748B (zh) | 2023-07-28 |
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