JP6759095B2 - 質量分析向けの細長いトラッピング領域を有する小型荷電粒子トラップ - Google Patents
質量分析向けの細長いトラッピング領域を有する小型荷電粒子トラップ Download PDFInfo
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- JP6759095B2 JP6759095B2 JP2016500080A JP2016500080A JP6759095B2 JP 6759095 B2 JP6759095 B2 JP 6759095B2 JP 2016500080 A JP2016500080 A JP 2016500080A JP 2016500080 A JP2016500080 A JP 2016500080A JP 6759095 B2 JP6759095 B2 JP 6759095B2
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- 0 CCCC1CC(*CC)CC1 Chemical compound CCCC1CC(*CC)CC1 0.000 description 2
- GDOPTJXRTPNYNR-UHFFFAOYSA-N CC1CCCC1 Chemical compound CC1CCCC1 GDOPTJXRTPNYNR-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/4245—Electrostatic ion traps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0031—Step by step routines describing the use of the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/422—Two-dimensional RF ion traps
- H01J49/4235—Stacked rings or stacked plates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/4255—Device types with particular constructional features
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/840,653 US8878127B2 (en) | 2013-03-15 | 2013-03-15 | Miniature charged particle trap with elongated trapping region for mass spectrometry |
| US13/840,653 | 2013-03-15 | ||
| PCT/US2013/042031 WO2014143101A1 (en) | 2013-03-15 | 2013-05-21 | Miniature charged particle trap with elongated trapping region for mass spectrometry |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019082128A Division JP7194071B2 (ja) | 2013-03-15 | 2019-04-23 | 質量分析向けの細長いトラッピング領域を有する小型荷電粒子トラップ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2016517138A JP2016517138A (ja) | 2016-06-09 |
| JP6759095B2 true JP6759095B2 (ja) | 2020-09-23 |
Family
ID=51523398
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016500080A Active JP6759095B2 (ja) | 2013-03-15 | 2013-05-21 | 質量分析向けの細長いトラッピング領域を有する小型荷電粒子トラップ |
| JP2019082128A Active JP7194071B2 (ja) | 2013-03-15 | 2019-04-23 | 質量分析向けの細長いトラッピング領域を有する小型荷電粒子トラップ |
| JP2021109942A Active JP7301095B2 (ja) | 2013-03-15 | 2021-07-01 | 質量分析向けの細長いトラッピング領域を有する小型荷電粒子トラップ |
| JP2023065561A Active JP7600300B2 (ja) | 2013-03-15 | 2023-04-13 | 質量分析向けの細長いトラッピング領域を有する小型荷電粒子トラップ |
Family Applications After (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019082128A Active JP7194071B2 (ja) | 2013-03-15 | 2019-04-23 | 質量分析向けの細長いトラッピング領域を有する小型荷電粒子トラップ |
| JP2021109942A Active JP7301095B2 (ja) | 2013-03-15 | 2021-07-01 | 質量分析向けの細長いトラッピング領域を有する小型荷電粒子トラップ |
| JP2023065561A Active JP7600300B2 (ja) | 2013-03-15 | 2023-04-13 | 質量分析向けの細長いトラッピング領域を有する小型荷電粒子トラップ |
Country Status (5)
| Country | Link |
|---|---|
| US (5) | US8878127B2 (enExample) |
| EP (1) | EP2973650B1 (enExample) |
| JP (4) | JP6759095B2 (enExample) |
| CN (2) | CN105190827B (enExample) |
| WO (1) | WO2014143101A1 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8878127B2 (en) | 2013-03-15 | 2014-11-04 | The University Of North Carolina Of Chapel Hill | Miniature charged particle trap with elongated trapping region for mass spectrometry |
| US9711341B2 (en) | 2014-06-10 | 2017-07-18 | The University Of North Carolina At Chapel Hill | Mass spectrometry systems with convective flow of buffer gas for enhanced signals and related methods |
| US9406492B1 (en) | 2015-05-12 | 2016-08-02 | The University Of North Carolina At Chapel Hill | Electrospray ionization interface to high pressure mass spectrometry and related methods |
| US11348778B2 (en) | 2015-11-02 | 2022-05-31 | Purdue Research Foundation | Precursor and neutral loss scan in an ion trap |
| US9932825B1 (en) | 2016-10-05 | 2018-04-03 | Schlumberger Technology Corporation | Gas chromatograph mass spectrometer for downhole applications |
| US10253624B2 (en) | 2016-10-05 | 2019-04-09 | Schlumberger Technology Corporation | Methods of applications for a mass spectrometer in combination with a gas chromatograph |
| US10242857B2 (en) | 2017-08-31 | 2019-03-26 | The University Of North Carolina At Chapel Hill | Ion traps with Y-directional ion manipulation for mass spectrometry and related mass spectrometry systems and methods |
| GB2569639B (en) | 2017-12-21 | 2020-06-03 | Thermo Fisher Scient Bremen Gmbh | Ion supply system and method to control an ion supply system |
| EP3751269A1 (en) * | 2018-02-09 | 2020-12-16 | Hamamatsu Photonics K.K. | Sample supporting body, method for ionizing sample, and mass spectrometry method |
| CN110828022B (zh) | 2018-08-14 | 2021-11-19 | 华为技术有限公司 | 离子光腔耦合系统及方法 |
| US11764051B2 (en) | 2019-04-02 | 2023-09-19 | Georgia Tech Research Corporation | Linear quadrupole ion trap mass analyzer |
| CN114050102A (zh) * | 2021-11-10 | 2022-02-15 | 中船重工安谱(湖北)仪器有限公司 | 一种离子阱质量分析器及用于高压质谱的质量分析装置 |
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| US5118950A (en) * | 1989-12-29 | 1992-06-02 | The United States Of America As Represented By The Secretary Of The Air Force | Cluster ion synthesis and confinement in hybrid ion trap arrays |
| US5206506A (en) * | 1991-02-12 | 1993-04-27 | Kirchner Nicholas J | Ion processing: control and analysis |
| US5248883A (en) * | 1991-05-30 | 1993-09-28 | International Business Machines Corporation | Ion traps of mono- or multi-planar geometry and planar ion trap devices |
| US5401962A (en) | 1993-06-14 | 1995-03-28 | Ferran Scientific | Residual gas sensor utilizing a miniature quadrupole array |
| US5811820A (en) * | 1995-06-13 | 1998-09-22 | Massively Parallel Instruments, Inc. | Parallel ion optics and apparatus for high current low energy ion beams |
| DE19523860A1 (de) * | 1995-06-30 | 1997-01-02 | Bruker Franzen Analytik Gmbh | Ionenfallen-Massenspektrometer mit vakuum-externer Ionenerzeugung |
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| JP3656239B2 (ja) * | 1997-01-28 | 2005-06-08 | 株式会社島津製作所 | イオントラップ質量分析装置 |
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| JP4631219B2 (ja) * | 2001-06-26 | 2011-02-16 | 株式会社島津製作所 | イオントラップ型質量分析装置 |
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| CN101063672A (zh) * | 2006-04-29 | 2007-10-31 | 复旦大学 | 离子阱阵列 |
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| TWI484529B (zh) * | 2006-11-13 | 2015-05-11 | Mks Instr Inc | 離子阱質譜儀、利用其得到質譜之方法、離子阱、捕捉離子阱內之離子之方法和設備 |
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| FR2955261B1 (fr) * | 2010-01-18 | 2013-03-08 | Sveltus | Pompe / verin pour dispositif destine a faire travailler simultanement des muscles antagonistes, comportant essentiellement un verin a eau ou autre fluide capable de travailler en traction puis en compression, dispositif correspondant comportant des moyens de contact avec le corps ou de manoeuvre, ledit dispositif et applications correspondantes en gymnastique, musculation |
| EP2390899B1 (en) * | 2010-05-27 | 2012-07-04 | Universität Innsbruck | Apparatus and method for trapping charged particles and performing controlled interactions between them |
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| CN103367093B (zh) | 2012-03-30 | 2016-12-21 | 岛津分析技术研发(上海)有限公司 | 线型离子束缚装置及其阵列结构 |
| US9373492B2 (en) | 2013-03-14 | 2016-06-21 | The University Of North Carolina At Chapel Hill | Microscale mass spectrometry systems, devices and related methods |
| US9214325B2 (en) | 2013-03-15 | 2015-12-15 | 1St Detect Corporation | Ion trap with radial opening in ring electrode |
| US8878127B2 (en) | 2013-03-15 | 2014-11-04 | The University Of North Carolina Of Chapel Hill | Miniature charged particle trap with elongated trapping region for mass spectrometry |
| US9711341B2 (en) | 2014-06-10 | 2017-07-18 | The University Of North Carolina At Chapel Hill | Mass spectrometry systems with convective flow of buffer gas for enhanced signals and related methods |
| US9406492B1 (en) | 2015-05-12 | 2016-08-02 | The University Of North Carolina At Chapel Hill | Electrospray ionization interface to high pressure mass spectrometry and related methods |
-
2013
- 2013-03-15 US US13/840,653 patent/US8878127B2/en active Active
- 2013-05-21 WO PCT/US2013/042031 patent/WO2014143101A1/en not_active Ceased
- 2013-05-21 EP EP13877607.5A patent/EP2973650B1/en active Active
- 2013-05-21 CN CN201380076616.0A patent/CN105190827B/zh active Active
- 2013-05-21 CN CN201810784433.9A patent/CN109148255B/zh active Active
- 2013-05-21 JP JP2016500080A patent/JP6759095B2/ja active Active
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2014
- 2014-08-11 US US14/456,686 patent/US9252005B2/en active Active
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2015
- 2015-12-28 US US14/980,268 patent/US20160141168A1/en not_active Abandoned
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2017
- 2017-05-19 US US15/600,325 patent/US10141178B2/en active Active
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2018
- 2018-11-26 US US16/199,816 patent/US11158496B2/en active Active
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2019
- 2019-04-23 JP JP2019082128A patent/JP7194071B2/ja active Active
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2021
- 2021-07-01 JP JP2021109942A patent/JP7301095B2/ja active Active
-
2023
- 2023-04-13 JP JP2023065561A patent/JP7600300B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP7194071B2 (ja) | 2022-12-21 |
| US20170263432A1 (en) | 2017-09-14 |
| EP2973650A4 (en) | 2016-11-02 |
| JP2023086802A (ja) | 2023-06-22 |
| CN109148255A (zh) | 2019-01-04 |
| JP2016517138A (ja) | 2016-06-09 |
| CN105190827B (zh) | 2018-08-03 |
| US20150122990A1 (en) | 2015-05-07 |
| US11158496B2 (en) | 2021-10-26 |
| WO2014143101A1 (en) | 2014-09-18 |
| EP2973650B1 (en) | 2019-08-28 |
| JP2021168301A (ja) | 2021-10-21 |
| US9252005B2 (en) | 2016-02-02 |
| US10141178B2 (en) | 2018-11-27 |
| EP2973650A1 (en) | 2016-01-20 |
| US20160141168A1 (en) | 2016-05-19 |
| CN109148255B (zh) | 2021-10-29 |
| US20190096655A1 (en) | 2019-03-28 |
| JP7301095B2 (ja) | 2023-06-30 |
| JP2019145520A (ja) | 2019-08-29 |
| JP7600300B2 (ja) | 2024-12-16 |
| US20140264001A1 (en) | 2014-09-18 |
| CN105190827A (zh) | 2015-12-23 |
| US8878127B2 (en) | 2014-11-04 |
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