CN105190827B - 用于质谱法的具有伸长捕集区域的微型带电粒子阱 - Google Patents

用于质谱法的具有伸长捕集区域的微型带电粒子阱 Download PDF

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CN105190827B
CN105190827B CN201380076616.0A CN201380076616A CN105190827B CN 105190827 B CN105190827 B CN 105190827B CN 201380076616 A CN201380076616 A CN 201380076616A CN 105190827 B CN105190827 B CN 105190827B
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dimension
ions
aperture
trapping
lateral
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CN105190827A (zh
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J.M.拉姆齐
K.舒尔策
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University of North Carolina at Chapel Hill
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University of North Carolina at Chapel Hill
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/4245—Electrostatic ion traps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4235—Stacked rings or stacked plates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/4255—Device types with particular constructional features
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN201380076616.0A 2013-03-15 2013-05-21 用于质谱法的具有伸长捕集区域的微型带电粒子阱 Active CN105190827B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810784433.9A CN109148255B (zh) 2013-03-15 2013-05-21 用于质谱法的具有伸长捕集区域的微型带电粒子阱

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/840,653 US8878127B2 (en) 2013-03-15 2013-03-15 Miniature charged particle trap with elongated trapping region for mass spectrometry
US13/840,653 2013-03-15
PCT/US2013/042031 WO2014143101A1 (en) 2013-03-15 2013-05-21 Miniature charged particle trap with elongated trapping region for mass spectrometry

Related Child Applications (1)

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CN201810784433.9A Division CN109148255B (zh) 2013-03-15 2013-05-21 用于质谱法的具有伸长捕集区域的微型带电粒子阱

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CN105190827A CN105190827A (zh) 2015-12-23
CN105190827B true CN105190827B (zh) 2018-08-03

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CN201810784433.9A Active CN109148255B (zh) 2013-03-15 2013-05-21 用于质谱法的具有伸长捕集区域的微型带电粒子阱

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Country Status (5)

Country Link
US (5) US8878127B2 (enExample)
EP (1) EP2973650B1 (enExample)
JP (4) JP6759095B2 (enExample)
CN (2) CN105190827B (enExample)
WO (1) WO2014143101A1 (enExample)

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US9406492B1 (en) 2015-05-12 2016-08-02 The University Of North Carolina At Chapel Hill Electrospray ionization interface to high pressure mass spectrometry and related methods
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Also Published As

Publication number Publication date
JP7194071B2 (ja) 2022-12-21
US20170263432A1 (en) 2017-09-14
EP2973650A4 (en) 2016-11-02
JP2023086802A (ja) 2023-06-22
CN109148255A (zh) 2019-01-04
JP2016517138A (ja) 2016-06-09
US20150122990A1 (en) 2015-05-07
US11158496B2 (en) 2021-10-26
WO2014143101A1 (en) 2014-09-18
EP2973650B1 (en) 2019-08-28
JP2021168301A (ja) 2021-10-21
US9252005B2 (en) 2016-02-02
US10141178B2 (en) 2018-11-27
JP6759095B2 (ja) 2020-09-23
EP2973650A1 (en) 2016-01-20
US20160141168A1 (en) 2016-05-19
CN109148255B (zh) 2021-10-29
US20190096655A1 (en) 2019-03-28
JP7301095B2 (ja) 2023-06-30
JP2019145520A (ja) 2019-08-29
JP7600300B2 (ja) 2024-12-16
US20140264001A1 (en) 2014-09-18
CN105190827A (zh) 2015-12-23
US8878127B2 (en) 2014-11-04

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