JP6755749B2 - 内部クラック検出方法 - Google Patents
内部クラック検出方法 Download PDFInfo
- Publication number
- JP6755749B2 JP6755749B2 JP2016163238A JP2016163238A JP6755749B2 JP 6755749 B2 JP6755749 B2 JP 6755749B2 JP 2016163238 A JP2016163238 A JP 2016163238A JP 2016163238 A JP2016163238 A JP 2016163238A JP 6755749 B2 JP6755749 B2 JP 6755749B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- transparent member
- internal crack
- back surface
- crack detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000001514 detection method Methods 0.000 title claims description 20
- 239000000758 substrate Substances 0.000 claims description 14
- 238000003384 imaging method Methods 0.000 claims description 13
- 238000000034 method Methods 0.000 claims description 8
- 230000001678 irradiating effect Effects 0.000 claims description 3
- 238000000638 solvent extraction Methods 0.000 claims description 2
- 235000012431 wafers Nutrition 0.000 description 47
- 229920005989 resin Polymers 0.000 description 6
- 239000011347 resin Substances 0.000 description 6
- 239000007788 liquid Substances 0.000 description 5
- 230000001681 protective effect Effects 0.000 description 3
- WSMQKESQZFQMFW-UHFFFAOYSA-N 5-methyl-pyrazole-3-carboxylic acid Chemical compound CC1=CC(C(O)=O)=NN1 WSMQKESQZFQMFW-UHFFFAOYSA-N 0.000 description 2
- 229910013641 LiNbO 3 Inorganic materials 0.000 description 2
- 241000237536 Mytilus edulis Species 0.000 description 2
- 239000004372 Polyvinyl alcohol Substances 0.000 description 2
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 2
- 235000020638 mussel Nutrition 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- 229920000298 Cellophane Polymers 0.000 description 1
- 229920000715 Mucilage Polymers 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 239000002390 adhesive tape Substances 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 235000013305 food Nutrition 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 238000010897 surface acoustic wave method Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Description
2a:ウエーハの表面
2b:ウエーハの裏面
4:SAWデバイス
6:分割予定ライン
26:透明部材
32:撮像手段
44:内部クラック
Claims (2)
- 複数のデバイスが分割予定ラインによって区画され表面に形成されたウエーハの内部クラックを検出する内部クラック検出方法であって、
ウエーハの裏面を研削し所定の厚みに仕上げる研削工程と、
研削したウエーハの裏面に透明部材を敷設する透明部材敷設工程と、
ウエーハ及び透明部材に対して透過性を有する波長の光を照射して透明部材側から撮像手段で撮像して内部クラックを検出する内部クラック検出工程と、
を含む内部クラック検出方法。 - 前記ウエーハは、LT基板又はLN基板の表面に複数のSAWデバイスが分割予定ラインによって区画されて形成されたウエーハであり、
ウエーハ及び透明部材に対して透過性を有する波長の光は、500〜700nmの波長である請求項1記載の内部クラック検出方法。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016163238A JP6755749B2 (ja) | 2016-08-24 | 2016-08-24 | 内部クラック検出方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016163238A JP6755749B2 (ja) | 2016-08-24 | 2016-08-24 | 内部クラック検出方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018031634A JP2018031634A (ja) | 2018-03-01 |
JP6755749B2 true JP6755749B2 (ja) | 2020-09-16 |
Family
ID=61304092
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016163238A Active JP6755749B2 (ja) | 2016-08-24 | 2016-08-24 | 内部クラック検出方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP6755749B2 (ja) |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0961139A (ja) * | 1995-08-22 | 1997-03-07 | Asahi Glass Co Ltd | 透明体の欠点検出方法及び装置 |
JP4392213B2 (ja) * | 2003-09-24 | 2009-12-24 | 株式会社岡本工作機械製作所 | 半導体基板のクラックの有無を検査する表面検査装置 |
JP2007095952A (ja) * | 2005-09-28 | 2007-04-12 | Tokyo Seimitsu Co Ltd | レーザーダイシング装置及びレーザーダイシング方法 |
JP2013072789A (ja) * | 2011-09-28 | 2013-04-22 | Seiko Instruments Inc | 内部状態観察方法 |
EP2863545B1 (en) * | 2012-06-13 | 2020-01-15 | NGK Insulators, Ltd. | Composite substrate |
JP6405556B2 (ja) * | 2013-07-31 | 2018-10-17 | リンテック株式会社 | 保護膜形成フィルム、保護膜形成用シートおよび検査方法 |
-
2016
- 2016-08-24 JP JP2016163238A patent/JP6755749B2/ja active Active
Also Published As
Publication number | Publication date |
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JP2018031634A (ja) | 2018-03-01 |
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