JP6746011B2 - 成膜方法および成膜装置 - Google Patents
成膜方法および成膜装置 Download PDFInfo
- Publication number
- JP6746011B2 JP6746011B2 JP2019553136A JP2019553136A JP6746011B2 JP 6746011 B2 JP6746011 B2 JP 6746011B2 JP 2019553136 A JP2019553136 A JP 2019553136A JP 2019553136 A JP2019553136 A JP 2019553136A JP 6746011 B2 JP6746011 B2 JP 6746011B2
- Authority
- JP
- Japan
- Prior art keywords
- target
- film forming
- ring
- magnetic field
- magnetic circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims description 29
- 230000003628 erosive effect Effects 0.000 claims description 56
- 239000000758 substrate Substances 0.000 claims description 37
- 230000015572 biosynthetic process Effects 0.000 claims description 11
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims description 2
- 238000000151 deposition Methods 0.000 claims 2
- 230000008021 deposition Effects 0.000 claims 1
- 239000010408 film Substances 0.000 description 91
- 239000000463 material Substances 0.000 description 20
- 238000004544 sputter deposition Methods 0.000 description 18
- 238000010586 diagram Methods 0.000 description 15
- 239000007789 gas Substances 0.000 description 10
- 239000000470 constituent Substances 0.000 description 7
- 238000009412 basement excavation Methods 0.000 description 6
- 238000012423 maintenance Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 229910006404 SnO 2 Inorganic materials 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 238000000605 extraction Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 230000001629 suppression Effects 0.000 description 2
- 238000005219 brazing Methods 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
- H01J37/3408—Planar magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
- H01J37/3452—Magnet distribution
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
- H01J37/3455—Movable magnets
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018121131 | 2018-06-26 | ||
JP2018121131 | 2018-06-26 | ||
PCT/JP2019/021844 WO2020003895A1 (ja) | 2018-06-26 | 2019-05-31 | 成膜方法および成膜装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2020003895A1 JPWO2020003895A1 (ja) | 2020-07-02 |
JP6746011B2 true JP6746011B2 (ja) | 2020-08-26 |
Family
ID=68987067
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019553136A Active JP6746011B2 (ja) | 2018-06-26 | 2019-05-31 | 成膜方法および成膜装置 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6746011B2 (ko) |
KR (1) | KR102257920B1 (ko) |
CN (1) | CN110859041B (ko) |
TW (1) | TWI712699B (ko) |
WO (1) | WO2020003895A1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116092899B (zh) * | 2023-01-16 | 2024-01-09 | 深圳市矩阵多元科技有限公司 | 用于pvd平面靶的扫描磁控管装置与磁控溅射设备 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5145020B1 (ko) | 1971-04-26 | 1976-12-01 | ||
JPH1046334A (ja) * | 1996-04-24 | 1998-02-17 | Anelva Corp | スパッタ成膜装置 |
JP4453850B2 (ja) * | 1999-06-01 | 2010-04-21 | キヤノンアネルバ株式会社 | スパッタ成膜装置およびスパッタ膜形成方法 |
JP4289916B2 (ja) * | 2003-04-18 | 2009-07-01 | 大日本印刷株式会社 | 薄膜の製造方法および薄膜製造装置 |
JP4984211B2 (ja) * | 2006-03-06 | 2012-07-25 | 大日本印刷株式会社 | スパッタ装置およびスパッタ方法 |
JP4796532B2 (ja) * | 2007-04-05 | 2011-10-19 | 株式会社アルバック | 成膜源、スパッタ装置 |
JP5145020B2 (ja) * | 2007-12-18 | 2013-02-13 | 株式会社アルバック | 成膜装置及び成膜方法 |
CN101861410B (zh) * | 2008-01-21 | 2013-01-02 | 株式会社爱发科 | 溅射成膜方法以及溅射成膜装置 |
JP5003667B2 (ja) * | 2008-12-15 | 2012-08-15 | 大日本印刷株式会社 | 薄膜の製造方法および薄膜製造装置 |
TWI589717B (zh) * | 2011-11-03 | 2017-07-01 | 海帝斯科技公司 | 使用濺射裝置的濺射方法 |
WO2014010148A1 (ja) * | 2012-07-11 | 2014-01-16 | キヤノンアネルバ株式会社 | スパッタリング装置および磁石ユニット |
CN105803410B (zh) * | 2016-04-29 | 2018-07-17 | 京东方科技集团股份有限公司 | 磁控溅射装置、磁控溅射设备及磁控溅射的方法 |
-
2019
- 2019-05-31 WO PCT/JP2019/021844 patent/WO2020003895A1/ja active Application Filing
- 2019-05-31 KR KR1020197029771A patent/KR102257920B1/ko active IP Right Grant
- 2019-05-31 CN CN201980002549.5A patent/CN110859041B/zh active Active
- 2019-05-31 JP JP2019553136A patent/JP6746011B2/ja active Active
- 2019-06-03 TW TW108119158A patent/TWI712699B/zh active
Also Published As
Publication number | Publication date |
---|---|
KR20200002813A (ko) | 2020-01-08 |
CN110859041B (zh) | 2022-11-01 |
WO2020003895A1 (ja) | 2020-01-02 |
KR102257920B1 (ko) | 2021-05-28 |
TW202000962A (zh) | 2020-01-01 |
JPWO2020003895A1 (ja) | 2020-07-02 |
TWI712699B (zh) | 2020-12-11 |
CN110859041A (zh) | 2020-03-03 |
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